ThomasNet Home   |   Promote Your Business
Home  |   My ThomasNet News®  |   Industry Market Trends  |   Submit Release  |   Advertise  |   About Us May 24, 2012  

Bede X-ray Metrology Wins BedeMetrix(TM)-L Order from Tokyo Electron America, Inc

Print | 
Email |  Comment   Share  

(Archive News Story - Products mentioned in this Archive News Story may or may not be available from the manufacturer.)

Bede
Belmont Business Park
Durham, DH1 1TW
United Kingdom



Press release date: June 28, 2006

DURHAM, UK - Bede X-ray Metrology, a leading global provider of X-ray metrology systems to the semiconductor industry, is pleased to announce that it has won an order for a BedeMetrix(TM)-L system from Tokyo Electron America, Inc, Austin, TX, USA. The BedeMetrix(TM)-L process control system for semiconductor research and development will be used to investigate leading-edge front end materials including SiC and SiGe.

Mr Anthony Dip, Process Manager, Tokyo Electron America, Inc said, "X-ray metrology is more important than ever in helping semiconductor manufacturers to fully understand their materials and processes. For Tokyo Electron as a thin film equipment provider, the BedeMetrix(TM)-L system is the best solution to enable us to analyse important advanced materials, using parameters that are essential for device functionality at our customers' new technology nodes."

Jim Polasik, Chief Operating Officer, said, "I am delighted that Tokyo Electron is purchasing a BedeMetrix(TM)-L for their advanced metrology needs. The BedeMetrix(TM)-L is a versatile X-ray metrology system for 300mm process development on both front and back end materials.

Bede systems are at the forefront of enabling technology for semiconductor manufacturing at 90nm technology nodes and below. Due to its short wavelength, X-ray metrology offers increased analysis of material properties and parameters including thickness, at atomic levels. However, unlike optical and opto-acoustic metrology, the system also measures strain, relaxation, strain, phase, composition and density. This information is critical for the full characterization of materials which are being used today.

I am pleased to be working with another of the world's leading semiconductor companies as they introduce the latest generation of advanced semiconductor manufacturing technology."

Belmont Business Park, Belmont, Durham, DH1 1TW, UK

T: ++ 44 (0)191 332 4700 F: ++ 44 (0)191 332 4800 E: info@bede.co.uk www.bede.com

For more information, contact: Frank Hochstenbach, Global Sales & Marketing Director Bede X-ray Metrology Belmont Business Park, Durham, DH1 1TW, UK TEL: +44 (0)191 332 4700; FAX: +44 (0)191 332 4800 E-MAIL: frank.hochstenbach@bede.co.uk
Print | 
Email |  Comment   Share  
Contacts: View detailed contact information.


 

Post a comment about this story

Name:
E-mail:
(your e-mail address will not be posted)
Comment title:
Comment:
To submit comment, enter the security code shown below and press 'Post Comment'.
 



Start Your Free
Subscription to
Industry Market Trends.
 More New Product News from this company:
Inspection System detects wafer edge defects.
Software facilitates analysis of HRXRD data.
X-Ray Metrology Tool measures thickness from 1 nm to 10 µm.
X-Ray Tool detects defects in semiconductor wafers.
More ....
 Other News from this company:
SEMATECH to Evaluate New Materials Using Bede X-ray Metrology System
Bede X-ray Metrology and IMEC Collaboration on Process Control of New Materials Used at 45nm Nodes and Below
More ....
 Tools for you
Watch Company 
Company web site
More news from this company
E-Mail Story
Save Story


Home  |  My ThomasNet News®  |  Industry Market Trends  |  Submit Release  |  Advertise  |  Contact News  |  About Us
Brought to you by Thomasnet.com        Browse ThomasNet Directory

Copyright © 2012 Thomas Publishing Company
Terms of Use - Privacy Policy



Error close

Please enter a valid email address