Micro-Metric, Inc.
San Jose, CA 95112
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Optical Measurement System uses image analysis algorithms.
Based on sound metrology principles, Innova provides point-to-point and field-of-view non-contact measurements of semiconductor, optoelectronic, and MEMS devices. It delivers FOV measurement down to 0.5 Ã-µm with measurement accuracy of 0.010 Ã-µm. Providing 200 x 200 mm XY stage travel, system has granite structural components and vibration isolation support stand for stability....
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Optical Measurement System uses image analysis algorithms.
Based on sound metrology principles, Innova provides point-to-point and field-of-view non-contact measurements of semiconductor, optoelectronic, and MEMS devices. It delivers FOV measurement down to 0.5 Ã-µm with measurement accuracy of 0.010 Ã-µm. Providing 200 x 200 mm XY stage travel, system has granite structural components and vibration isolation support stand for stability....
Read More »Micro-Metric Acquisition by View Engineering Signals Expanded Market Coverage
San Jose, California - October 12, 2005 -- Micro-Metric, Inc. announces that View Engineering of Simi Valley, CA, has acquired the assets of the company. The acquisition brings View's 30 years of resources and expertise to the already successful innovator in nanometrology. Micro-Metric produces accurate, high-magnification, non-contact critical dimension and coordinate metrology systems used in...
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