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Metal Detector features super slim detector case design.
February 15, 2008 -
Met30+ Waferthin HF is capable of detecting miniscule slivers of stainless steel while maintaining compact detector case design that allows unit to be installed in tight bagger/scale spaces. ADC software system provides onscreen diagnostic tool that features graphic technology, which helps in identifying and resolving problem areas and simplifying data analysis of metal contamination and product signal. Detector comes with touchscreen panel option.
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Lock Offers Space Saving Waferthin with 40% Improved Sensitivity
Lock Inspection Systems now offers its MET30+ Waferthin HF metal detector in a high frequency model that improves sensitivity by up to 40%. The Met30+ Waferthin has a compact design to fit tight parameters, while still retaining high quality control standards and offers even greater sensitivity with the availability of high frequency. It is capable of detecting miniscule slivers of stainless steel while maintaining the super slim detector case design which allows the Waferthin to be installed in tight bagger/scale spaces.
The Waferthin HF features user-friendly and easily accessible operator controls. Also available with the MET30+ waferthin metal detector is Lock's exclusive ADC software system. ADC provides operational and maintenance staff with an onscreen diagnostic tool which features a unique graphic technology that acts as a "window to the detection envelope" to help identify and resolve problem areas and simplify data analysis of metal contamination and product signal. This software can be operated from a laptop or via the metal detector touchscreen panel option.
For further information, please contact:
Mark D'Onofrio
Lock Inspection Systems
207 Authority Dr.
Fitchburg, MA 01420.
Tel: 978 343 3716.
Fax: 978 343 6278.
E-mail: mdonofrio@lockinspection.com.
http://www.lockinspection.com
Contacts:
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