Test & Measurement

Air Monitoring System provides FTIR gas analysis.

Air Monitoring System provides FTIR gas analysis.

Featuring sealed 0.5 cm-1 resolution interferometer with choice of beamsplitters and detectors, AM Air Monitoring System can detect, identify, and measure wide range of compounds simultaneously within seconds of startup. Analysis is onsite through continuous sampling path up to 1,000 m. Analyzer is coupled to control PC via ribbon cable or long range fiber optic link. For extended sample paths,...

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Liquid Flow Meters include onboard display.

Liquid Flow Meters include onboard display.

Wafer-style, Series RWL offers access to programmable software, 10-point linearization, and diagnostic tools through external keypad. Vortex meters are available as loop-powered devices with 4-20 mA output and fit pipe sizes from 1-3 in. They may be configured for 3-wire frequency pulse output as well. Utilizing ultrasonic sensing technology, Series RWL produces accurate flow measurements of most...

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Vision Appliance suits single camera applications.

Housed in DIN mountable enclosure, Model VA15 features remote small-format camera with 640 x 480 sensor resolution. State of each input and output is reflected by associated LED on front of unit. Pre-installed iNspect software is exposed through standard web browser on connecting network computer, providing connect-and-go capability. Appliance is equipped with Gigabit-compliant network connection...

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Zetasizer Nano Monitors UV Pearls for Skin Protection

Zetasizer Nano Monitors UV Pearls for Skin Protection

At nano engineering company Sol-Gel Technologies (Bet Shemesh, Israel), Malvern's Zetasizer Nano particle characterization system is proving to be an essential tool in the production of a unique product for encapsulating UV filters. The Zetasizer Nano is used to measure the particle size distribution of the company's UV Pearls product, both for process control and as part of the QC specifications...

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GE's New Advanced Diagnostics System Predicts Reciprocating Compressor Behavior

FLORENCE, ITALY - October 24, 2006 - GEnyus, an advanced diagnostics system developed by GE's Oil & Gas business, is bringing preventive medicine to the world of reciprocating compressors. Building on the experience of more than 6,000 GE reciprocating compressors installed worldwide, GEnyus employs advanced mathematical models (the same used to design new units) to predict the behavior of...

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HACH LANGE Samplers to Receive MCERTS Award at WWEM

HACH LANGE will be one of the first companies in the UK's water sector to receive an MCERTS Certificate. Commenting on this achievement, Product Manager for Sampling, Flow and Level, Ian Smith says Our range of stationary samplers are extremely popular because of their flexibility - a wide range of dosing heads helps to ensure that we are able to supply the best sampler for every application....

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Xilinx Demonstrates Low Power Solutions for Radio Modem and Cryptography at MILCOM 2006

What: Xilinx at (MILCOM) 2006 Where: Marriott Wardman Park Hotel Booth #519 Washington, D.C. When: October 23 - 25, 2006 SAN JOSE, Calif., Oct. 20 -- Xilinx, Inc. (NASDAQ:XLNX), the world's leading PLD provider today announced that it will showcase modem and crypto solutions designed to reduce the size, weight and power of military radios at the Military Communications (MILCOM) 2006 conference,...

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Tele Atlas Furthers Fleet Market Leadership with New Enhancements to Award-Winning Tele Atlas/Logistics Database

Announces New Partnership and Will Showcase Industry-Leading Partner Applications at American Trucking Association Management Conference LEBANON, N.H., Oct. 23 -- Tele Atlas (FSE: TA6, EUNV: TA), a leading global provider of digital maps and dynamic content for the fleet and logistics market, today announced new product features for its award-winning Tele Atlas/Logistics database to further...

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Memory Test System has parallel test capacity of 384 devices.

Model T5383 is designed for multipurpose memory devices like DRAM, SDRAM, and DDR SDRAM, as well as flash memory and package test of MCP and other devices. With maximum test speed of 286 MHz/572 Mbps in DDR mode, system also offers high speeds and high throughput on KGD and at-speed tests for DRAM wafers. Wafer motherboard incorporates docking mechanism which helps prevent probe card warpage.

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Memory Test System suits wafer/package level NAND testing.

With parallel test capacity of up to 512 devices, Model T5761 features ECC, real-time counter to calculate number of fail bits, and flash memory block management that allows skipping unneeded blocks without testing. Model T5761ES offers up to 16 devices test capacity and simplifies low-volume device evaluation and facilitates development of test programs for high-volume production. Models...

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