Nanotechnology Equipment

Keithley Plays Key Role in New IEEE Test Standards for Carbon Nanotubes

Cleveland, Ohio - March 7, 2006 - Keithley Instruments, Inc. (NYSE:KEI), a leader in solutions for emerging measurement needs, announces that its Model 4200 Semiconductor Characterization System conforms to and supports the just-released IEEE (Institute of Electrical and Electronic Engineers, Inc.) standard for electrical testing of carbon nanotubes. The recently approved IEEE 1650TM-2005...

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FEI's Automated 3D Crystallography Featured at PITTCON

FEI's EBS3 fully-automated electron backscattered diffraction solution delivers rapid serial sectioning and 3D crystal orientation reconstructions of materials HILLSBORO, Ore. /March 13, 2006--FEI Company (Nasdaq: FEIC) will feature its EBS3 DualBeam(TM) solution for rapid serial sectioning and 3D crystallographic reconstructions of materials at this week's Pittcon conference in Orlando. The...

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Nanotechnology System enables nanolithography.

Nanotechnology System enables nanolithography.

NanoMan(TM) combines Dimension Series platform SPM/AFMs with NanoScopeÂ-® IV SPM controller and Dimension CL Closed-Loop Scanner Head. It includes user interface and software for intuitive operation in moving objects at nanometer and molecular levels. NanoMan provides censored scanning for sub-micron scan sizes.

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