Panels, Workshops and Technical Sessions at 2006 IEEE MTT-S IMS
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What: Agilent Technologies engineers and executives will participate in a variety of workshops and panel presentations at the annual 2006 IEEE Microwave Theory and Techniques Society (MTT-S) IMS conference.
When: June 11-16, 2006
Where: Moscone Convention Center, San Francisco, CA.
(The entrance is on Howard Street between 3rd and 4th streets.)
Panels: Dueling Dualities: How to Best Marry Time-Domain System-Level Verification With Frequency-Domain RF Circuit Simulations
Niranjan Kanaglekar, Agilent Technologies will be a panel member.
The panel will discuss pros and cons of various methods that enable system-level verification of RF circuits.
o Wednesday, June 14, noon -- 1:20 p.m.
o Moscone Convention Center Room 102-Gateway Ballroom
Workshops: Multi-Chip Radio Module (MCRM) Design Methodology and Tools and Manufacturing Issues for Cellular Applications
Chris Mueth, Agilent Technologies will discuss wireless system simulation using Agilent EDA tools
o Sunday, June 11; 8 a.m. - 5 p.m.
o Moscone Convention Center, Rooms 224/226
Memory Effects in Power Amplifiers
Nonlinear Behavioral Models with Memory: Formulation, Identification and mplementation,
David E. Root, David Sharrit and Jan Verspecht, Agilent Technologies
o Sunday, June 11, 8 a.m. - 5 p.m
o Moscone Convention Center, Room 305
Practical Methods for Determining the Accuracy of Measurements
A.Review Of Techniques Both old and new
Accommodating Component Uncertainties into Subsystem and System-level Specifications, B. Szendrenyi, Agilent Technologies
Managing Uncertainty Budgets and Using 'Buffer Zones' in Specifications, B. Szendrenyi, Agilent Technologies
o Monday, June 12, 8 a.m. - 5 p.m.
o Moscone Convention Center, Room 200
High Speed Digital Signal Integrity
Overview of High Speed Digital Systems and the Key Issues Facing Today's Designers, Mike Resso, Agilent Technologies
S-parameter Characterization of Operational Transmitters and Channels in Digital Communications Systems,
Greg LeCheminant, Agilent Technologies
o Monday, June 12, 8 a.m. - 5 p.m.
o Moscone Convention Center, Room 222
Passive and Active Differential Measurements: State-of-the-Art and Applications
Non-linear Differential Device Characteristics: Measurements and Models, Joel Dunsmore, Agilent Technologies
o Monday, June 12, 1 - 5 pm.
o Moscone Convention Center, Rooms 202/210
Technical Session Papers:
o Measurement-Based Non-Quasi-Static Large-Signal FET Model Using Artificial Neural Networks, J. Xu, D. Gunyan, M. Iwamoto, A. Cognata, D. Root, Agilent Technologies
o Linearity Improvement of HBT based Doherty Amplifiers using a Simple Analytical Model, Y. Zhao, P. Asbeck, University of California, San Diego;
A. Metzger, P. Zampardi, Skyworks Inc.; M. Iwamoto, Agilent Technologies
o A Calibrated Microwave Directional Bridge for Remote Network Analysis through Optical Fiber, T.S. Marshall, R. Van Tuyl, Agilent Technologies Inc.
o Why Reciprocal Procedure Works?
T. Jamneala, D.A. Feld, B. Zaini, Avago Technologies Inc.;
D. Blackham, K.H. Wong, Agilent Technologies Inc.
Media Analysts: For any additional questions about Agilent's microwave and RF products contact Janet Smith at +1 970 679 5397 or janet_smith@agilent.com to set up a specific meeting time.
EDITORIAL CONTACT:
Janet Smith
+1 970 679 5397
janet_smith@agilent.com
