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Test & Measuring Instruments -> Probes -> Electrical Probes


Electrical Probes




(Showing headlines 1 - 20)   more ....

Flying Lead Solder-Down Probe suits PCIe 3.0 protocol analysis.

Agilent Technologies, Inc.    Santa Clara, CA 95051
Apr 12, 2012 Used with U4301A protocol analyzer module, U4324A can be used for bidirectional lane widths as narrow as x2 and cleanly captures 8.0 GT/s traces from DUT. Probe provides additional line for connection to external reference clock, and it supports 2.5, 5, and 8 GT/s PCIe IO speeds. Designed to meet needs of silicon, system, and embedded PC connector testing, product works with replaceable N5426A ZIF (zero insertion force) tip kit that extend probe life via tip on-demand replacement.

CompactPCI Serial Interposer aids PCI Express 2.0 analysis.

LeCroy Corp.    Chestnut Ridge, NY 10977
Apr 04, 2012 Intended for Summit(TM) PCIe protocol analyzer product line, PCIe 2.0 cPCI serial interposer provides dedicated probe that helps analyze in-band PCIe data traffic between cPCI serial card and its system chassis. Star architecture is made up of serial point-to-point connections; one system slot can control up to 8 peripheral slots. Instrument supports PCIe data channels with lane widths up to x8 at data rates up to 5 GT/s.

PCI 3.0 Multi-Lead Probe utilizes Gen3 tapping technology.

LeCroy Corp.    Santa Clara, CA 95054
Feb 06, 2012 Available for Summit(TM) T3-16 and Summit T3-8 Protocol Analyzers, PCI Express® 3.0 multi-lead probe can be used by system developers to probe point-to-point bus signals or serial buses when there is no supported interposer card. Tool supports PCIe 3.0 specification, which includes data rates up to 8 GT/s, and is expandable to support x1-x16 PCIe lanes when using Summit protocol analyzer. Probe tips are flexible for tapping signals in narrow areas on circuit boards.

Capacitive Displacement Probes come in 3, 18, and 25 mm sizes.

Capacitive Displacement Probes come in 3, 18, and 25 mm sizes.

Lion Precision Inc.    St. Paul, MN 55126 7014
Jan 18, 2012 Measuring 15 mm long, 3 mm diameter Capacitive Displacement Probe provides measurement ranges as small as 10 µm with resolutions less than 1 nm. Unit is available with right angle or axial cable exits for squeezing into tight spaces. On larger end, 18 mm and 25 mm diameter probes provide measurement ranges as large as 12.5 mm while maintaining resolutions as low as 125 nm.

Concrete Surface Resistivity Meter performs non-destructive test.

Proceq USA, Inc.    Aliquippa, PA 15001
Apr 04, 2011 Able to yield results within minutes, Resipod 4-point Wenner probe measures electrical resistivity of concrete or rock. Portable field unit meets AASHTO provisional standard TP95-11 and is available with 1.5 or 2 in. probe. In addition to indicating current flow, poor contact status, and variations in water/cement ratios, commercial product can identify areas susceptible to chloride penetration. USB connection and dedicated Resipod Link PC software are standard.

Blast Pressure Sensors offer resonant frequencies to 500 kHz.

Blast Pressure Sensors offer resonant frequencies to 500 kHz.

PCB Piezotronics Inc.    Depew, NY 14043 2495
Nov 04, 2010 Series 137B quartz ICP® blast pressure pencil probes, featuring micro-second response time, offer high-level 5 V output signal capable of driving long cable runs hundreds of feet long to safe zone for data acquisition. Probe sensors can capture both peak pressure and total impulse calculations. Designed for range of explosion, blast, and shock wave testing, units are suited for applications like measuring blast pressure in free-field or closed bunker arenas.

ExpressCard Interposer enables PCI Express® 2.0 analysis.

LeCroy Corp.    Chestnut Ridge, NY 10977
Sep 20, 2010 Supporting both 34 and 54 mm form factors, ExpressCard 2.0 Interposer for Summit(TM) PCI Express Protocol Analyzer provides series of test points for measuring various signals and runs at data rates up to 5 GT/sec to support PCI Express 2.0. To use interposer, plug ExpressCard under test into interposer, then plug interposer into host system. In addition, interposer card also provides connectivity to LeCroy's USB analyzers for USB 2.0 protocol analysis.

High Frequency Oscilloscope Compatible Probes measure AC current.

AEMC Instruments    Foxborough, MA 02035
Jul 07, 2010 Models MF 300-6-2-10 HF and MF 300-10-2-10 HF High Frequency MiniFlex® Probes feature flexible sensor available in lengths of 6 and 10 in. as well as electronic module. Measuring AC current from 5 Hz to 1 MHz, lightweight units use transformation principle based on air core, and present no load to system under test. Devices are insensitive to DC currents and have mV output proportional to current measured for direct readings on oscilloscopes, DMMs, data loggers, and power or harmonic meters.

Capacitance Probes incorporate dual timer functionality.

Capacitance Probes incorporate dual timer functionality.

BinMaster    Lincoln, NE 68507
Jun 04, 2010 PROCAP I and II offer flexible time delay that lets user set probe to react immediately or with up to 30 sec delay when it detects covered/uncovered state. Featuring interference-free, fail-safe operation as well as Quick-Set calibration, probes work at 6 KHz and can be used for high and low level detection in vessels used for material storage or process manufacturing. Assortment of probes and extensions allow use with solid, liquid, and slurry materials.

Oscilloscope Probing System  features 30 GHz bandwidth.

Oscilloscope Probing System features 30 GHz bandwidth.

Agilent Technologies, Inc.    Santa Clara, CA 95051
May 10, 2010 Offering real-time measurements, InfiniiMax III Probing System is available with 4 probe amplifier models with bandwidths from 16-30 GHz. Range of probe heads allows connection using browser, zero insertion force tip, 2.92 or 3.5 mm SMA cable, or solder-in tips. InfiniiMax III browser uses crisscross blade grounding system for low inductance grounding, poly-iron wrap of coax tips to minimize standing waves, and very-low parasitic replaceable resistor tips to achieve 30 GHz performance.

Aerial Flying Probers include thermal scan.

Aerial Flying Probers include thermal scan.

SEICA Inc.    Salem, NH 03079
Mar 19, 2010 Based on VIVA Integrated Platform core hardware and software, AERIAL Flying Probers include 2 Flying IC Thermal Detection Units positioned on each side of unit under test to detect thermal parameters of ICs under power. Purpose is to compare temperatures of known good boards to suspect boards and indict bad components in depot repair environment. Models range from 2-8 test probes, accessing simultaneously one or both sides of board, which can be positioned horizontally or vertically.

Cable Interposer enables PCI Express® 2.0 analysis.

LeCroy Corp.    Chestnut Ridge, NY 10977
Mar 05, 2010 Designed for Summit(TM) PCI Express Protocol Analyzer product line, PCI Express 2.0 External Cable Interposer provides dedicated probe that facilitates analysis of data traffic between host and device that are connected using external PCI Express cable. Interposer allows protocol analyzer connection by tapping into external cable connection. Unit supports PCI Express data channels with lane widths of x4 and x8 at all standard PCIe data rates up to 5 GT/s.

VPX Interposer facilitates PCI Express® 2.0 analysis.

LeCroy Corp.    Chestnut Ridge, NY 10977
Mar 05, 2010 Designed for Summit(TM) PCIe Protocol Analyzer series, PCIe 2.0 VPX interposer provides dedicated probe that facilitates analysis of data traffic between VPX host system and carrier board system. Card supports PCIe data channels with lane widths up to x8 at data rates to 5 GT/s, while software views and built-in protocol translations accelerate problem identification and resolution to speed development and testing of new or updated products.

Differential Solder-in Probe characterizes serial data signals.

LeCroy Corp.    Chestnut Ridge, NY 10977
Feb 09, 2010 Supporting WaveMaster 8 Zi oscilloscopes, 25 GHz WaveLink D2505 provides 17.5 ps rise time performance. Baseline electrical noise is 3.1 mVrms at 25 GHz and 1.6 mVrms at 13 GHz. In addition, probe exhibits optimized AC loading in mid-band and high frequency range with 350 W at 7 GHz, 575 W at 13 GHz, 325 W at 16 GHz, 160 W at 20 GHz, and 120 W at 25 GHz. Damping resistors on solder-in tip are field replaceable.

Mini Card Interposer speeds Gen2 PCI Express® analysis.

LeCroy Corp.    Chestnut Ridge, NY 10977
Jan 21, 2010 Accommodating 2 types of setups, Mini Card Interposer serves as dedicated probe that makes it possible to analyze data traffic from Mini Card that uses PCIe interface to connect to laptop/notebook/tablet system. It supports probing at speeds up to 5 GT/s (Gen2) and, in addition to being able to probe PCIe interface, also provides connectivity to LeCroy's USB analyzers for USB 2.0 protocol analysis. Software views and protocol translations accelerate problem identification and solution.

Mezzanine Card Interposer facilitates PCIe 2.0 analysis.

LeCroy Corp.    Chestnut Ridge, NY 10977
Jan 20, 2010 Designed for Summit(TM) PCI Express Protocol Analyzers, XMC Mezzanine Card Interposer provides dedicated probe that enables users to analyze data traffic from XMC module that uses PCI Express interface to connect to carrier board system. Card supports PCI Express data channels with lane widths up to x8 at data rates up to 5 GT/s. With protocol analyzers, users can identify, diagnose, and solve interoperability issues encountered when verifying COTS XMC modules in VXS/VPX-based systems.

Capacitance Probe features flexible design.

Capacitance Probe features flexible design.

BinMaster    Lincoln, NE 68507
Nov 06, 2009 PROCAP capacitance probe can detect lump material level at distances up to 35 ft and is suited for use with any lump material that might bend, damage, or break rigid probe. Hazardous location approved device operates below RF range and won't interfere or be affected by other electronic equipment. Visual LED on top of unit indicates sensor status of covered, uncovered or failed condition of unit. User can monitor up to 24 probes from single location when used with point level alarm panel.

Active Differential Probes target RF/Microwave instruments.

Agilent Technologies, Inc.    Santa Clara, CA 95051
Oct 06, 2009 Models U1818A and U1818B feature high differential input impedance from 100 kHz to 7 or 12 GHz, respectively, and are compatible with Agilent network, spectrum, and signal source analyzers. Devices provide frequency response of ±1.5 dB and noise less than -130 dBm/Hz at 10 MHz to 12 GHz. They also feature biasing from Agilent's RF and microwave instruments probe power port or bench top power supply.

Differential Probes suit floating signal measurement.

Differential Probes suit floating signal measurement.

Agilent Technologies, Inc.    Santa Clara, CA 95051
Sep 01, 2009 Operating at 25 MHz and 100 MHz, high-voltage models N2790A and N2791A allow earth-grounded oscilloscopes to be used for floating signal measurements of up to 1,400 V of differential voltage and 1,000 V of common-mode voltage. Probes offer user-selectable attenuation settings and come with various probe tip accessories for use with small and large components in tight places. Each probe can accurately measure up to 3.5 nsec of fast transient edges in switching power supplies.

Fused Test Probes allow indication of live voltage.

Fused Test Probes allow indication of live voltage.

Fluke Corp.    Everett, WA 98203
Aug 20, 2009 Providing indication of live voltage even with blown fuse, FTP Fused Test Probes feature built-in fuses and sheathed tips for additional safety. They feature 2 mm threaded probe tips with removable 4 mm lantern-style spring contacts and removable GS38 insulated IC caps for probing closely spaced leads. Rated to CAT III 1000 V, CAT IV 600 V and 10 A, modular probes feature operating temperature of -20 to 50°C, and comply with Canadian ESA standards.




(Showing headlines 1 - 20)   more ....



 Latest Products in the News


Canadian Circuits Inc.  - April 20, 2012
Canadian Circuits Purchases MICROCRAFT Flying Probe Tester

SEICA Inc.  - March 30, 2012
Preview for the Print Media for Seica Inc for the Nepcon Shanghai Show, April 25th to 27th, Booth 1H70

SEICA Inc.  - March 30, 2012
Preview for Seica SpA for SMT Nuremberg 2012 for the Print Media - May 8th to 10th, 2012

SEICA Inc.  - October 1, 2011
Preview for the Print Media for Seica SpA for Productronica, Munich, November 15st - 18 th 2011, Hall A1, Booth 445, New Munich Trade Fair

Agilent Technologies, Inc.  - December 3, 2007
Agilent Technologies and Multiprobe to Bring World's Highest-Resolution Nanoprober to Asia

SEICA Inc.  - February 1, 2007
Seica to Showcase its Line of Flying Probe Test Solutions at Nepcon Shanghai, Booth 4F11


More Products in the News...

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