Wafer Probers

Reticle Inspection System monitors sub-20 nm design nodes.
Universal Process / Temperature Controllers

Reticle Inspection System monitors sub-20 nm design nodes.

With 193 nm illumination, Teron™ SL650 assesses incoming reticle quality, monitors degradation, and detects yield-critical reticle defects,Â- such as haze growth or contamination. System supports mix of reticle types by using STARlightSD™ and STARlightMD™ to produce defect capture and comprehensive inspection coverage on single- and multi-die reticles, respectively. Chipmakers can also...

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Press Preview for Seica SpA at Productronica, Munich, November 12 - 15th, 2013, Hall A1, Booth A1-445, New Munich Trade Fair
DC to AC Power Supplies (Inverters)

Press Preview for Seica SpA at Productronica, Munich, November 12 - 15th, 2013, Hall A1, Booth A1-445, New Munich Trade Fair

Strambino, ItalyÂ- – Welcome to the new dimension of test, the fourth dimension". As usual, Seica is back to the exhibition with a full range of ATE machines for every need, and a lot of innovative solutions for test and selective soldering, but this time the news are really raising the bar of technology over the top. The "new dimension" of test will be showcased through several different...

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ECT to Bring Compliant Connector Solutions to SMTAI 2013
Wafer Probers

ECT to Bring Compliant Connector Solutions to SMTAI 2013

Pomona, Calif. – Everett Charles Technologies' (ECT) today announced that it will exhibit in booth #436 at the upcoming SMTA International Exhibition, scheduled to take place October 15-16, 2013 at the Fort Worth Convention Center in Texas. Innovative solutions to be featured at the show will include: Tilt Universal Grid Prober – The tilt technology is the world's most advanced fixture...

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ECT to Offer Innovative Solutions at the IPC APEX EXPO
Electrical Connectors

ECT to Offer Innovative Solutions at the IPC APEX EXPO

Learn about Our Full Line of Electrical Test Products and Services Pomona, Calif.- Everett Charles Technologies' (ECT) today announced plans to exhibit in Booth #1913 at the upcoming IPC APEX EXPO, scheduled to take place February 19-21, 2013 at the San Diego Convention Center in California. Innovative solutions to be featured at the show include: Tilt Universal Grid Prober - The tilt technology...

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ECT FSG Debuts Tilt Universal Prober for NPI Testing
Wafer Probers

ECT FSG Debuts Tilt Universal Prober for NPI Testing

Pomona, Calif., - Everett Charles Technologies' (ECT) announces that its Fixture and Service Group (FSG) has released the new Tilt Tester, a faster NPI test with the lowest overall cost of test. The Tilt Tester features superior test and diagnostic capabilities, faster test times and improved fault coverage compared to flying probers. It is capable of testing printed circuit board assemblies up...

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Miscellaneous Software

Preview for the Print Media for Seica SpA for Productronica, Munich, November 15st - 18 th 2011, Hall A1, Booth 445, New Munich Trade Fair

Strambino, Italy - Seica, world leader in the design and manufacturing of electric test solutions for electronic boards and modules, dedicates a specific space to automation, presenting the Pilot V8 Flying Prober with automatic loader, the innovative in-circuit and functional line tester, Compact SL, and the model Top-bottom of Firefly Laser Selective Soldering. In addition, it will be possible...

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Miscellaneous Software

Boundary-Scan Boost for Huntron Robotic Probers

New system combines the benefits of flying probe and boundary-scan Eindhoven, The Netherlands. Huntron, Inc., a leader in PCB diagnosis and troubleshooting equipment for over 30 years, and JTAG Technologies, a tier one supplier of boundary-scan products world-wide, today announced the integration of their test methods within Huntron's range of prober enhanced analog signature analysis products....

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Aerial Flying Probers include thermal scan.
Electrical / Electronic Probes

Aerial Flying Probers include thermal scan.

Based on VIVA Integrated Platform core hardware and software, AERIAL Flying Probers include 2 Flying IC Thermal Detection Units positioned on each side of unit under test to detect thermal parameters of ICs under power. Purpose is to compare temperatures of known good boards to suspect boards and indict bad components in depot repair environment. Models range from 2-8 test probes, accessing...

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Dimensional Measurement & Inspection Probes

RF Production Probe Card utilizes membrane probe technology.

Designed to aid in high-volume wafer testing of RF filters and switches for mobile handsets, 20 GHz P30 Pyramid Probe card has scalable architecture and is sized to enable multi-site testing. Solution's lithographic probes alleviate uncontrolled impedance and Microscrub(TM) creates small scrub mark that minimizes material displacement. Applications include multi-die testing for RF wireless,...

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