USB 2.0 Cameras detect faults in solar cells and panels.
February 11, 2009 -
LucaEM R and iKon-M 934 BR-DD utilize induced photovoltaic electroluminescence, where weak emissions in 900-1,100 nm wavelength range are used to detect faults such as shunts, crystalline defects, and broken-finger electrodes during solar cell and panel manufacturing process. LucaEM R uses monochrome megapixel frame-transfer EMCCD sensor, providing single-photon detection sensitivity and NIR quantum efficiency to 27% @ 900 nm, while iKon-M 934 BRDD delivers 70%.
High performance NIR-enhanced CCD and EMCCD cameras harness benefits of photovoltaic luminescence imaging
A faulty solar cell as detected using electroluminescence - image courtesy of David Killiani, University Konstanz
Belfast, Northern Ireland, 4 February 2009 - Common faults in solar cells and panels can now be detected far more simply using two high-performance cameras from Andor Technology - the iKon-M 934 BR-DD and the LucaEM R.
Both cameras have high quantum detection efficiency and sensitivity in the near-infrared (NIR) range, making them ideal for solar cell quality control during manufacturing. They harness the phenomenon of induced photovoltaic electroluminescence, where weak emissions in the 900-1100nm wavelength range are used to detect typical faults such as shunts, crystalline defects and broken-finger electrodes.
These cameras also offer exceptionally high sensitivity at rapid frame rates, meaning they can be used for high-throughput testing of individual photovoltaic cells or larger panels.
By incorporating photovoltaic electroluminescence into their QC routines and R&D work, manufacturers can benefit from a simpler, potentially less expensive inspection technique. However, as photovoltaic electroluminescence emissions are very weak, extremely sensitive cameras are required, such as the iKon-M BR-DD and the LucaEM R.
The LucaEM R is a highly cost-effective yet fast and powerful Electron Multiplying CCD camera for high-throughput in-line production inspection. LucaEM R uses a monochrome megapixel frame-transfer EMCCD sensor, providing single photon detection sensitivity and high NIR quantum efficiency (27% @ 900 nm) in a cooled, compact, USB 2.0 camera platform.
The iKon-M 934 BRDD is designed to offer ultimate responsivity in the NIR region, delivering ~70% QE at 900nm. The megapixel CCD camera also benefits from deep TE cooling to -100 0C, very low read noise and a convenient USB 2.0 interface.
Andor enables its customers to break new ground by performing light measurements previously considered impossible. With a portfolio spanning high-performance scientific digital cameras, spectrographs, and microscopy systems, Andor is a leader in scientific imaging and spectroscopy solutions, with revenue totalling GBP24.7 millions for the fiscal year ended September 30, 2008. More information about Andor Technology PLC (LSE: AND) is available at www.andor.com. Company Information: Name: Andor Technology Ltd. Address: 425 Sullivan Ave., Suite 3 City: South Windsor State: CT ZIP: 06074 Country: USA Phone: 860-290-9211 FAX: 860-290-9566 http://www.andor.com
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