Sensors Monitors & Transducers, Test & Measuring Instruments

Automatic Spectroscopic Ellipsometer operates at high speeds.

Sep 12, 2011

Equipped with automatic R-Theta stage, UNECS-3000A measures thickness and refractive index of transparent or semi-transparent thin film. Automatic mapping function can handle 300 mm dia wafer substrates, and non-contact instrument can measure 106 points on 300 mm dia wafer within 120 sec. Max measurement speed is 20 ms/point, and other features include automatic height adjustment, editable... Read More

Test & Measuring Instruments

Rudolph Technologies and Entrepix, Inc. Announce License Agreement

Dec 26, 2007

Entrepix to market Rudolph AutoEL Series Ellipsometer FLANDERS, NJ (November 27, 2007)-Rudolph Technologies, Flanders, New Jersey, and Entrepix, Inc., Tempe, Arizona, announced today that Rudolph has granted Entrepix an exclusive license to manufacture, sell, service and support the Rudolph AutoEL(TM)® series of thin-film ellipsometers. The AutoEL(TM)® was the first microprocessor-based... Read More

Laboratory and Research Supplies and Equipment, Test & Measuring Instruments

Metrology Tools measure thin transparent films.

Jul 10, 2006

Utilizing FOCUS(TM) beam ellipsometry, S3000(TM) (300 mm) and S2000(TM) (200 mm) measure transparent films throughout device fabrication process. Laser light sources are used for optimal accuracy, stability, spot size, and tool-to-tool matching. Also provided, optional deep UV and visible reflectometry capabilities offer flexibility in addressing various applications throughout fabrication. Built... Read More