Microscopes

Carl Zeiss Microscopy Receives Fifth Consecutive R&D 100 Award
Microscopes

Carl Zeiss Microscopy Receives Fifth Consecutive R&D 100 Award

LSM 5 DUO - the Laser Scanning Microscope Awarded the Oscar of Inventions" Morris Plains/NJ/USA, Jena/Germany, 07/20/2006. With its LSM 5 DUO Laser Scanning Microscope, Carl Zeiss Microscopy is once again one of the winners of the much-coveted R&D 100 Award. This is the fifth time in a row that Carl Zeiss Microscopy has received this award, three for the LSM 5 family alone. The LSM 5 DUO system -...

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Olympus Micro-Imaging Announces Comprehensive Lines of Measuring and Inspection Imaging Systems
Microscopes

Olympus Micro-Imaging Announces Comprehensive Lines of Measuring and Inspection Imaging Systems

Orangeburg, NY MEMs, nanotechnology, device miniaturization, and advanced materials research have all contributed to the urgent, growing need for precise microscopic measurement. To meet the challenge, Olympus Micro-Imaging is announcing a series of new measurement and inspection microscopes and imaging systems featuring the broadest spectrum of illumination, from conventional white light and...

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Microscope is available with 20x objective lens.
Microscopes

Microscope is available with 20x objective lens.

Mantis Elite® is designed to promote user comfort with eyepieceless technology, which provides freedom of head movement and ability to wear glasses or contact lenses. Optimal color rendition and working distance are optimized for deburring and micro welding. Able to be used with optics up to 20x, product is suited for detailed inspection and can view defects as fine as hairline cracks.

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Micro-Imaging System uses laser confocal technology.
Microscopes

Micro-Imaging System uses laser confocal technology.

Suited for applications requiring precise measurements and observation, OLS3000 LEXT System fills gap between optical microscopes and scanning electron microscopes. It offers sub-micron imaging with 0.12 Â-µm and 0.01 µm Z resolution and 3D measurement capability. Requiring no sample preparation or vacuum pumpdown, system provides magnification from 120-14,400x. Confocal laser DIC...

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Microscopes

Imago LEAP 3000X Wins 2006 R&D 100 Award

Madison, WI - (August 6, 2006) -Imago® Scientific Instruments Corp. announced today that its LEAP 3000X(TM) atom probe microscope is a recipient of the prestigious R&D100 award for 2006. A panel of industry experts appointed by Research and Development magazine announced the LEAP® system's award ...as one of the 100 most technologically significant products introduced into the...

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FIB/SEM System offers nanoscale imaging and analysis.

Helios NanoLab(TM) DualBeam(TM) features ultra-high resolution field emission scanning electron microscope (SEM) column combined with Sidewinder(TM) focused ion beam (FIB) column and gas chemistries to provide imaging resolution and contrast in DualBeam system. Small DualBeam platform enables 3D characterization, analysis, and image reconstruction applications, nano-prototyping (fabrication and...

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Microscopes

Hyphenated Systems and Stanford Microfluidics Laboratory Announce Joint Development Project

Hyphenated Systems' 3Dmap to Provide Sub-Surface 3D Structure Characterization and Flow Analysis of Advanced Microfluidic Devices Burlingame, CA, August 14, 2006-Hyphenated Systems, a world-wide provider of hybrid microscopy solutions for three-dimensional (3D) imaging and metrology in micro- and nanotechnology, announced today a joint development project (JDP) with the Stanford Microfluidics...

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Carl Zeiss Microscopy Receives Fifth Consecutive R&D 100 Award
Microscopes

Carl Zeiss Microscopy Receives Fifth Consecutive R&D 100 Award

Morris Plains/NJ/USA, Jena/Germany, 07/20/2006. With its LSM 5 DUO Laser Scanning Microscope, Carl Zeiss Microscopy is once again one of the winners of the much-coveted R&D 100 Award. This is the fifth time in a row that Carl Zeiss Microscopy has received this award, three for the LSM 5 family alone. The LSM 5 DUO system - a new combination of the LSM 510 META and LSM 5 LIVE confocal laser...

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Atomic Force Microscope uses nanoindenter module.
Microscopes

Atomic Force Microscope uses nanoindenter module.

Available in Standard and Low Force models, NanoIndenter fits on MFP-3D AFM System head for viewing of sample, and drives nanoindenting tip perpendicular to sample. Tip displacement and force are measured with microscope's optical detector and NPS(TM) Nanopositioning sensors, allowing repeatable imaging, quantitative feature measurement, accurate imaging offsets, quantitative force curves, and...

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Microscopes

FEI's Titan(TM) S/Tem Achieves Low KV Milestone

1.4 Angstrom Resolution Marks Important Breakthrough for Atomic-Scale Imaging of Light Element Nanomaterials HILLSBORO, Ore, July 31, 2006 --- FEI Company (Nasdaq: FEIC) today announced that scientists at its NanoPort(TM) in Europe have broken another image resolution barrier with the world's most advanced commercially-available microscope, the Titan(TM) 80-300 corrected S/TEM. For the first time...

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