Product News: Test & Measuring Instruments
Parametric Test System offers comprehensive diagnostics.
Press Release Summary:
January 20, 2014 - To ensure system health, Model S530 includes GUI-driven tool that expands diagnostic coverage for all system instrumentation and matrix pathways. KTE v5.5 addresses all I-V and C-V measurements required in process control monitoring, process reliability monitoring, and device characterization. In addition to 200 V system configuration used for standard CMOS, bipolar, and MEMS processes, 1 kV version is available for difficult breakdown and leakage tests that GaN, SiC, and Si LDMOS devices demand.
Original Press Release
Keithley Enhances S530 Parametric Test System Capabilities with Software Upgrade
Press release date: January 14, 2014
Comprehensive system diagnostics · Expanded measurement functions · Larger instrument cabinet
Cleveland, Ohio – Keithley Instruments, Inc., a world leader in advanced electrical test instruments and systems, introduced today the latest upgrades to its popular S530 Parametric Test Systems, the semiconductor industry’s most cost-effective solution for high-speed production parametric test. These enhancements demonstrate Keithley’s ongoing commitment to S530 user needs for system serviceability, measurement confidence, and a low overall cost of ownership, as well as Keithley’s commitment to parametric test in general. For more information, visit http://www.keithley.com/products/semiconductor/parametrictestsys/?mn=S530.
S530 Diagnostics and System Verification Tool
This new GUI-driven tool expands diagnostic coverage for all system instrumentation and matrix pathways, providing greater confidence in the health of the system. Additionally, users can run the system verification tool to ensure the S530 is within its published system specifications. The diagnostic and system verification tool generates comprehensive results files, making it easier to share information with Keithley field service personnel or monitor trends in system health. Overall, the new tool improves the user’s experience with the S530, while driving down total cost of ownership.
Expanded Measurement Capabilities
The upgrade includes a variety of new measurement capabilities and added flexibility to the Keithley Test Environment (KTE). The commands used in the KTE linear parametric test library (LPTLIB) and parametric test library (PARLIB) build on the advantages of Keithley’s three decades of field experience in parametric test code development. S530 Parametric Test Systems running the new KTE V5.5 can address all of the I-V and C-V measurements required in process control monitoring, process reliability monitoring, and device characterization.
S530 systems are optimized for use in production parametric test environments that must accommodate a broad mix of products or wherever wide application flexibility and fast test plan development are critical. In addition to the 200V system configuration that is typically used for standard CMOS, bipolar, MEMS, and other relatively low voltage semiconductor processes, Keithley developed a 1kV version optimized for the difficult breakdown and leakage tests that GaN, SiC, and Si LDMOS power devices demand. To accommodate this expansion of the system’s range of applications, Keithley has also developed a taller system cabinet designed to house additional instrumentation and simplify overall system maintenance.
For More Information
To learn more about the enhanced S530 Parametric Test System capabilities, visit http://www.keithley.com/products/semiconductor/parametrictestsys/?mn=S530 or contact the company at:
About Keithley Instruments, Inc.
With more than 60 years of measurement expertise, Keithley Instruments has become a world leader in advanced electrical test instruments and systems. Our customers are scientists and engineers in the worldwide electronics industry involved with advanced materials research, semiconductor device development and fabrication, and the production of end products such as portable wireless devices. The value we provide them is a combination of products for their critical measurement needs and a rich understanding of their applications to improve the quality of their products and reduce their cost of test. In 2010, Keithley Instruments joined Tektronix as part of its test and measurement portfolio.
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