X-ray Fluorescence Analyzer can analyze up to 4 coating layers.
Press Release Summary:
April 20, 2012 - Meeting ASTM B568 and ISO 3497 international test methods, X-Strata920 x-ray fluorescence (XRF) analyzer offers coating thickness measurement and materials analysis for industrial markets such as electronics, metal finishing, alloys, and precious metals assay. Combining large area proportional detector and micro-focus x-ray tube, providing high-intensity, small spot x-ray beam for sample excitation. If problem area is identified, operator can return to specific points for detailed investigation.
Original Press Release
New X-Strata920 from Oxford Instruments Offers Rapid and Reliable XRF Coating Thickness Measurement and Materials Analysis
Press release date: April 17, 2012
Global Marketing Communications Manager
Oxford Instruments Industrial Analysis
Tel: +44 (0) 1494 479278
Fax: +44 (0) 1494 461033 About Oxford Instruments plc
Oxford Instruments designs, supplies and supports high-technology tools and systems with a focus on research and industrial applications. It provides solutions needed to advance fundamental physics research and its transfer into commercial nanotechnology applications. Innovation has been the driving force behind Oxford Instruments' growth and success for over 50 years, and its strategy is to effect the successful commercialisation of these ideas by bringing them to market in a timely and customer-focused fashion. The first technology business to be spun out from Oxford University over fifty years ago, Oxford Instruments is now a global company with over 1900 staff worldwide and is listed on the FTSE250 index of the London Stock Exchange (OXIG). Its objective is to be the leading provider of new generation tools and systems for the research and industrial sectors. This involves the combination of core technologies in areas such as low temperature, high magnetic field and ultra high vacuum environments, Nuclear Magnetic Resonance, X-ray, electron and optical based metrology, and advanced growth, deposition and etching. Oxford Instruments aims to pursue responsible development and deeper understanding of our world through science and technology. Its products, expertise, and ideas address global issues such as energy, environment, security and health. About Oxford Instruments Industrial Analysis
Oxford Instruments, Industrial Analysis offers a range of analytical instruments designed for demanding quality control applications. From materials analysis to thickness gauging, the Industrial Analysis products incorporate the latest field proven technology, coupled with over 30 years of experience in designing, producing and supporting world class instruments. X-MET handheld X-ray Fluorescence (XRF) analysers and our expanded range of ARC/Spark mobile Optical Emission Spectrometers (OES) are specifically designed for positive material identification, alloy analysis and screening. Our OES systems comprise: FOUNDRY-MASTER PRO, FOUNDRY-MASTER Xpert, FOUNDRY-MASTER COMPACT, PMI-MASTER PRO and TEST-MASTER PRO. X-Supreme, Lab-X, MDX1000 XRF spectrometers span the price/performance range for routine chemical analysis. From sulfur in petroleum products to the analysis of limestone, we can match exactly the correct spectrometer to your needs. For thickness gauging applications we offer handheld magnetic and eddy current gauges to full function, high performance XR systems. Our X-Strata980 and X-Strata920 systems provide world-class performance for coating thickness measurement.