Profilers

Laser Beam Profiler allows users to adjust laser at will.
Profilers

Laser Beam Profiler allows users to adjust laser at will.

Designed to measure beam profile and power of pulsed industrial Nd:YAG and Diode industrial lasers, BA100 displays laser beam intensity profile in real time. Instrument makes measurements at full or near full power levels (1,000 W max) and is useful for looking at focal spots. Beam profile can be shown in 3D form and rotated to different angles and elevations. Unit handles pulse energies to 30...

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Profilers

Profiler offers programmable stylus profiling.

Dektak® 8 Advanced Development Profiler, with Low-Inertia Sensor 3 head, provides accurate characterization of MEMS, semiconductors, data storage devices, and other surfaces. It offers dual camera optics; 7.5 angstrom, 1 sigma step height repeatability; and vertical range of up to 1 mm. Overhead gantry allows for long scan roughness, planarity, and flatness measurements on samples up to 200...

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Laser Beam Profiler works with laptop or desktop PC.
Profilers

Laser Beam Profiler works with laptop or desktop PC.

Self-contained BeamStar FX 66 provides measures CW and Pulsed lasers using laptop or desktop personal computer. Connected to PC via one Firewire interface card, product offers software with manual or automatic gain and shutter control adjustments. Laser beam focal point, vertical and horizontal spectral profiles, and beam statistics are displayed on screen. It has aperture of 9.7 x 7.68 nm, 1280...

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Non-Contact 3D Surface Profiler has 0.1 angstrom resolution.
Profilers

Non-Contact 3D Surface Profiler has 0.1 angstrom resolution.

Talysurf CCI 3000 scanning broadband interferometer finds coherence peak position of interference pattern produced by selectable bandwidth light source. Surfaces with reflectivity of 0.3-100% can be measured with 0.1 angstrom resolution over 100 Â-µm gauge range. Machine offers 0.03 angstrom rms repeatability and 200 mm height adjustment in work envelope and collects 1,048,576 data points...

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Optical Profiler offers Dynamic MEMS measurement option.
Profilers

Optical Profiler offers Dynamic MEMS measurement option.

Wyko® NT1100 characterizes micro-devices in 3D as they actuate for assessment of true device functionality and measurement of in- and out-of-plane dimensions. System offers dynamic and static measurement of rough surfaces on one platform. Non-contact, white light interferometry provides Angstrom-resolution measurement of features from 0.1-2 mm in height. System includes custom illumination...

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Platform provides profiling for small-tunnel reflow ovens.
Profilers

Platform provides profiling for small-tunnel reflow ovens.

Side Rider(TM) carries M.O.L.E.® Profiler securely through beltless reflow ovens with tight tunnel tolerances. Available in 2 basic pan widths, 5.5 and 6.5 in., unit's slightly lowered nest holds profiler assembly just below level of oven chain, creating additional above-rail top clearance of .374 in. Platform can be used alone or with Outrigger expandable metal frame, with scissor action...

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Surface Profiler offers detailed surface characterization.
Profilers

Surface Profiler offers detailed surface characterization.

Dektak® 6M bench-top stylus surface profiler incorporates Low-Inertia Sensor 3 head to provide step height, surface roughness, and waviness measurements for samples up to 150 mm. Suitable for semiconductor, data storage, and industrial applications, it measures step heights on any surface with programmable stylus force down to 1 mg and Z-height capability to 1 mm. It also delivers...

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Optical Profiler takes surface measurements.
Profilers

Optical Profiler takes surface measurements.

Wyko(R) NT1100 takes surface measurements with Angstrom resolution and stitching automation for large area measurements. Non-contact interferometry is used for 3D surface measurements from 0.1 to 2 mm. Software provides data analysis, interactive displays, data filtering, and statistical database for production measurement. Applications include R&D, quality inspection, failure analysis and...

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Profiler utilizes Windows-based operating software.
Profilers

Profiler utilizes Windows-based operating software.

WinCamD 3-dimensional beam intensity profiler features 4.65 Â-µm square pixel size and 14-bit analog-to-digital converter that gives it greater than 16,000 levels of intensity resolution. WinCamD includes pass/fail settings for beam width, relative power, Gaussian and top hat fit, and data logging. It can be used for pulsed (as low as 1 Hz) or continuous-wave beams. Use of variable...

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