ThomasNet News Logo
Sign Up | Log In | ThomasNet Home | Promote Your Business

Five-Axis CMM uses probe for surface finish inspection.

Print | 
Email |  Comment   Share  
Five-Axis CMM uses probe for surface finish inspection.
Five-Axis CMM uses probe for surface finish inspection.
Click Here to Enlarge Picture
November 9, 2012 - With SFP1 probe option, featuring 6.3 to 0.05 Ra measurement capability, REVO® 5-Axis CMM integrates surface finish inspection within coordinate measurement routines. Probe comes with straight and cranked styli, which are selected via measurement program control using modular rack system. With straight stylus, SFP1 can perform measurement trace within 10 mm diameter bore to depth of 100 mm. Skidded probe, featuring 2 µm radius diamond stylus tip, outputs Ra, RMS, and raw data formats.

Another First in Coordinate Measurement Technology - Renishaw Introduces Surface Finish Measurement for CMMs with New Probe for REVO® Five-Axis System


(Archive News Story - Products mentioned in this Archive News Story may or may not be available from the manufacturer.)

Renishaw Inc
5277 Trillium Blvd.
Hoffman Estates, IL, 60192
USA





Press release date: November 8, 2012

Renishaw’s new SFP1 probe option for the REVO® five-axis measurement system is the first to allow surface finish inspection to be fully integrated within coordinate measurement routines.

With a measurement capability of 6.3 to 0.05 Ra, the SFP1 surface finish probe makes the CMM a “single platform” metrology system. It eliminates the need for hand-held surface measurement devices or transporting parts to a dedicated surface measuring machine, reducing labor costs and inspection lead times. The system allows automated switching between dimensional measurement and surface finish measurement, with the analysis contained in a single report.

The SFP1 probe is a fully integrated option for the REVO 5-axis measurement system, supplied with two dedicated styli, straight and cranked, which are selected via the measurement program control using the system’s modular rack system (MRS). The probe incorporates a C axis that, combined with the infinite positioning of the REVO head and choice of stylus holders, allows the probe tip to be automatically oriented to any angle to suit the part, ensuring that the highest quality surface data is acquired. This enables flexible access to component features, combined with the consistency of fully automated CNC control. Using the straight stylus, the SFP1 can perform a measurement trace within a 10 mm diameter bore to a depth of 100 mm.

A skidded probe with a 2 µm (0.000079 in) radius diamond stylus tip, the SFP1 probe outputs Ra, RMS and raw data formats to the metrology application software via Renishaw’s UCCServer software, using the I++ DME protocol. The raw data can subsequently be presented to specialized surface analysis software for more detailed reporting.

Automated surface finish probe calibration
Calibration of the probe is also automated under the CMM program. A surface finish calibration artifact (SFA) is mounted on the MRS rack and is measured using the SFP1 probe. Software then adjusts parameters within the probe in accordance with the artifact’s calibrated value.

For more information about Renishaw's CMM probe systems, software, or CMM retrofit service, visit www.renishaw.com/probes.

Contact
Jeff Seliga
Renishaw Inc. 
5277 Trillium Blvd.
Hoffman Estates, IL 60192
Tel: 847.286.9953
Fax: 847.286.9974
jeffrey.seliga@renishaw.com

Inquiries should be directed to:
In USA:  Susan Wilm, Marketing Assistant, Renishaw Inc., 5277 Trillium Blvd., Hoffman Estates, IL  60192.  susan.wilm@renishaw.com  Tel:  847.286.9953

In Canada:  Dafydd Williams, General Manager, Renishaw (Canada) Limited, 2180 Dunwin Drive, Unit #1, Mississauga ONT  L5L 5M8.  dafydd.williams@renishaw.com  Tel:  905.828.0104
Print | 
Email |  Comment   Share  
Contacts: View detailed contact information.


 

Post a comment about this story

Name:
E-mail:
(your e-mail address will not be posted)
Comment title:
Comment:
To submit comment, enter the security code shown below and press 'Post Comment'.
 



 See related product stories
More .....
 See more product news in:
Test and Measuring Instruments
 More New Product News from this company:
Laser Radar Sensor delivers high accuracy, dynamic positioning.
Mini Incremental Optical Encoder has filtering optics, AGC, AOC.
Laser Calibration Analysis Software offers error compensation.
Comparative Gauging System offers instant inspection status.
Rotary Axis Calibrator measures angular position to ±1 arc sec.
More ....
| Featured Manufacturing Jobs
 Other News from this company:
Fanbeam Production Moves to Renishaw Facility
Laser Encoders an Enabling Technology for High-Accuracy Machining of 40 Meter Composite Parts
BLOODHOUND Supersonic Car Turns to Renishaw 3D Printing Expertise
Renishaw Seminar Aims to Transform Your Manufacturing with the Power of Process Control
Solid-State Encoder Manufacturer RLS Triples in Size
More ....
 Tools for you
Watch Company 
View Company Profile
Company web site
More news from this company
E-mail this story to a friend
Save Story
Search for suppliers of
Stylus Probes
Inspection Probes
Coordinate Measuring Machinery (CMM)
CMM Probes
Join the forum discussion at:
Tools of the Trade




Home  |  My ThomasNet News®  |  Industry Market Trends®  |  Submit Release  |  Advertise  |  Contact News  |  About Us
Brought to you by Thomasnet.com        Browse ThomasNet Directory

Copyright © 2014 Thomas Publishing Company. All Rights Reserved.
Terms of Use - Privacy Policy



Error close

Please enter a valid email address