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Test & Measuring Instruments -> Probes -> Electrical Probes


Electrical Probes


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Capacitance Probe features flexible design.

Capacitance Probe features flexible design.

BinMaster
Lincoln, NE 68529
Nov 06, 2009 PROCAP capacitance probe can detect lump material level at distances up to 35 ft and is suited for use with any lump material that might bend, damage, or break rigid probe. Hazardous location approved device operates below RF range and won't interfere or be affected by other electronic equipment. Visual LED on top of unit indicates sensor status of covered, uncovered or failed condition of unit. User can monitor up to 24 probes from single location when used with point level alarm panel.

Active Differential Probes target RF/Microwave instruments.

Agilent Technologies, Inc
Santa Clara, CA 95051
Oct 06, 2009 Models U1818A and U1818B feature high differential input impedance from 100 kHz to 7 or 12 GHz, respectively, and are compatible with Agilent network, spectrum, and signal source analyzers. Devices provide frequency response of ±1.5 dB and noise less than -130 dBm/Hz at 10 MHz to 12 GHz. They also feature biasing from Agilent's RF and microwave instruments probe power port or bench top power supply.

Differential Probes suit floating signal measurement.

Differential Probes suit floating signal measurement.

Agilent Technologies, Inc
Santa Clara, CA 95051
Sep 01, 2009 Operating at 25 MHz and 100 MHz, high-voltage models N2790A and N2791A allow earth-grounded oscilloscopes to be used for floating signal measurements of up to 1,400 V of differential voltage and 1,000 V of common-mode voltage. Probes offer user-selectable attenuation settings and come with various probe tip accessories for use with small and large components in tight places. Each probe can accurately measure up to 3.5 nsec of fast transient edges in switching power supplies.

Fused Test Probes allow indication of live voltage.

Fused Test Probes allow indication of live voltage.

Fluke Corp.
Everett, WA 98203
Aug 20, 2009 Providing indication of live voltage even with blown fuse, FTP Fused Test Probes feature built-in fuses and sheathed tips for additional safety. They feature 2 mm threaded probe tips with removable 4 mm lantern-style spring contacts and removable GS38 insulated IC caps for probing closely spaced leads. Rated to CAT III 1000 V, CAT IV 600 V and 10 A, modular probes feature operating temperature of -20 to 50°C, and comply with Canadian ESA standards.

Miniature Passive Probes have bandwidths from DC to 1.5 GHz.

Agilent Technologies, Inc
Santa Clara, CA 95051
Jul 06, 2009 Suited for probing densely populated IC components or surface-mount devices used in high-speed digital applications, N2870A series is available with attenuation ratios of 1:1, 10:1, 20:1, and 100:1 and bandwidths of DC to 35, 200, 350, 500 MHz and 1.5 GHz. Spring loaded sharp probe tip helps keep probe from slipping off device under test, while insulating IC caps keep probe tip centered on IC lead and keep it from shorting adjacent leads. Compact devices feature 2.5 mm probe head diameter.

Interchangeable Probes facilitate water analysis testing.

Interchangeable Probes facilitate water analysis testing.

Hach Co.
Loveland, CO 80539-0389
Jun 29, 2009 Designed for HQd line of meters, IntelliCAL(TM) Probes provide portable measurement of ORP, sodium, and pH for low-ionic strength samples for analysis in lab or field. When switching between parameters, operator plugs IntelliCAL probe into HQd meter. System automatically recognizes testing parameter from probe and recalls calibration history. It uses intuitive menu structure along with guided measurement and calibration methods. Conductivity, DO, and LBOD probes are also available.

PCIe Analyzers utilize half size mid-bus probing solution.

Agilent Technologies, Inc
Santa Clara, CA 95051
Jun 16, 2009 Designed for E2960B Series PCI Express Analyzers, N5328A half-size mid-bus probe 2.0 supports both 2.5 GT/s and 5.0 GT/s PCIe data rates and will allow designers to monitor PCIe protocol. Soft touch, micro-spring technology provides reliable contact to signal pads, while top-side retention module eliminates need to access back of board. Suited for space-constrained systems, flying leads probe enables insight without influencing monitored signals.

LPDDR BGA Probe works with oscilloscopes, logic analyzers.

Agilent Technologies, Inc
Santa Clara, CA 95051
Jun 10, 2009 Low-power double data rate (LPDDR) BGA probes provide signal access points for LPDDR and mobile-DDR synchronous dynamic random access memory (SDRAM) in electrical, timing, and protocol characterization applications. Respectively supporting x16 and x32 SDRAM packages, W2637A and W2638A BGA probes feature embedded resistors that provide signal isolation. Both serve as probing solutions at LPDDR and mobile-DDR BGA package ballout.

Network Quality Test Probe features automated operation.

SwissQual
Zuchwil 4528  Switzerland
Feb 11, 2009 Diversity Unattended probe incorporates features that are specifically designed to improve automated operation. It includes both phone and a data card for testing, along with wireless router and separate data card to provide dedicated remote link over cellular or WiFi networks, enabling simultaneous recording of both voice and data services information. Data can be transferred for real time analysis, and Intelligent Data Reduction eliminates unnecessary data prior to transmission.

High-Frequency Test Probes offer rise time of 0.9 ns.

High-Frequency Test Probes offer rise time of 0.9 ns.

Multi-Contact USA
Santa Rosa, CA 95403
Nov 21, 2008 Compatible with all oscilloscopes, Isoprobe® III high-frequency (250-500 MHz) test probes have coaxial connecting cable with low capacitance. Flexible PVC insulated coaxial leads terminate in BNC plug with integrated compensation unit. Most models have 10:1 dividing ratios, and 100:1 probe is available for measurements on sensitive circuits. Along with input capacitance as low as 12 pF, these passive probes feature ergonomic design and are touch protected to 1,000 V, CATIII.

Flying Probe System meets variety of PCB testing needs.

Aeroflex Laboratories
Plainview, NY 11803
Aug 11, 2008 Able to perform high-speed fixtureless test in stand-alone platform, Model 4520 flying probe system is intended for low to medium-volume PCB manufacturing environment that does not require in-line test. Flexible solution features device programming, boundary scan, and functional test capability, and is also suited for prototype applications.

Test Leads are rated for use at voltages up to 1,000 V CATIV.

Test Leads are rated for use at voltages up to 1,000 V CATIV.

Multi-Contact USA
Santa Rosa, CA 95403
Jul 30, 2008 UL approved test leads are terminated with 4 mm diameter plugs for connecting standard safety test clips and probes to enable safe, fuse-protected measurements. They accept 6.3 x 32 mm UK style fuses, which can be fitted by unscrewing 2 part connector. Available with PVC/silicone insulation, leads are fitted with Multilam® plugs with rigid insulating sleeves. Two HRC type fuses can be supplied, rated at 0.5 or 1.6 A, both with breaking capacity of 50 kA.

Electrical Circuit Test Set offers retractable test leads.

Electrical Circuit Test Set offers retractable test leads.

A & E Hand Tools / A & E Inc.
Racine, WI 53401
Jul 16, 2008 Kastar Hand Tools 7-Piece Retractable Test Leads Set is designed for electrical circuit testing applications and can be used with any multimeter equipped with standard banana jack connectors. In addition to one reel of 2 x 15 ft retractable test leads with banana plugs, set includes one pair each (one red, one black) of interchangeable test probes, spring hooks, and alligator clips.

Blast Pressure Pencil Probe features 1 µsec response time.

Blast Pressure Pencil Probe features 1 µsec response time.

PCB Piezotronics Inc.
Depew, NY 14043 2495
Apr 10, 2008 Designed for broad range of explosion, blast, and shock wave testing, Series 137A Quartz, free-field, ICP® Blast Pressure Pencil Probe has 500 kHz resonant frequencies. High-level 5 V output signal is capable of driving cable runs hundreds of feet in length, to safe zone for data acquisition. Featuring integral microelectronics that provide high signal-to-noise ratio, sensor can be used to capture both peak pressure and total impulse calculations.

RF Production Probe Card utilizes membrane probe technology.

Cascade Microtech Inc.
Beaverton, OR 97006
Apr 09, 2008 Designed to aid in high-volume wafer testing of RF filters and switches for mobile handsets, 20 GHz P30 Pyramid Probe card has scalable architecture and is sized to enable multi-site testing. Solution's lithographic probes alleviate uncontrolled impedance and Microscrub(TM) creates small scrub mark that minimizes material displacement. Applications include multi-die testing for RF wireless, high-speed digital in SiPs, SOCs, and leading edge parametrics.

Double Resonance Probe facilitates NMR laboratory operation.

Varian, Inc.
Palo Alto, CA 94304
Mar 19, 2008 Suited for analytical and research chemists performing range of common 1D and 2D NMR experiments involving liquid-state samples, OneNMR(TM) Probe lets users employ one probe for various direct and indirect applications. Lock sensitivity as well as 1H and 13C sensitivity minimize time required for analysis or alternatively enable analysis of samples where quantity is limited. Water suppression and 1H RF homogeneity promote quality of acquired data and facilitate data analysis.

Dual Cold Probe minimizes 13C NMR experiment analysis time.

Varian, Inc.
Palo Alto, CA 94304
Mar 19, 2008 Designed for use with Varian NMR System in 13C detected NMR experiments, XSens(TM) Probe accommodates researchers in pharmaceutical, agricultural, chemical, and academic laboratories involved in characterization of quantity-limited samples of natural products, reaction intermediates, metabolites, and trace contaminants. Its 1H sensitivity minimizes acquisition time for 1H detected experiments, while 13C sensitivity promotes throughput and facilitates utilization of spectral information.

Measurement Switching Probe provides 20 GHz bandwidth.

Tektronix, Inc.
Beaverton, OR 97077
Mar 18, 2008 Model P7520 TriMode(TM) allows users to debug and validate 3rd harmonic of 10 Gbps signals and do compliance testing to 5th harmonic on signals up to 8 Gbps. It enables engineers to switch between differential, single-ended, and common mode measurements without moving probe connections. Streamlined so that several probes are able to fit into confined spaces, needle-nose handheld style probe module can be used for both fixtured and handheld applications.

Test Socket is designed for devices up to 13 sq mm.

Aries Electronics, Inc.
Bristol, PA 19007-6810
Feb 14, 2008 Available in 4 versions with ratings of 1-3, 3-5, 5-9, and 10-18 GHz, high frequency center probe test socket is suited for manual, high-speed testing of devices such as CSP, mBGA, and Flash, with pitches as low as 0.40 mm. Measuring 1.200 x .840 x .440 in., it provides minimal signal loss for higher bandwidth ability via signal path of 0.077 in. Contact forces are 16 g per contact on 0.50 mm pitch, 25 g per contact on 0.50-0.75 mm pitch, and 25 g per contact on 0.80 mm or larger pitch.

Probe Cards allow single-pass dc and RF measurements.

Cascade Microtech Inc.
Beaverton, OR 97006
Feb 06, 2008 Pyramid Plus(TM) 45 and 65 nm capable parametric probe cards provide low leakage, contact resistance, and inductance to deliver accurate measurements of small process monitoring test structures. Membrane manufacturing process enables leakage performance to 1 fA with 5 sec settling time and reliable contact on smaller test pads. Units come in dc only (PDC50) or dc plus RF (PRF50) configurations with options for pad size and leakage specifications.




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