MIRTEC's Revolutionary MV-7 OMNI 2D/3D AOI Series Recognized by Innovation Awards at Nepcon China
Suite 801 - 3, 103 Dong, SK Ventium 522
Gunpo City, Korea (north)
Press release date: April 1, 2014
MIRTEC, “The Global Leader in Inspection Technology,” announces that it has been awarded a 2014 EM Asia Innovation Award in the category of Test Measurement / Inspection Systems – AOI for its MV-7 OMNI. The award was presented to the company during an April 24, 2014 ceremony at the Shanghai World Expo Exhibition Convention Center during NEPCON China.
The MV-7 OMNI 2D/3D In-Line AOI Machine is configured with MIRTEC’s OMNI-VISION® 2D/3D Inspection Technology which combines an exclusive 15MP 2D ISIS Vision System with MIRTEC’s revolutionary Digital Multi-Frequency Quad Moiré 3D system to provide precision inspection of SMT devices on finished PCB assemblies. The MV-7 OMNI machine also features four (4) 10 Mega Pixel Side-View Cameras in addition to the 15 Mega Pixel Top-Down Camera.
“We are honored to win this year’s EM Asia Innovation Award for our MV-7 OMNI Series”, said Brian D’Amico, President of MIRTEC’s North American Sales and Service Division. “Our goal in the design and development of this product series is to address growing market demand for the very latest in State-of-the-Art 2D/3D Inspection Technology at an affordable price point! We are confident that this Advanced Technology will not only provide unprecedented speed and performance to the electronics inspection industry, but will undoubtedly set a new standard by which all other inspection equipment will be measured.”
Established in 2006, the EM Asia Innovation Awards program strives to recognize and celebrate excellence in the Asian electronics industry, inspiring companies to achieve the highest standards and push the industry forward.
MIRTEC is a leading global supplier of automated inspection systems to the electronics manufacturing industry. For further information, please visit www.mirtec.com.