PCB Piezotronics Inc.
Depew, NY 14043 2495
Apr 10, 2008 Designed for broad range of explosion, blast, and shock wave testing, Series 137A Quartz, free-field, ICP® Blast Pressure Pencil Probe has 500 kHz resonant frequencies. High-level 5 V output signal is capable of driving cable runs hundreds of feet in length, to safe zone for data acquisition. Featuring integral microelectronics that provide high signal-to-noise ratio, sensor can be used to capture both peak pressure and total impulse calculations.

Cascade Microtech Inc.
Beaverton, OR 97006
Apr 09, 2008 Designed to aid in high-volume wafer testing of RF filters and switches for mobile handsets, 20 GHz P30 Pyramid Probe card has scalable architecture and is sized to enable multi-site testing. Solution's lithographic probes alleviate uncontrolled impedance and Microscrub(TM) creates small scrub mark that minimizes material displacement. Applications include multi-die testing for RF wireless, high-speed digital in SiPs, SOCs, and leading edge parametrics.

Varian, Inc.
Palo Alto, CA 94304
Mar 19, 2008 Suited for analytical and research chemists performing range of common 1D and 2D NMR experiments involving liquid-state samples, OneNMR(TM) Probe lets users employ one probe for various direct and indirect applications. Lock sensitivity as well as 1H and 13C sensitivity minimize time required for analysis or alternatively enable analysis of samples where quantity is limited. Water suppression and 1H RF homogeneity promote quality of acquired data and facilitate data analysis.

Varian, Inc.
Palo Alto, CA 94304
Mar 19, 2008 Designed for use with Varian NMR System in 13C detected NMR experiments, XSens(TM) Probe accommodates researchers in pharmaceutical, agricultural, chemical, and academic laboratories involved in characterization of quantity-limited samples of natural products, reaction intermediates, metabolites, and trace contaminants. Its 1H sensitivity minimizes acquisition time for 1H detected experiments, while 13C sensitivity promotes throughput and facilitates utilization of spectral information.

Tektronix, Inc.
Beaverton, OR 97077
Mar 18, 2008 Model P7520 TriMode(TM) allows users to debug and validate 3rd harmonic of 10 Gbps signals and do compliance testing to 5th harmonic on signals up to 8 Gbps. It enables engineers to switch between differential, single-ended, and common mode measurements without moving probe connections. Streamlined so that several probes are able to fit into confined spaces, needle-nose handheld style probe module can be used for both fixtured and handheld applications.

Aries Electronics, Inc.
Bristol, PA 19007-6810
Feb 14, 2008 Available in 4 versions with ratings of 1-3, 3-5, 5-9, and 10-18 GHz, high frequency center probe test socket is suited for manual, high-speed testing of devices such as CSP, mBGA, and Flash, with pitches as low as 0.40 mm. Measuring 1.200 x .840 x .440 in., it provides minimal signal loss for higher bandwidth ability via signal path of 0.077 in. Contact forces are 16 g per contact on 0.50 mm pitch, 25 g per contact on 0.50-0.75 mm pitch, and 25 g per contact on 0.80 mm or larger pitch.

Cascade Microtech Inc.
Beaverton, OR 97006
Feb 06, 2008 Pyramid Plus(TM) 45 and 65 nm capable parametric probe cards provide low leakage, contact resistance, and inductance to deliver accurate measurements of small process monitoring test structures. Membrane manufacturing process enables leakage performance to 1 fA with 5 sec settling time and reliable contact on smaller test pads. Units come in dc only (PDC50) or dc plus RF (PRF50) configurations with options for pad size and leakage specifications.

Agilent Technologies, Inc
Santa Clara, CA 95051
Nov 13, 2007 Suited for oscilloscope measurements in environmental chambers and other settings with extreme temperature conditions, Model N5450A extension cable offers 2 different operational temperature ranges, depending on probe head configurations. It provides temperature range coverage of -55 to 150°C and -25 to 80°C when used with N5381A differential solder-in probe head, and E2677A differential solder-in probe head, E2678A differential socket probe head, or N5425A/26A ZIF tip, respectively.

Optotherm, Inc.
Sewickley, PA 15143
Apr 02, 2007 PCB Test Arm Probe provides probing of surface mount devices (SMDs), and connects test instruments to variety of SMDs including PLCC, SOIC, QFP, and VIAS or test point holes. With length of 8.33 in., height of 2.92 in., and base length of 2.53 in., it includes spring loaded tip, rotatable head, and fine vertical adjustment knob, and is available in 3 and 10 A models. Connection post supports single or multiple test leads.

BinMaster
Lincoln, NE 68529
Mar 15, 2007 Operating at 6 kHz, PROCAP Series provides level measurement by using timing technique that compares discharge time of probe capacitance to reference capacitance. PRO-Shield guards against false readings from buildup by forcing active signal to examine large area around probe, while time delay readings minimize false signals from sudden material shifts or splashing liquids. External LED indicates whether probe is covered, uncovered, or in failed condition.

Tektronix, Inc.
Beaverton, OR 97077
Nov 15, 2006 Used for HDMI 1.3 and PCI-Express 2.0, Model P7313SMA differential probe features 13 GHz bandwidth and extended termination voltage range. SMA probes enable users to connect to 2 SMA connectors on device under test and bring those 2 signals into differential probe that converts them into one single-ended signal. Suited for measuring differential signals in 50-omega signaling environment, unit can measure large signals in 2.5x low noise attenuation setting.

Pomona Electronics
Pomona, CA 91766 3835
Oct 25, 2006 Designed to probe surface mount device contacts, SMD Microtip Test Probe features stainless steel needle tip that is curved to aid in probing hard-to-reach areas. Probe is rated 1,200 Vrms max for hands-free testing in controlled environments. It is not intended for handheld use at voltages above 33 Vrms/70 Vdc.

Pomona Electronics
Pomona, CA 91766 3835
Oct 24, 2006 Speeding test connections, BNC Shielded Test Probe Kit includes shielded test probe, Minigator with 6-32 thread for ground lead, insulated flex boot for Minigator, Minigrabber® test clip with 6-32 thread for ground lead, and replaceable stainless steel dog-leg probe tip. Probe's shield extends to within 1.5 in. of probe tip and is compatible with DMM banana plug inputs when using Pomona 1269 BNC to double banana plug adapter.

AR Worldwide
Souderton, PA 18964
Sep 11, 2006 Capable of noise reduction and temperature compensation, Model FL7018 (3 MHz-18 GHz / 1-1,000 V/m) 18 GHz laser-powered probe delivers isotropic response of ±1.0 dB to 8 GHz. Internal microprocessor enables probe to adapt to its environment, which provides optimal linearization, temperature compensation, control, and communications functions.

Varian, Inc.
Palo Alto, CA 94304
May 26, 2006 Designed to determine molecular structures of proteins and other biomolecules in solid state, BioStatic(TM) NMR probe allows access to 70% of all cellular proteins including membrane proteins. It incorporates ultra-low E-field coil technology to reduce unwanted heating by up to 94%. Probe provides researchers with insight into proteins and biomarker molecules associated with wide variety of diseases.

Saelig Co., Inc.
Pittsford, NY 14534
Apr 12, 2006 USB 2.0-powered and connected, PicoScope 2105 USB Pen Scope and software convert laptop or desktop PC into oscilloscope without additional probes or power supplies. PicoScope features equivalent time sampling (ETS) that works on repeating, stable signals by building up waveform from successive acquisitions. ETS sample rate for stable signals is up to 2 GS/s. Probe offers 24 kS buffer and 100 MS/s sampling enabling users to zoom in to high-speed signals.

NEC Corporation
Tokyo 108-8001  Japan
Mar 23, 2006 Fiber-optic electric field probe consists of optical fiber and lead zirconate titanate (PZT) electro-optical film on edge of fiber that acts as field sensor. With lateral size of ~125 µm, product can be inserted into narrow spaces for evaluation of electrical characteristics of high-density packaged electronic circuits on PCBs. This microscale electric field probe does not disturb electromagnetic field surrounding device being tested.

Hepco, Inc.
Sunnyvale, CA 94086
Feb 27, 2006 Incorporating micro-focus x-ray fluorescence technology, LeadHound© RoHS/Lead-Free Verification System detects presence of elements such as cadmium, mercury, chromium and bromine in 30 sec or less. Unit is suited for determining compliance with RoHS/WEEE directives and military and avionics product compliance testing. System detects lead in testing boards and components, BGA spheres, and solder paste in pots.

US Digitaltest, Inc.
Concord, CA 94520
Jan 18, 2006 Featuring drive technology via linear motors, Condor 500 includes Soft Landing tool and optional integrated boundary-scan. Comprehensive software facilitates test program development directly from CAD data and parts lists. Off-line simulation, panels, and different versions of PC-boards are supported. Test electronics allow in-circuit and functional test, opens check, memory test/and programming, boundary-scan, and vision.

Interconnect Devices, Inc.
Kansas City, KS 66106
Dec 30, 2005 Offered with steel and beryllium copper plunger options, ICT-L Series combines ICT technology with .400 in. stroke architecture to solve pointing accuracy problems in long-stroke spring contact probes. Design results in optimal pointing accuracy, minimal binding, and reliable performance in critical functional test applications. Probes, available in .075 in. centers (ICT-L075) and .100 in. centers (ICT-L100), exhibit stable contact resistance.