Wafer Probers

Aerial Flying Probers include thermal scan.

Aerial Flying Probers include thermal scan.

Based on VIVA Integrated Platform core hardware and software, AERIAL Flying Probers include 2 Flying IC Thermal Detection Units positioned on each side of unit under test to detect thermal parameters of ICs under power. Purpose is to compare temperatures of known good boards to suspect boards and indict bad components in depot repair environment. Models range from 2-8 test probes, accessing...

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Flying Prober reduces test time.

Featuring drive technology via linear motors, Condor 500 includes Soft Landing tool and optional integrated boundary-scan. Comprehensive software facilitates test program development directly from CAD data and parts lists. Off-line simulation, panels, and different versions of PC-boards are supported. Test electronics allow in-circuit and functional test, opens check, memory test/and programming,...

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Robotic Probers target semiconductor test industry.

Robotic Probers target semiconductor test industry.

Robotic Probers provide method for validating and calibrating automatic test equipment. Robots attach directly to test head and probe specific pads on device interface board. On-board CPU commands probe tip to move along high-precision linear bearings using optically encoded stepper motors for accurate positioning.

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