Microscopes

University of Manchester Installs New Ultra-Powerful Microscope from FEI
Microscopes

University of Manchester Installs New Ultra-Powerful Microscope from FEI

The first of its kind in the UK, the Titan G2 80-200 S/TEM is capable of imaging the microstructure of materials at the atomic-scale. Manchester, UK and Hillsboro, Ore.- The University of Manchester and FEI (NASDAQ: FEIC) are pleased to announce the installation of one of the world's most powerful high-resolution microscopes-the Titan(TM) G2 80-200 scanning transmission electron microscope...

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FIB/SEM Systems support TEM sample preparation.
Inspection Equipment

FIB/SEM Systems support TEM sample preparation.

Respectively accommodating up to 100 mm samples and full 300 mm wafers, Helios NanoLab(TM) 450HP and 1200HP DualBeam(TM) systems meet requirements for semiconductor process development at 28 nm device geometry node and below. Systems can prepare 15 nm thick samples with less than 2 nm damage layer in 90 min. QuickFlip grid holders facilitate inverted sample preparation, and iFast(TM) automation...

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Imaging Equipment

Caliber Imaging & Diagnostics Releases New Products for Noninvasive, Rapid Imaging of Living Cells

ROCHESTER, N.Y.- Caliber Imaging & Diagnostics, formerly Lucid, Inc. (OTC Bulletin Board: LCDX), the leader in Rapid Cell Imaging and Diagnostics technology, today announced the release of two next-generation products in its FDA-cleared VivaScope® family. The new VivaScope 1500 and VivaScope 3000 produce high-quality images of living cells at the point of care. VivaScope imagers enable...

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AFM Module supports organic photovoltaics research.
Microscopes

AFM Module supports organic photovoltaics research.

Available for Dimension Icon® platform, Photoconductive Atomic Force Microscopy Module enables sample illumination while performing nanoscale electrical characterization. In conjunction with PeakForce TUNA(TM) technology, module enables high resolution photoconductivity and correlated nanomechanical mapping for research on fragile OLED and OVP samples. It is fully compatible with 1 ppm...

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Atomic Force Microscopes incorporate KPFM mode.
Microscopes

Atomic Force Microscopes incorporate KPFM mode.

Dimension Icon® and MultiMode® 8 atomic force microscopes (AFMs) are available with PeakForce Kelvin Probe Force Microscopy (KPFM) mode, which utilizes frequency-modulation detection to provide high spatial resolution Kelvin probe data. Building on PeakForce Tapping(TM) technology, solution provides directly correlated quantitative nanomechanical data to improve sensitivity of...

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HD Imaging Microscope achieves resolutions down to 1 nm.
Microscopes

HD Imaging Microscope achieves resolutions down to 1 nm.

With its electronics, detectors, and chamber design, SIGMA HD Field Emission Scanning Electron Microscope (FE-SEM) accelerates imaging and facilitates sample navigation for nanoscale analytics. High vacuum and variable pressure modes of operation are available, and 5-axis eucentric stage aids sample navigation using translational and tilted movement. Also included, diametrically opposite chamber...

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Scanning Electron Microscopes come in 3 configurable models.
Microscopes

Scanning Electron Microscopes come in 3 configurable models.

Featuring plug-and-play design, MERLIN Compact, MERLIN VP Compact, and MERLIN allow users to add and change detectors to handle tasks ranging from simple image capture to extensive material analysis. Frame store of 32 k x 24 k pixels allows imaging of very large areas. In addition to in-situ 3D surface reconstruction and calculation of 3D data from 2D data, FE-SEMs include in-lens Duo detector...

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Microscopes

Portable Digital Microscope comes with measurement software.

Integrating color 2.7 in. TFT LCD screen and 4 ultra white LEDs, VT300 can be used for real-time observation and recording. Scale is shown on display, and zoom options include 10x and 42x (optical) as well as smart zoom (digital); max magnification is 196x. Images/video can be saved to built-in 2G memory, and scale value changes with magnification size. Also included, software for PC covers...

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Atomic Force Microscope captures biological dynamics.
Microscopes

Atomic Force Microscope captures biological dynamics.

Utilizing XYZ high-speed scanner that delivers low drift and low noise, Dimension FastScan Bio(TM) AFM allows temporal investigation under physiological operating environments in fluid while exceeding diffraction limits of optical microscopy. Unit features automated laser and detector alignment as well as capability to investigate samples in droplet of solution or 60 Â-µL sample cell. User...

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Scanning Electron Microscope offers sub-nanometer resolution.
Microscopes

Scanning Electron Microscope offers sub-nanometer resolution.

Verios(TM) XHR SEM provides resolution and contrast needed for precise measurements on beam-sensitive materials in semiconductor manufacturing and materials science applications. When combined with IC3D(TM) software, instrument can provide measurements needed to control processes at 22 nm technology node and below. User can switch between operating conditions, maintain sample cleanliness, and...

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