Electrical Probes

Test & Measuring Instruments

High-Voltage Oscilloscope Probe is fiber-optically isolated.

September 29, 2016

Optimized for measurement of small signals floating on HV bus in power electronics designs, HVFO probe features optical isolation between probe tip and oscilloscope input. This reduces adverse loading of DUT while also reducing noise, distortion, ringing, overshoots, and transients on measured signal. Architecture consists of single laser and fiber optic cable providing optical isolation and modulated signal + data communication. Multiple tips achieve different operating voltage ranges. Read More

Health, Medical and Dental Supplies & Equipment, Test & Measuring Instruments

MR Conditional Pacing Lead is smallest available in USA.

June 20, 2016

Featuring FDA approval, Solia S ProMRI® is available with 5.6 French lead body and in 45, 53, and 60 cm lengths. Polyurethane coating over silicone, designed to reduce friction, facilitates introduction through small vessels and complex anatomy, while soft distal segment helps reduce stress and minimize myocardial trauma. Read More

Test & Measuring Instruments

Semi-Rigid Coax Test Probes operate to 6 GHz max.

June 17, 2016

Offered in 0.02, 0.034, and 0.047 in. dia and 3, 6, 9, and 12 in. lengths, semi-rigid test probes assist in testing microwave circuits. Soldering of outer conductor to signal ground and exposed center conductor to trace carrying signal of interest enables sampling measurement without separate subassembly circuit board or adding connector to circuit layout. Versions include straight-cut probe ends and pre-stripped probe ends, and SMA connector interface meets 1.35:1 VSWR specification. Read More

Test & Measuring Instruments

Differential Probes meet IEC 61010-031 safety standard.

April 19, 2016

Compatible with oscilloscopes from all major manufacturers, Elditest High Voltage Differential Probes make safe, accurate measurements between 2 voltage points where neither point is referenced to ground. Probes offer input voltage of ±800 V, ±7.5 kV, or ±15 kV for both differential and common mode voltage, depending on probe chosen. Supplied in safety yellow housing, probes feature 2 attenuation settings as well as power and over-range indicators. Read More

Test & Measuring Instruments

Probe Amplifier Browser Head offers 12 GHz of bandwidth.

March 23, 2016

Designed for use with InfiniiMax I/II Series probe amps, N2839A Differential Browser Head brings measurement fidelity of solder-in probe head to hand-held browsing. Spring-loaded probe tips ensure secure connection to DUT and can be adjusted to accommodate targets from 0–3 mm apart using thumbwheel. Low-inductance ground spring ensures that probe’s frequency response remains constant regardless of span range setting. N2839A provides extremely low probe loading with 0.21 pF input capacitance. Read More

Test & Measuring Instruments

Oscilloscope Probes work with smaller, faster designs.

March 21, 2016

Minimizing probe loading and improving access to small, densely packed test locations, TriMode™ P7700 series facilitates debugging of circuits found in mobile and enterprise designs. These probes, intended for use with Tektronix performance oscilloscopes, offer up to 20 GHz bandwidth and feature input amplifier <4 mm from connection point to minimize signal loss, probe tip capacitance, and noise. Signal path is fully characterized and automatically de-embedded from measurement results. Read More

Electrical Equipment & Systems, Test & Measuring Instruments

Hybrid Contactor supports high-frequency testing.

March 15, 2016

Used for testing high frequency semiconductors in high-volume production, mmWave Contactor combines traditional spring probe architecture for low frequency and power I/O’s with cantilever solution for peripheral high frequency transceiver I/O’s. Keeping interface from test equipment to device as short as possible while minimizing number of transitions enables broadband performance from DC to 81 GHz to be maintained. Typical applications include automotive radar, WiGig, and 5G backhaul devices. Read More

Test & Measuring Instruments

Semi-Rigid Probes facilitate microwave circuit testing.

February 22, 2016

Constructed of semi-rigid coax, probes feature SMA Female connectors and come in 3 diameters and 3 lengths from 3–12 in. to help when attaching unterminated end of probe to circuit board trace. Straight-cut probe ends for those that want to customize dimensions of center conductor and dielectric dimensions, while pre-stripped probe ends for immediate use. Products are 100% RF tested to ensure cable assemblies operate to 6 GHz and that SMA connector interface meets 1.35:1 VSWR specification. Read More

Test & Measuring Instruments

Teledyne LeCroy's High-speed Digital Analyzer and Probing System Complete Mixed-Signal Solution

January 25, 2016

HDA125 High-speed Digital Analyzer adds 18-channel, 12.5-GS/s digital acquisition capabilities with industry-leading sensitivity and revolutionary QuickLink probing solution to Teledyne LeCroy oscilloscopes CHESTNUT RIDGE, N.Y. and SANTA CLARA, Calif. - Teledyne LeCroy today significantly expands the capabilities of its industry-leading oscilloscopes with the introduction of the HDA125... Read More

Test & Measuring Instruments

Oscilloscopes automate PAM-4 pre-compliance testing.

December 28, 2015

Used with the S-Series, 90000A, V-Series, 90000 X- and Z-Series real-time oscilloscope platforms and 86100D DCA-X Infiniium sampling oscilloscope, N8836A and N1085A PAM-4 Analysis Software applications generate comprehensive pass/fail reports in minutes. Programs deliver linearity and output voltage measurements including level separation mismatch ratio, eye width and eye height, even-odd jitter and clock random jitter, and differential and common mode return losses. Read More

Test & Measuring Instruments

Mixed Domain Oscilloscope combines up to 6 Instruments in 1.

December 11, 2015

Providing synchronized view of analog and digital waveforms along with RF spectrum traces, MDO4000C Series expands core oscilloscope functionality with spectrum analyzer, arbitrary/function generator, logic analyzer, and protocol analyzer options. Complementary digital voltmeter is offered with product registration. Suited as debug tool for IoT and other embedded engineering applications, instrument features 20 Mpoint record length, 5 GS max sample rate, and >340,000 waveform/sec capture rate. Read More

Test & Measuring Instruments

Oscilloscope Probing Solutions operate from -40 to +85°C.

November 23, 2015

With input impedance of 10 MΩ and 400 MHz bandwidth, N7007A is 2 m long, single-end, 10:1 passive probe used for probing electrical signals inside temperature chamber. As extension kit, 70 cm-long N7013A includes 4 medium- and high-voltage differential active probes: N2790A (±1,500 V), N2791A (±700 V), N2792A (±20 V), and N2818A (±20 V). Engineers can place main body of probe outside environmental chamber and use extension kit and connection adapters to extend probes into environmental chamber. Read More

Test & Measuring Instruments

High Voltage Oscilloscope Probes support inputs up to 39 kV.

October 29, 2015

Elditest high voltage divider probes are designed for use with both digital and analog oscilloscopes. Respectively, models CT4024, CT2982B, CT4025, CT4026, and CT4028 feature max input voltage ratings of 8, 10, 10, 18, and 39 kV and 40, 40, 120, 150, and 220 MHz bandwidth. Read More

Test & Measuring Instruments

Oscilloscopes and Probes offer low-noise M-PHY test solution.

October 23, 2015

When used with DPO70000SX or MSO/DPO70000DX oscilloscopes and P7600 Series TriMode™ probes, Option M-PHY TX Automated offers low-noise test solution for MIPI® M-PHY® 3.1 specification and Conformance Test Suite 3.1. Solution supports M-PHY High Speed Gears 1, 2, and 3 as well as PWM Mode and SYS Mode. Option is capable of testing transmitters running in high-speed mode with sensitivity of 200 mV, minimal added noise of less than 1 or 2 mVrms, and high return loss as specified in M-PHY standard. Read More

Test & Measuring Instruments

Semiconductor Test Probe meets HED device testing challenges.

September 2, 2015

With 5.0 mm test height that provides total compression window of 0.8 mm and insertion loss of 18 GHz @ -1 dB (GSG), ZIP™ semiconductor test probe model Z-080YHJ targets high-lead count BGAs and LGAs and meets challenges associated with testing High End Digital (HED) devices. DUT side plunger, which is made from HyperCore™ homogenous alloy, features sharp, dual tip geometry for facilitated penetration of solder ball oxides. Product is based on flat probe technology. Read More

Test & Measuring Instruments

Magellan Diagnostics Receives FDA Clearance for LeadCare Plus Clinical Lead Analyzer

July 21, 2015

BILLERICA, Mass., – Magellan Diagnostics, Inc., the leader in blood lead testing systems for both point-of-care and laboratory analysis, has received US Food and Drug Administration (FDA) 510(k) clearance to market the LeadCare Plus Blood Lead Testing System in the US for the quantification of lead levels in blood. LeadCare Plus offers the simplest way to perform laboratory lead analysis... Read More

Electronic Components & Devices, Test & Measuring Instruments

Probe Adapters enable 3rd-party probe and current sensor use.

July 14, 2015

Permitting connection of select Tektronix TekProbe interface level II probes to any ProBus-equipped Teledyne LeCroy oscilloscope, TPA10 TekProbe® Probe Adapter automatically detects which probe is attached, supplies all necessary power and offset control to probe, and communicates probe signal to oscilloscope. CA10 Current Sensor Adapter is programmable and customizable to work with third-party current measurement devices that output voltage or current signals proportional to measured current. Read More

Sensors, Monitors & Transducers, Test & Measuring Instruments

Current Probes offer sensitivity down to 1 mA/div.

May 22, 2015

With 50 MHz Model CP030A and 100 MHz Model CP031A, users can measure currents from milliamps to peak current of 50 A. Small jaws, clamping onto conductors up to 5 mm in diameter, enable measurements in tight spaces. When used with 12-bit resolution HDO high definition oscilloscopes, users can obtain accurate, low-current waveforms for optimized debug and analysis capabilities. Probes connect directly to oscilloscopes through built-in front-panel ProBus interface.
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Test & Measuring Instruments

Frost & Sullivan Lauds Rohde & Schwarz for Standing Out in the Oscilloscopes Market through Innovations and Value Additions to its Product Portfolio

May 5, 2015

Despite the stranglehold of the top participants, Rohde Schwarz leveraged its RD expertise to successfully penetrate the oscilloscope market London, U.K. – Based on its recent analysis of the oscilloscopes market, Frost & Sullivan recognises Rohde & Schwarz with the 2015 Global Frost & Sullivan Award for Competitive Strategy Innovation and Leadership. Within just five years of entering the... Read More

Sensors, Monitors & Transducers, Test & Measuring Instruments

Measurement Techniques

April 15, 2015

Line Regulation Measure the output voltage at rated load and at 25 Deg C ambient. Record output voltage with input voltage at low line, nominal and high line. Line regulation is defined as the maximum of the two deviations of output from the value at nominal input. This value is typically specified in percent. Measurements should be taken as quickly as possible so that internal temperature... Read More