New Protocol Analyzer and Exerciser Supports JEDEC UFS 3.1, MIPI UniPro v1.8 and M-PHY v4.1 HS-G4
Features Trace Validation™ artificial intelligence (AI) tool that uses complex state machine logic to analyze traces algorithmically. Offers SmartTuneTM equalization and eye monitor that help optimize signal acquisition at the analyzer to ensure error-free M-PHY symbol capture. Users can execute any loop order by speed, link widths, LUNs or individual test cases.
Read More »
Latest Protocol Analyzer is Designed to Capture PCIe 5.0 and CXL Traffic
Capable of capturing full x16 link width traffic at 32GT/s for the analysis of high-performance devices and systems. Can capture large traces to determine the root cause of any error or quickly identify performance degradation on the bus. Features hierarchical view of recorded traffic, real-time statistics, protocol traffic summaries, and detailed error reports.
Read More »
New ICP-OES Analyzer Comes with ORCA Optical Technology
Features twin interface that automatically combines both axial and radial plasma views. Delivers ultra-reliable, accurate analyses of elements in challenging matrices. Ideal for routine elemental analyses in environmental and agronomy, consumer product safety, pharmaceutical, chemical/petrochemical, and food applications.
Read More »
New CSX2 Conductivity Analyzer Measures Conductivity Over Wide Range from 1.0 μS to 50 mS
Features built-in sensor temperature compensation that adjusts automatically over installed temperatures from 0>- 392>°F (0>-200>°C). Designed for service to 392°F (200°C) and 250 psig, or 212°F (100°C) and 400 psig. Ideal for industrial plants including petrochemical, pharmaceutical, electronics, food & beverage, semiconductor, and electric power generation.
Read More »
Peristaltic Pump Vs. i-FILL® Technology
Intellitech's advanced i-FILL® pumps are used by companies working in some of the world's most demanding sectors, delivering innovative, highly accurate and repeatable results, ensuring ultimate reliability and ease of use for all of our clients.
Read More »
New Summit Z516 Exerciser Simplifies Design Validation and Interoperability Stress Testing
Provides high performance 32 GT/s traffic generation on devices with link widths up to 16 lanes. Offers high-speed CPU-to-Device and CPU-to-Memory interconnect designed to accelerate next-generation data center performance. Enables PCIe 5.0 device testing by generating flits on the flex bus within the link and transaction layers and supporting traffic generation and device/host emulation at all...
Read More »
Latest Signal and Spectrum Analyzer Offers Higher Signal Quality and Sensitivity
Comes with R&S FSW-B8001 option and supports 8.3 GHz internal analysis bandwidth. Equipped with extended analysis bandwidth option and dedicated measurement applications for ultra wideband signal analysis across different industries. Covers input frequency range of up to 90 GHz and provides unmatched dynamic range and sensitivity, precision and EVM performance.
Read More »
Keysight's CX3300 Anomalous Waveform Analytics Contributes to Waseda University's Hardware Trojan Detection Research
Machine learning based analytics quickly detects security threats hidden in electronic circuits SANTA ROSA, Calif., September 1, 2020 - Keysight Technologies, Inc. (NYSE: KEYS), a leading technology company that helps enterprises, service providers and governments accelerate innovation to connect and secure the world, announced that Keysight's CX3300 Device Current Waveform Analyzer with...
Read More »
New SierraNet M648 Protocol Test System with Net Protocol Suite Software Version 4.30
Analyzes PAM4 traffic over QSFP-DD and QSFP-56, as well as SFP connections. Fully tests their network capabilities and identifies issues that inhibit network efficiencies. Offers extensive and deep Ethernet protocol analysis.
Read More »
New nProber IV Platform Offers Fast Identification of Defects
Provides specific localization and accurate electrical characterization of parametric faults in advanced FinFET transistors. Delivers good levels of automation and precision for semiconductor yield engineers as they perform leading-edge and mid-range logic and memory failure analysis. EBIRCH2 fault localization is combined with the LEEN2 SEM column that can operate at up to 100 nA.
Read More »
Latest Aura Identification System Able to Detect Lipids and Process-Specific Particles
Offers protein/non-protein identification using Fluorescence Membrane Microscopy (FMM). Can count, size, and image aggregates and particles in the subvisible range (>1 μm) with 5 µL and a linear range of over 3x106 particles/mL. Provides biologic stability analysis, enabling simple protein and non-protein aggregate identification in formulation development and analytical testing.
Read More »
Solder Redefined
Indium Corporation has developed a new twist on traditional solder by developing a composite with a reinforced matrix internal structure. The result is a solder with increased strength and reliability. Check out this video to learn more about the mechanics behind the groundbreaking technology.
Read More »
