Quantcast
 
Search for: Search what?
Oct 12, 2008  
 Newsletters
Subscribe Free to Product News Alerts
  
Receive customized, daily news on the products you want.
Subscribe   View Sample
 Categories
Industrial Market Trends
OnSite WebReviews
Latest New Product News
Adhesives and Sealants
Agricultural and Farming Products
Architectural and Civil Engineering Products
Automatic ID
Chemical Processing and Waste Management
Cleaning Products and Equipment
Communication Systems and Equipment
Computer Hardware and Peripherals
Construction Equipment and Supplies
Controls and Controllers
Display and Presentation Equipment
Electrical Equipment and Systems
Electronic Components and Devices
Explosives, Armaments and Weaponry
Fasteners and Hardware
Fluid and Gas Flow Equipment
Food Processing and Preparation
Health, Medical and Dental Supplies and Equipment
HVAC
Labels, Tags, Signage and Equipment
Laboratory and Research Supplies and Equipment
Lubricants
Machinery and Machining Tools
Material Handling and Storage
Materials and Material Processing
Mechanical Components and Assemblies
Mechanical Power Transmission
Mining, Oil Drilling & Refining
Mounting and Attaching Products
Non-Industrial Products
Optics and Photonics
Packaging Products & Equipment
Paints and Coatings
Plant Furnishings and Accessories
Portable Tools
Printing and Duplicating Equipment
Retail and Sales Equipment
Robotics
Safety and Security Equipment
Sensors, Monitors and Transducers
Services
Software
Test and Measuring Instruments
Textile Industry Products
Thermal and Heating Equipment
Timers and Clocks
Transportation Industry Products
Vision Systems
Waste Handling Equipment
Welding Equipment and Supplies
Association News
Browse Categories
Browse Companies
 Press Releases
Products in the News
Company News
Mergers & Acquisitions
People in the News
Literature & Websites
 Resources
News Delivery Options
Mobile Edition
PR Resources
Licensing
Advertising
How to Write an effective Press Release
Trade Associations
Small Business Support
MEP

Advertisement
Test & Measuring Instruments -> Probes -> Electrical Probes


Electrical Probes


   Add to Google      PDF icon

(Showing headlines 21 - 40)   1 2 3

Verification System detects presence of lead.

Hepco, Inc.
Sunnyvale, CA 94086
Feb 27, 2006 Incorporating micro-focus x-ray fluorescence technology, LeadHound© RoHS/Lead-Free Verification System detects presence of elements such as cadmium, mercury, chromium and bromine in 30 sec or less. Unit is suited for determining compliance with RoHS/WEEE directives and military and avionics product compliance testing. System detects lead in testing boards and components, BGA spheres, and solder paste in pots.

Flying Prober reduces test time.

Flying Prober reduces test time.

US Digitaltest, Inc.
Concord, CA 94520
Jan 18, 2006 Featuring drive technology via linear motors, Condor 500 includes Soft Landing tool and optional integrated boundary-scan. Comprehensive software facilitates test program development directly from CAD data and parts lists. Off-line simulation, panels, and different versions of PC-boards are supported. Test electronics allow in-circuit and functional test, opens check, memory test/and programming, boundary-scan, and vision.

Long Stroke Probes are designed for optimal accuracy.

Long Stroke Probes are designed for optimal accuracy.

Interconnect Devices, Inc.
Kansas City, KS 66106
Dec 30, 2005 Offered with steel and beryllium copper plunger options, ICT-L Series combines ICT technology with .400 in. stroke architecture to solve pointing accuracy problems in long-stroke spring contact probes. Design results in optimal pointing accuracy, minimal binding, and reliable performance in critical functional test applications. Probes, available in .075 in. centers (ICT-L075) and .100 in. centers (ICT-L100), exhibit stable contact resistance.

Field Monitor and Probes acquire readings down to .5 V/m.

Field Monitor and Probes acquire readings down to .5 V/m.

AR Worldwide
Souderton, PA 18964
May 12, 2005 Starprobe Laser Probe, model FL7004, incorporates sphere that measures more than 1 in. Able to sense and adapt to environmental conditions, laser-powered E-field probe employs detectors and antenna that aid performance in presence of harmonic distortion and provide isotropic response free of spikes. Noise reduction and temperature compensation allow for field readings down to .5 V/m. E or H Field Probes cover frequency range from 100 kHz to 60 GHz.

FPGA Dynamic Probe offers plug-and-run setup.

Agilent Technologies, Inc.
Palo Alto, CA 94303
Mar 25, 2005 FPGA dynamic probe application features probe setup automation capability, which reduces set-up time required for logic analyzer measurements when validating designs that incorporate Xilinx FPGA technology. Plug-and-run capability eliminates need to manually track signal path and enter associated probe setup information in logic analyzer. In seconds, users can plug probe into target and press logic analysis run button to make measurements.

Oscilloscope and Probing System has 40 GSa/s sampling rate.

Oscilloscope and Probing System has 40 GSa/s sampling rate.

Agilent Technologies, Inc.
Palo Alto, CA 94303
Jan 31, 2005 Infiniium 80000 series includes 10, 12, and 13 GHz oscilloscopes and active probing systems that capture frequency harmonics and make repeatable measurements. Suited for use in validating high-speed serial buses, real-time measurement systems make high-speed signal anomalies visible. Software packages are available to match oscilloscope to specific measurement needs, with jitter and serial data analysis with 8b/10b decoding.

Wafer Probers test probe-tip cards and node devices.

Tokyo Electron Limited (TEL)
Tokyo 107-8481  Japan
Dec 07, 2004 Based on P-12XLn+ with contact precision of ±1.8 in., P-12XLm 300 mm wafer prober is equipped with optical system that improves alignment capability of small-pitch, micro-diameter probe-tip cards used to wafer test small geometry products. With realized XY contact precision of ±2.0 in., P-8XLm 200 mm wafer prober uses XYZ probing technology of P-12XL series and employs same optical system as above product. It tests high-performance, next generation technology node devices.

FPGA Dynamic Probe speeds digital debug time.

Agilent Technologies, Inc.
Palo Alto, CA 94303
Nov 05, 2004 Model N5397A interacts with on-chip virtual probing technology, enabling Infiniium Mixed-Signal Oscilloscopes to capture up to 32 internal FPGA signals for each debug pin correlated to external analog activity. Up to 512 internal probe points can be accessed inside FPGA without changing design. Automatic mapping of internal signal names from FPGA design tools to MSO provides identification of on-screen digital waveforms corresponding to internal probe points.

Hand-Held USB-Powered Scope offers 5 instruments in one.

Saelig Co., Inc.
Pittsford, NY 14534
Oct 08, 2004 Swordfishâ„¢ probe combines functions of 5 MHz oscilloscope, 20 kS/s data logger, FFT spectrum analyzer, volt meter, and frequency meter. Spring-loaded probe tip can be removed to reveal phono/RCA socket; phono-to-BNC adapter is also supplied. Product features 10-bit ADC with true sampling rate to 40 MS/sec and hardware triggering. Over-sampling feature of included EasyScope II software allows repetitive waveforms to be viewed at resolutions to 1 nS.

Oscilloscope/Probe System offers max bandwidth of 13 GHz.

Agilent Technologies, Inc.
Palo Alto, CA 94303
Oct 08, 2004 Infiniium DSO80000 Series oscilloscopes and InfiniiMax II Series probing measurement systems include 10, 12, and 13 GHz versions. Providing max sample rate of 40 GS/sec, real-time systems can capture frequency harmonics and make accurate measurements on high-speed signals. Software packages match oscilloscope to specific measurement needs, including second-generation jitter analysis, serial data analysis with 8b/10b decoding, and compliance test packages.

Fused Probes feature IP2X protection.

Fused Probes feature IP2X protection.

Cal Test Electronics
Yorba Linda, CA 92887-4604
Aug 23, 2004 Series CT3220 features plastic body containing Type CC ceramic fuse with 2, 6, 10, 15, or 20 A rating. Tips, which have 4 mm banana plug contact springs, are covered by clear plastic insulated sheath, which locks in closed position. Neon indicator light glows when probing live circuit and fuse is open or missing. Fuse will cutoff short-circuit current in less than ¼ cycle and can withstand fault currents up to 200,000 A.

Impedance Converter Kit permits use of probe with DMM.

Impedance Converter Kit permits use of probe with DMM.

Cal Test Electronics
Yorba Linda, CA 92887-4604
Jul 16, 2004 Model CT3197 adapts High Voltage Oscilloscope Probe Model CT2982 for use with standard digital multimeter. Kit, comprised of BNC feed-through terminator and BNC-to-4 mm banana plug adapter, features DC-to-50 MHz bandwidth, 1 W max working power, and ±0.25% accuracy. By utilizing both components of kit to connect probe and DMM, BNC feed-through terminator matches impedance for proper readings. Adapter fits 0.75 in. spacing of banana plug input.

Robotic Probers target semiconductor test industry.

Robotic Probers target semiconductor test industry.

Owens Design, Inc.
Fremont, CA 94538
Jul 14, 2004 Robotic Probers provide method for validating and calibrating automatic test equipment. Robots attach directly to test head and probe specific pads on device interface board. On-board CPU commands probe tip to move along high-precision linear bearings using optically encoded stepper motors for accurate positioning.

Analyzer Probes are compatible with multiple finishes.

Analyzer Probes are compatible with multiple finishes.

Agilent Technologies, Inc.
Palo Alto, CA 94303
Jun 24, 2004 Pro Series soft touch, logic analyzer probes enable direct connection from probe to targets on PCB without use of connector. They use micro spring-pin technology with 4-point crown tip that can pierce any contamination on board and provide redundant contact. Top-mount retention module accommodates varying PCB thicknesses. Probes are compatible with lead-free finishes such as organic-coated copper, as well as gold, silver, and hot-air surface level.

Resistivity System determines presence of oil and gas.

GE Energy Rentals
Atlanta, GA 30339
Jun 21, 2004 Centerfireâ„¢ Resistivity System provides formation evaluation data while hole is being drilled. MWD probe mounted above resistivity collar facilitates retrieval and data transmission to surface. Tool combines multiple transmitter spacings and separate frequencies for accurate and stable readings, and is available in sizes with 4.75, 6.75, and 8.25 in. OD. System operates at temperatures to 175°C in water and oil-based drilling fluids, and in flow rates to 1,200 gpm.

Test Probes have screw-on alligator clips.

Test Probes have screw-on alligator clips.

Pomona Electronics
Pomona, CA 91766 3835
Mar 22, 2004 Model 6723 Test Probes with screw-on alligator clips have 8-32-UNC 2A-threaded tips designed for secure attachment to test probes, providing stable measurements for consistent test results. Silicone-insulated leads are rated at IEC1010 1000 V CAT III for probe alone, and screw-on alligator clip Model 6723 is rated at 300 V CAT II with 10 A current max. Temperature range is 14 to 221°F, and probe is designed for comfortable grip.

Lead Set allows 4-wire resistive measurements.

Lead Set allows 4-wire resistive measurements.

Pomona Electronics
Pomona, CA 91766 3835
Jan 26, 2004 Model 6730 low-ohm Kelvin Lead Set incorporates gold-plated clips and nickle-plated Beryllium copper wire wrapped in silicone. Leads utilize wide-opening 0.800 in. alligator clip design plus retractable-sheath banana plugs for connecting to various calibration test equipment. Color-coded set is rated at 1000 V, CAT III, with 20 A current maximum and is suitable for calibration, design, and test technicians plus R&D and electronics test engineers.

Probe enables single-ended or differential measurements.

Probe enables single-ended or differential measurements.

Agilent Technologies, Inc.
Palo Alto, CA 94304
Jan 14, 2004 When InfiniiMax 1130A 1.5 GHz differential probe is paired with Infiniium mixed signal and digital signal oscilloscopes, system validates and verifies performance of high-speed digital product designs. Controlled transmission-line probe heads provide flat frequency response over entire bandwidth. Resistor tip technology compensates for inductance and capacitance. Variable span between signal tips lets engineers adapt probes to design.

Test-Lead Components enable CAT III 1000 V safety rating.

Test-Lead Components enable CAT III 1000 V safety rating.

Pomona Electronics
Pomona, CA 91766 3835
Dec 18, 2003 Do-It-Yourself Test Lead Accessories allow user to build custom test leads with unterminated lengths of up to 50 ft. Wire with silicone and general-purpose PVC insulations are available, along with stackable and right-angle banana plugs. All products are rated at 20 A max. Applications include trailer taillights, control panels, and multi-conductor cable runs.

Oscilloscope Probe offers x10 fixed attenuation.

Oscilloscope Probe offers x10 fixed attenuation.

Cal Test Electronics
Yorba Linda, CA 92887-4604
Dec 16, 2003 Model CT3133RA features 2 adjustment caps for low- and high-frequency compensation, replaceable gold plated tip, and snap-locking sprung hook that provides solid, positive connection. When BNC actuating pin makes contact with actuation pad, scope automatically detects x10 attenuation setting and adjusts scale readout accordingly. Unit meets IEC 61010-031 600V CATI, has 350 MHz bandwidth and 1.0 ns rise time, and offers 10–35 pF compensation range.




(Showing headlines 21 - 40)   1 2 3


Newsroom Advertisers



Brought to you by Thomasnet.com        Browse ThomasNet Directory

Copyright © 2008 Thomas Publishing Company
Terms of Use - Privacy Policy