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Test & Measuring Instruments ->
Probes ->
Electrical Probes
Electrical Probes
(Showing headlines 1 - 20) more ....
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 High-Contrast Probe Tips offer complete TERS solution.Bruker Corporation
Tucson, AZ 85756
Feb 21, 2013
By enabling Tip-Enhanced Raman Spectroscopy, IRIS TERS Probe Tips provide complete path to non-destructive, label-free chemical detection at nanoscale. Sharp, solid-gold cones are optimized for highest TERS enhancement at red and near-infrared Raman excitation wavelengths, maximizing sensitivity and spatial resolution. When utilized on Innova-IRIS systems, probes enable TERS on opaque samples using scanning tunneling microscopy feedback.
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 Probing System supports 4th Gen serial data measurements.Tektronix, Inc.
Beaverton, OR 97077
Feb 04, 2013
Paired with DPO/DSA73304D oscilloscope, 30 GHz P7600 Series provides connectivity and signal fidelity for high-speed differential signal measurements on serial bus designs like PCI Express. Two direct connect 2.92 mm coaxial inputs enable conversion of incoming differential signal pair to single oscilloscope input. In addition to differential measurements found in high-speed serial signals, TriMode™ supports independent single-ended and direct common mode measurements through same probe connection.
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 Flying Probe System features double-sided design.Acculogic Inc.
Markham, ON L3R5J6
Jan 22, 2013
Equipped with heavy-duty conveyor system to handle large and heavy boards, Flying Scorpion FLS980 Series III utilizes HP850 probe modules for functional testing up to 20 GHz. Double-sided, multi-probe system features optimized Boundary Scan, digital testing, and device programming. It includes ThermoScan™ for thermal verification, LaserScan™ for accurate positioning and warp compensation, and 1M/5M pixel camera system for positioning and AOI.
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Portable Test Probe measures phase noise.Symmetricom Inc.
San Jose, CA 95131
Dec 04, 2012
As part of base hardware kit, Symmetricom 3120A Test Probe measures phase noise and Allan Deviation. Additional software options are available to measure AM noise floor and signal statistics such as HDEV, TDEV, MDEV, and jitter. Options also enable probe to be used as frequency counter and for mask testing. Designed to take measurements and conduct analysis, software displays results in seconds without need for external data processing.
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Surface Resistivity Instrument can carry out BR test.Proceq USA, Inc.
Aliquippa, PA 15001
Oct 04, 2012
Using plate electrodes on each end of sample, Resipod Bulk Resistivity (BR) Model evaluates resistance of concrete cylinder. Unit comes with necessary accessories for carrying out bulk resistivity (BR) test. This fully integrated 4-point Wenner probe uses non-destructive test method and yields results within minutes. Supplied in waterproof housing designed to float, instrument meets AASHTO provisional standard TP95-11 and has measuring range of 0 to ca. 1000 kΩcm.
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Differential Active Probes facilitate digital system design.Agilent Technologies, Inc.
Santa Clara, CA 95051
Jul 25, 2012
Available in 1.5, 3.5, and 6 GHz models, N2750A Series features InfiniMode technology, which allows measurements of differential, single-ended, and common-mode signals with single probe tip without reconnecting probe to change connection. Units offer low input loading of 200 kW differential, 10 Vpp dynamic range, ±15 V offset range, and CMRR of greater than 60 dB at 1 MHz. Using built-in, quick-action control button, engineers can control most-needed scope functions.
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 RF Probes deliver repeatable broadband measurements.Everett Charles Technologies
Pomona, CA 91767
Jun 29, 2012
Utilizing independent probes arranged to create ground shield, K-50 Series can articulate to absorb DUT tolerances, fixture tolerances, and flexure when used in plunge-to-board test applications. Each ground and signal probe is replaceable and features instrument-grade Pogo Pin architecture, which is designed for up to 90% compression. Offering measurement capabilities from 4-12 GHz, controlled-impedance, spring contact probes are used as port extenders for network analyzers.
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 Capacitive Displacement Sensors achieve 0.05 nm resolution.Lion Precision Inc.
St. Paul, MN 55126 7014
May 30, 2012
Available in diameters of 3, 5, and 8 mm as well as 3/8 in. with axial and radial cable exits, Capacitive Displacement Sensor Probes are useful in any application requiring measurement or monitoring of position of conductive target. Units are not sensitive to material changes and respond equally to all conductors. Designed to work with several models of electronic drivers, probes are suited for semiconductor, disk-drive, precision bearing, and micromachining industries.
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Flying Lead Solder-Down Probe suits PCIe 3.0 protocol analysis.Agilent Technologies, Inc.
Santa Clara, CA 95051
Apr 12, 2012
Used with U4301A protocol analyzer module, U4324A can be used for bidirectional lane widths as narrow as x2 and cleanly captures 8.0 GT/s traces from DUT. Probe provides additional line for connection to external reference clock, and it supports 2.5, 5, and 8 GT/s PCIe IO speeds. Designed to meet needs of silicon, system, and embedded PC connector testing, product works with replaceable N5426A ZIF (zero insertion force) tip kit that extend probe life via tip on-demand replacement.
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CompactPCI Serial Interposer aids PCI Express 2.0 analysis.LeCroy Corp.
Chestnut Ridge, NY 10977
Apr 04, 2012
Intended for Summit(TM) PCIe protocol analyzer product line, PCIe 2.0 cPCI serial interposer provides dedicated probe that helps analyze in-band PCIe data traffic between cPCI serial card and its system chassis. Star architecture is made up of serial point-to-point connections; one system slot can control up to 8 peripheral slots. Instrument supports PCIe data channels with lane widths up to x8 at data rates up to 5 GT/s.
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PCI 3.0 Multi-Lead Probe utilizes Gen3 tapping technology.LeCroy Corp.
Santa Clara, CA 95054
Feb 06, 2012
Available for Summit(TM) T3-16 and Summit T3-8 Protocol Analyzers, PCI Express® 3.0 multi-lead probe can be used by system developers to probe point-to-point bus signals or serial buses when there is no supported interposer card. Tool supports PCIe 3.0 specification, which includes data rates up to 8 GT/s, and is expandable to support x1-x16 PCIe lanes when using Summit protocol analyzer. Probe tips are flexible for tapping signals in narrow areas on circuit boards.
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 Capacitive Displacement Probes come in 3, 18, and 25 mm sizes.Lion Precision Inc.
St. Paul, MN 55126 7014
Jan 18, 2012
Measuring 15 mm long, 3 mm diameter Capacitive Displacement Probe provides measurement ranges as small as 10 µm with resolutions less than 1 nm. Unit is available with right angle or axial cable exits for squeezing into tight spaces. On larger end, 18 mm and 25 mm diameter probes provide measurement ranges as large as 12.5 mm while maintaining resolutions as low as 125 nm.
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Concrete Surface Resistivity Meter performs non-destructive test.Proceq USA, Inc.
Aliquippa, PA 15001
Apr 04, 2011
Able to yield results within minutes, Resipod 4-point Wenner probe measures electrical resistivity of concrete or rock. Portable field unit meets AASHTO provisional standard TP95-11 and is available with 1.5 or 2 in. probe. In addition to indicating current flow, poor contact status, and variations in water/cement ratios, commercial product can identify areas susceptible to chloride penetration. USB connection and dedicated Resipod Link PC software are standard.
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 Blast Pressure Sensors offer resonant frequencies to 500 kHz.PCB Piezotronics Inc.
Depew, NY 14043 2495
Nov 04, 2010
Series 137B quartz ICP® blast pressure pencil probes, featuring micro-second response time, offer high-level 5 V output signal capable of driving long cable runs hundreds of feet long to safe zone for data acquisition. Probe sensors can capture both peak pressure and total impulse calculations. Designed for range of explosion, blast, and shock wave testing, units are suited for applications like measuring blast pressure in free-field or closed bunker arenas.
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ExpressCard Interposer enables PCI Express® 2.0 analysis.LeCroy Corp.
Chestnut Ridge, NY 10977
Sep 20, 2010
Supporting both 34 and 54 mm form factors, ExpressCard 2.0 Interposer for Summit(TM) PCI Express Protocol Analyzer provides series of test points for measuring various signals and runs at data rates up to 5 GT/sec to support PCI Express 2.0. To use interposer, plug ExpressCard under test into interposer, then plug interposer into host system. In addition, interposer card also provides connectivity to LeCroy's USB analyzers for USB 2.0 protocol analysis.
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High Frequency Oscilloscope Compatible Probes measure AC current.AEMC Instruments
Foxborough, MA 02035
Jul 07, 2010
Models MF 300-6-2-10 HF and MF 300-10-2-10 HF High Frequency MiniFlex® Probes feature flexible sensor available in lengths of 6 and 10 in. as well as electronic module. Measuring AC current from 5 Hz to 1 MHz, lightweight units use transformation principle based on air core, and present no load to system under test. Devices are insensitive to DC currents and have mV output proportional to current measured for direct readings on oscilloscopes, DMMs, data loggers, and power or harmonic meters.
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 Capacitance Probes incorporate dual timer functionality.BinMaster
Lincoln, NE 68507
Jun 04, 2010
PROCAP I and II offer flexible time delay that lets user set probe to react immediately or with up to 30 sec delay when it detects covered/uncovered state. Featuring interference-free, fail-safe operation as well as Quick-Set calibration, probes work at 6 KHz and can be used for high and low level detection in vessels used for material storage or process manufacturing. Assortment of probes and extensions allow use with solid, liquid, and slurry materials.
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 Oscilloscope Probing System features 30 GHz bandwidth.Agilent Technologies, Inc.
Santa Clara, CA 95051
May 10, 2010
Offering real-time measurements, InfiniiMax III Probing System is available with 4 probe amplifier models with bandwidths from 16-30 GHz. Range of probe heads allows connection using browser, zero insertion force tip, 2.92 or 3.5 mm SMA cable, or solder-in tips. InfiniiMax III browser uses crisscross blade grounding system for low inductance grounding, poly-iron wrap of coax tips to minimize standing waves, and very-low parasitic replaceable resistor tips to achieve 30 GHz performance.
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 Aerial Flying Probers include thermal scan.SEICA Inc.
Salem, NH 03079
Mar 19, 2010
Based on VIVA Integrated Platform core hardware and software, AERIAL Flying Probers include 2 Flying IC Thermal Detection Units positioned on each side of unit under test to detect thermal parameters of ICs under power. Purpose is to compare temperatures of known good boards to suspect boards and indict bad components in depot repair environment. Models range from 2-8 test probes, accessing simultaneously one or both sides of board, which can be positioned horizontally or vertically.
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Cable Interposer enables PCI Express® 2.0 analysis.LeCroy Corp.
Chestnut Ridge, NY 10977
Mar 05, 2010
Designed for Summit(TM) PCI Express Protocol Analyzer product line, PCI Express 2.0 External Cable Interposer provides dedicated probe that facilitates analysis of data traffic between host and device that are connected using external PCI Express cable. Interposer allows protocol analyzer connection by tapping into external cable connection. Unit supports PCI Express data channels with lane widths of x4 and x8 at all standard PCIe data rates up to 5 GT/s.
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