IDI Publishes New Brochure on Synergetix Brand Test Sockets
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Kansas City, KS-- Interconnect Devices, Inc. (IDI), the world's leading manufacturer of spring contact probes, test sockets and custom interconnect solutions announces the availability of a new publication that reviews the newest additions, options and features of their Synergetix brand of custom test sockets.
The brochure introduction presents a discussion of the benefits of spring probe technology, introduced to the test socket category by IDI in the 1980s. In 1996, IDI introduced the revolutionary three-piece probe design that has gained IDI's Synergetix Test Sockets worldwide recognition. The three-piece design brought base resistances to dramatically new lows.
The brochure's product section is organized to help test socket specifiers review IDI's Synergetix product lines and options, including:
o BGAs - This details how Synergetix is solving the many challenges associated with high pin count BGA devices, including the move to lead free products.
o QFNs - As pitches continue to shrink and the alignment challenges become extreme, this section discusses how Synergetix probe technology is keeping pace with the miniaturization movement with the most complete solution.
o QFPs - Synergetix recent innovations here are changing old perceptions, proving that spring probe technology offers many benefits for the testing of leaded device.
o Multi-Site Test Sockets - Synergetix is helping customers reduce time and cost with multi-site solutions. The advantages are dramatic as test time can be decreased by a factor of ten over conventional one-up testing.
With this brochure, Synergetix continues the innovation with the introduction of two revolutionary solutions, the XACT(TM) Test Socket and the Off-Set Kelvin Probe.
o XACT(TM) - XACT is the first self-adjusting test socket with compliant walls. This new design provides an exact fit for each device, no matter how wide the tolerance ranges found on the device prints. Users have reported a dramatic increase in first pass yields.
o Off-Set Kelvin Probe - The patent-pending 0.5mm pitch Off-Set Kelvin Probe allows those test engineers involved in Kelvin testing to accurately isolate and measure package resistance within 1 m?, while taking advantage of conventional 0.5 mm DUT board designs. The key design advancement of this new probe is the beveled offset tip that allows for tighter centers, down to 0.22 mm, on the device pad.
For a copy of IDI's new Synergetix Test Socket Brochure, please contact IDI at (913) 342-5544, or visit our Synergetix Test Sockets web site at www.synergetix.com
