Microscopes

Microscope Photometer supports cytophotometry applications.
Photometers

Microscope Photometer supports cytophotometry applications.

Designed for photometry of microscopic samples found in fields such as biology and geology, CRAIC MP-2(TM) measures reflectance, transmittance, or fluorescence photometric values. Solid state system includes sensitive detector with effective operating range from UV to visible and into NIR region. Digital imaging system simultaneously images sample and measurement aperture, while software controls...

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Instruments

Atomic Force Microscope serves life science research.

In addition to integrating atomic force (AFM), inverted light, and inverted confocal microscope capabilities, 6000ILM is available with incubator perfusion cell sample plate, advanced force-volume spectroscopy capabilities, and top-view video optics. PicoView software, also included, gives users range of AFM force-volume spectroscopy capabilities. PicoTREC toolkit enables in-liquid AFM imaging...

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Instruments

Atomic Force Microscope serves life science research.

In addition to integrating atomic force (AFM), inverted light, and inverted confocal microscope capabilities, 6000ILM is available with incubator perfusion cell sample plate, advanced force-volume spectroscopy capabilities, and top-view video optics. PicoView software, also included, gives users range of AFM force-volume spectroscopy capabilities. PicoTREC toolkit enables in-liquid AFM imaging...

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Olympus Helps to Increase Reliability and Accuracy in Optical Metrology
Microscopes

Olympus Helps to Increase Reliability and Accuracy in Optical Metrology

Hamburg, 08.11.2011 - The Olympus LEXT OLS4000 is being used for the development of good practice guidelines and new calibration standards in optical metrology. These reference standards are being developed by a team led by Professor Richard Leach, Principal Research Scientist at the National Physical Laboratory (NPL). Preliminary data, presented by Professor Leach at the 10th International...

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Olympus Helps to Increase Reliability and Accuracy in Optical Metrology
Microscopes

Olympus Helps to Increase Reliability and Accuracy in Optical Metrology

Hamburg, 08.11.2011 - The Olympus LEXT OLS4000 is being used for the development of good practice guidelines and new calibration standards in optical metrology. These reference standards are being developed by a team led by Professor Richard Leach, Principal Research Scientist at the National Physical Laboratory (NPL). Preliminary data, presented by Professor Leach at the 10th International...

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Microscopes

Optical Measurement Microscope withstands shop floor use.

Featuring 150 x 100 mm measuring stage, Kestrel Elite provides 2-axis non-contact measurement at sub 10 microns, suitable for measuring 2D features of small, intricate parts. Optical clarity allows detailed visual inspection to be performed simultaneously. With software options, microscope can be utilized with microprocessor or PC Tablet incorporating touchscreen technology and part view...

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Microscopes

Optical Measurement Microscope withstands shop floor use.

Featuring 150 x 100 mm measuring stage, Kestrel Elite provides 2-axis non-contact measurement at sub 10 microns, suitable for measuring 2D features of small, intricate parts. Optical clarity allows detailed visual inspection to be performed simultaneously. With software options, microscope can be utilized with microprocessor or PC Tablet incorporating touchscreen technology and part view...

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Microscopes

Applied Precision Announces the 25th Installation of Its DeltaVision OMX Super-Resolution Microscope at McGill University

ISSAQUAH, Wash. - Applied Precision is proud to announce the 25th installation of its DeltaVision OMX(TM) three-dimensional super-resolution microscopy system at McGill University in Montreal, Canada. The OMX is a super-resolution microscope utilizing proven three-dimensional structured illumination (3D SIM) technology providing an eight-fold improvement in volume resolution and outstanding...

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Microscopes

Applied Precision Announces the 25th Installation of Its DeltaVision OMX Super-Resolution Microscope at McGill University

ISSAQUAH, Wash. - Applied Precision is proud to announce the 25th installation of its DeltaVision OMX(TM) three-dimensional super-resolution microscopy system at McGill University in Montreal, Canada. The OMX is a super-resolution microscope utilizing proven three-dimensional structured illumination (3D SIM) technology providing an eight-fold improvement in volume resolution and outstanding...

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Magnetic Field Module is used with atomic force microscopes.
Permanent Magnets

Magnetic Field Module is used with atomic force microscopes.

Designed to attach to MFP-3D Atomic Force Microscopes (AFMs), Variable Field Module2 (VFM2(TM)) applies continuously adjustable magnetic fields parallel to sample plane approaching one Tesla with one Gauss resolution. Adjustable pole tips allow choice between max required field, sample placement, and min field gradients; field intensity is software controllable; and integrated Gaussmeter provides...

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