XRF Analyzer measures coating thickness.
December 2, 2004 - Utilizing 100 W X-ray tube, X-Strata960 provides composition analysis and coating thickness measurement. Small collimator analyzes micro-features, while large chamber and XY table handle large parts. Featuring integrated PC and monitor, analyzer provides distance-independent measurement for complex sample geometry, and includes Auto Range Finder, which eliminates operator error. It is suited for metal finishing, electronics, and precious metals industries.
(Archive News Story - Products mentioned in this Archive News Story may or may not be available from the manufacturer.)
Original Press release
Oxford Instruments Analytical
Halifax Road
High Wycombe, , HP12 3SE
United Kingdom
Oxford Instruments Launches New Coating Thickness Analyzer X-Strata960
Oxford Instruments Analytical has announced the launch of the X-Strata960. A new XRF analyzer for coating thickness and composition analysis, it includes a range of unique features specifically designed to enhance its performance and ease of use, such as:
• 100W X-ray Tube – to give more power, precision and shorter measurement time
• Distance Independent Measurement to handle complex sample geometry
• Auto Range Finder removing operator error
• Smaller Collimator for analyzing micro-features
• Giant Chamber and XY table to handle large parts
• Integrated PC and monitor for ease of use and installation
• And much more…
X-Strata960 strengthens the existing CMI900 series of coating thickness measurement analyzers and has been designed to deliver clear performance advantages to the general metal finishing, electronics and precious metals industries.
For further information, please contact analytical@oxinst.co.uk
www.oxford-instruments.com/X-Strata
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