Profilers

Scanning Slit Laser Beam Profiler features USB2 interface.
Profilers

Scanning Slit Laser Beam Profiler features USB2 interface.

Using moving slits, NIST-calibrated NanoScan 2 measures continuous wave (CW) and pulsed beams across spectral range from UV to far IR. Beam size and beam pointing can be measured with 3 sigma precision of several hundred nanometers. While USB2 interface provides deep, 12-bit digitization of signal for dynamic range up to 35 dB power, digital controller improves accuracy and stability of...

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Profilers

Laser Beam Profiling System measures widths to 35 mm.

Along with 4008 x 2672 pixel format that allows profiling of beams up to 24 x 36 mm without requiring reduction optics, L11059 USB Large Format Beam Profiling Camera features 50 mm ND filters that provide max power density measurements to 15 mW/cmÂ-² without additional attenuation. Frame rates of up to 3.1 fps are supported at full resolution (up to 17 Hz in 4x4 binning mode). Featuring 59...

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Profilers

Laser Beam Profiling System measures quality in real-time.

Working with CW and pulsed lasers down to single shot rates, Photon M2-1780 automatically measures M2 beam propagation ratio and all associated ISO 11146 parameters instantaneously at video rates over 20 Hz. CCD camera-based system, sensitive to wavelengths from ~250–1,100 nm, automatically measures with NIST-traceable accuracy to better than 2%. This translates to M2 measurements with accuracy...

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G-S PLASTIC OPTICS Expands Metrology Capabilities with Bruker® Interferometric Optical Microscope
Miscellaneous Optics

G-S PLASTIC OPTICS Expands Metrology Capabilities with Bruker® Interferometric Optical Microscope

Rochester, NY - G-S PLASTIC OPTICS, a business unit of the Germanow-Simon Companies, is pleased to announce its acquisition of a Bruker® ContourGT®-K1 3D Interferometric Optical Microscope. This unique metrology system is optimized for characterizing the micro-structure of molded plastic optical elements, and the single point diamond-turned mold inserts that determine the surface...

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KIC to Highlight the ProBot Automatic Profiling System at the IPC APEX Expo
Material Handling Equipment

KIC to Highlight the ProBot Automatic Profiling System at the IPC APEX Expo

San Diego - KIC today announced that it will showcase the ProBot, a flexible, affordable and easy-to-use automatic profiling system in booth #1314 at the upcoming IPC APEX Expo, scheduled to take place February 19-21, 2013 at the San Diego Convention Center in California. The ProBot automatically verifies whether each PCB is processed to specification in the reflow oven. The suspect PCBs are...

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Bruker Wins Over $7 Million in SP9900+ 3D Optical Microscope Orders
Profilers

Bruker Wins Over $7 Million in SP9900+ 3D Optical Microscope Orders

Instrument Breaks the Throughput Barrier for HDI Substrate Metrology TUCSON, AZ - Bruker announced today that it has already received more than $7 million in orders for its new Bruker SP9900+ high-throughput high density interconnect (HDI) substrate metrology system, and has begun shipping the product in volume. The SP9900+ Large Format 3D Optical Microscope is specially designed for the...

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Thermal Profiler fosters use via streamlined features, GUI.
Profilers

Thermal Profiler fosters use via streamlined features, GUI.

AccommodatingÂ- companies looking to capture accurate thermal profile without additional capabilities to optimize process, KICstart2™ uses Process Window Index to measure quality of profile with one number. This data acquisition profiler automatically identifies location of each oven heating zone, minimizing if not eliminating measurement requirements. Tool also corrects for different...

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Propelec to Debut KIC's X5 Profiler at Matelec in Spain
Miscellaneous Analyzers

Propelec to Debut KIC's X5 Profiler at Matelec in Spain

San Diego - October 2012 - KIC announces that its distributor in Spain and Portugal, Propelec, will highlight its new X5 Profiler and KIC RPI in Pavilion 4 booth 4G01A and 4H01B at the upcoming Matelec Trade Fair, scheduled to take place October 23-26, 2012 in Madrid Spain. The X5 Profiler redefines what a data intelligence profiler can and should do. As opposed to data acquisition profilers that...

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Bruker Nano Surfaces Division Ships 100th DektakXT Stylus Profiler
Profilers

Bruker Nano Surfaces Division Ships 100th DektakXT Stylus Profiler

Growth in Asia Markets Aid Rapid Acceptance as Industry Standard for Thin Film Metrology Bruker Nano Surfaces Division (Tucson, AZ) has shipped 100 DektakXT(TM) Stylus Surface Profiling System since the product launched last April. The DektakXT features improved ease of use and the industry's best step height repeatability of better than 5 angstroms, 1 sigma. These and other performance...

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Parts Profiling Machine instantly reports accurate measurements.
Profilers

Parts Profiling Machine instantly reports accurate measurements.

Using edge detection and geometric recognition algorithms for automatic, real-time measurement, CoreX2 has 3.40 x 2.80 in. Field of View that accommodates parts up to 3 3/8 in. long x 2 Â-¾ in. dia. Accuracy is ±0.0002 in., and measurements are taken at rate of 6 times/sec in working with shadow (profile view) of part. As soon as user places part into OASIS, every measurement on part...

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