Product News: Software
Semiconductor Characterization Software offers parametric testing.
Press Release Summary:
October 1, 2010 - Intended for semiconductor test and measurement applications, ACS Basic Edition v1.2 aids characterization of component or discrete (packaged) semiconductor devices. Trace Mode allows instantaneous check of results and interactively controls voltage sweeps to avoid impending device breakdown. Functionality combines high-speed hardware control, device connectivity, and data management in one tool, optimized for part verification, debugging, and analysis.
Keithley Instruments, Inc.
Original Press Release
Keithley ACS Basic Edition Version 1.2 Provides New Levels of Usability, Convenience, and Productivity for Semiconductor Test Applications
Press release date: September 28, 2010
Cleveland, OH - Keithley Instruments, Inc. (NYSE:KEI), a world leader in advanced electrical test instruments and systems, announced a new release of its ACS Basic Edition Semiconductor Parametric Test Software for semiconductor test and measurement applications. ACS Basic Edition Version 1.2 adds new levels of usability, convenience, and productivity in the characterization of component or discrete (packaged) semiconductor devices. It features a Trace Mode that allows an instantaneous check of results and interactively controls voltage sweeps to avoid impending device breakdown. In addition to full support for Keithley's broad line of source-measure (SMU) instrumentation, ACS Basic Edition combines high speed hardware control, device connectivity, and data management in an easy-to-use tool optimized for part verification, debugging, and analysis. For more information, visit www.keithley.com/products/semiconductor/characterizationsoftware/acsbasic/?mn=ACSBasicEdition.
Productivity Features ACS Basic Edition offers an incredibly rich set of quick and easy-to-access test libraries, so no programming is needed. An intuitive GUI further simplifies many types of I-V testing, data collection, and analysis. Even novice users can test a semiconductor component in seconds, generate a family of curves, and then compare them with reference curves immediately. While pre-configured tests minimize startup time, the user still has the flexibility to optimize a test or the entire test system.
The new Trace Mode feature of ACS Basic Edition Version 1.2 supports interactive testing of a device. It can be used to map out the operating range and characteristics of a DUT while avoiding damage to the device. This interactive mode includes a convenient method of controlling the voltage level of a sweep with either a virtual slide bar or the arrow keys on a PC keyboard.
Serving a Wide Range of Applications ACS Basic Edition maximizes productivity for technicians and engineers responsible for packaged part characterization in applications ranging from early device research through development, quality verification, and failure analysis. It will serve university researchers and developers of novel devices equally well, aiding in the transition from pure research to commercial application. It can also be used in semiconductor facilities and companies involved in pilot production for process refinement at the component level, supporting engineers involved in QA, failure analysis, and post-production testing.
Price and Availability. ACS Basic Edition Version 1.2 is now available as an upgrade for users of earlier versions at a price of USD $999. It is available to first-time buyers at USD $4995.
More Information. For more information about ACS Basic Edition Version 1.2, visit www.keithley.com/products/semiconductor/characterizationsoftware/acsbasic/?mn=ACSBasicEdition, or contact the company at: Telephone: 800-688-9951 440-248-0400 FAX: 440-248-6168 E-mail: firstname.lastname@example.org
About Keithley Instruments, Inc. With more than 60 years of measurement expertise, Keithley Instruments has become a world leader in advanced electrical test instruments and systems. Our customers are scientists and engineers in the worldwide electronics industry involved with advanced materials research, semiconductor device development and fabrication, and the production of end products such as portable wireless devices. The value we provide them is a combination of products for their critical measurement needs and a rich understanding of their applications to improve the quality of their products and reduce their cost of test.
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