Microscopes

Vision and Imaging Sensors / Detectors

Direct Electron Detector handles beam-sensitive materials.

Designed for Titan(TM) and Tecnai(TM) transmission electron microscopes, Falcon(TM) Direct Electron Detector enables acquisition of low-noise images of delicate biological samples and other beam-sensitive materials that require low electron dose interactions to prevent radiation damage of material. Offering 4 K x 4 K resolution, detector allows life scientists to see biologically significant...

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Electron Microscope targets semiconductor manufacturing.
Microscopes

Electron Microscope targets semiconductor manufacturing.

Suited for high-volume industrial and multi-user research laboratories, 200 kV Tecnai Osiris(TM) scanning/transmission electron microscope features ChemiSTEM technology, which minimizes time required for large field-of-view energy dispersive x-ray elemental mapping. Microscope also includes MultiLoader(TM) sample handling to minimize thermal equilibration time after sample exchanges, FS-1...

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VanGuard Laboratory Microscopes Improved for Enhanced Imaging and Versatility
Laboratory Equipment

VanGuard Laboratory Microscopes Improved for Enhanced Imaging and Versatility

VanGuard Laboratory Microscopes Improved for Enhanced Imaging and Versatility Kirkland, WA, July 16, 2009 - VEE GEE Scientific, manufacturers of VanGuard Microscopes, announces improvements to its VanGuard 1400 series laboratory microscopes. The upgraded clinical microscopes now feature infinity-corrected optics, high-eyepoint eyepieces with a larger viewing field, integrated Koehler...

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System characterizes surface morphology at nanoscale.
Interferometers

System characterizes surface morphology at nanoscale.

Suited for surface measurement and analysis, Model AFP-200 includes atomic force microscope, which permits atomic scale resolution over fields of view from 10's of nanometers to 80 microns in X and Y. System's interferometer operates like traditional optical microscope with nanometer resolution in Z over fields of view from 100 x 100 microns to 2.0 x 2.0 mm. Stylus profilometer can operate in...

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Microscopy System analyzes full wafers up to 300 mm.
Inspection Equipment

Microscopy System analyzes full wafers up to 300 mm.

Helios 1200 Full Wafer DualBeam(TM) System accelerates time to data for failure analysis, process development, and process control in semiconductor and data storage manufacturing. System combines scanning electron microscope image resolution and fast switching between imaging and ion beam milling to deliver cross-sectional analysis of structures and defects. Included iFAST automation software...

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Measuring Equipment

Measuring Microscope accommodates multi-user, shop-floor use.

Falcon 3-axis non-contact video measuring system employs high resolution indexed zoom optics with up to 100x magnification to provide enhanced component edge definition. Indexed camera iris control is used to reduce depth of field, promoting accuracy and repeatability of Z-axis results. Other features include touchscreen color display, controllable quadrant LED illumination, and precision stages...

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Microscopes

London's Natural History Museum Chooses Asylum Research MFP-3D(TM) AFM

June 22, 2009 (Santa Barbara, CA) Asylum Research and the Natural History Museum of London announced today that the Museum's Mineralogy Department has acquired Asylum's MFP-3D Stand Alone Atomic Force Microscope (AFM) to expand on their range of research tools to study nanomaterials. The focus of the research, led by Dr. Eva Valsami-Jones, is the evaluation of the fundamental physical and...

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Microscopes

UC Santa Barbara and Imago Team to Create 3D, Atomic-Resolution Microscopy Facility Targeted at Electronic and Photonic Semiconductor Materials and High-Performance Structural Materials

More than 15 UCSB research groups will be utilizing Imago's LEAP 3000X HR Atom Probe Microscope. Madison, WI, United States - Imago Scientific Instruments announced today that UC Santa Barbara has placed in service an Imago LEAP 3000X HR Atom Probe Microscope. The high-spatial-resolution, three-dimensional imaging and analyses provided by the atom probe will be utilized by researchers in the...

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AFMs come with modulated local thermal analysis option.
Microscopes

AFMs come with modulated local thermal analysis option.

MFP-3D(TM) and Cypher(TM) AFMs feature Ztherm option, which provides localized heating with sensitivity to less than or equal to 10-22 L materials property changes. Ztherm package can also be used to evaluate contact stiffness and dissipation as function of temperature with advanced techniques such Dual AC Resonance Tracking (DART). Integrated piezo actuation allows high resolution AC imaging of...

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Microscope performs high-speed magnified video capture.
Microscopes

Microscope performs high-speed magnified video capture.

Recording at speeds up to 24,000 fps, VW-6000 Series Motion Analysis Microscope tracks moving objects to quantify speed, acceleration, distance, and angle, which enables accurate filming of failures in moving targets. Controller supports color and monochrome cameras, and footage can be edited and analyzed directly on controller. All-in-one unit features built-in light source, LCD monitor, and...

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