Metrology Equipment

More Leading Semiconductor Players Selecting Jordan Valley's JVX7300LMI Metrology Tool for 14nm & 10nm Process Development and Ramp-up

MIGDAL HAEMEK, Israel- – Jordan Valley Semiconductors [http://www.jordanvalley.com] Ltd., a leading supplier of X-ray based metrology tools for advanced semiconductor manufacturing lines, today announced that it has received another order for its recently introduced JVX7300LMI scanning X-ray in-line metrology tool for patterned and blanket wafers. The system has been purchased for advanced...

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Defect Inspection System handles wafers up to 300 mm.

Defect Inspection System handles wafers up to 300 mm.

Designed for semiconductor, MEMS, and LED facilities, NSX® 220 Automated Macro Defect Inspection System uses gray-scale image analysis with color image capture for inspection and metrology in final manufacturing applications. It can detect scratches, mechanical damage, foreign materials, voids, and probe damage, while also performing 2D measurements on bumps, probe marks, and edge trim...

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3D Imaging System supports non-contact surface metrology.

Suited for both production and scientific research markets, Nexview™ Profiler supports non-contact metrology of- samples and surfaces ranging from very smooth to very rough. System provides sub-nanometer vertical resolution at all magnifications, and will safely measure fragile and transparent materials without altering test surface. Acting as interface for system control and data analysis,...

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Optical Measuring System delivers micron level accuracy.

Optical Measuring System delivers micron level accuracy.

Offering fully automatic optical measuring system for dimensional testing of turned parts, MarShaft™ Scope Plus includes MarWin®-based controller and EasyShaft® operating software. Optional ProfessionalShaft™ software provides high-level script programming that allows virtually unlimited customizing capability. Error limit for measuring length and diameter with system is 2+L/125 -µm. With...

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Mahr Federal To Feature Redesigned MarShaft(TM) Scope Plus At Quality Expo

Mahr Federal To Feature Redesigned MarShaft(TM) Scope Plus At Quality Expo

PROVIDENCE, RI – Mahr Federal will be featuring the new, totally redesigned version of its MarShaft™ Scope, its high-precision, fully automatic optical measuring system for dimensional testing of turned parts at Quality Expo, September 10-12, 2013, McCormick Place Lakeside, Chicago, IL, Booth #409. The new MarShaft Scope Plus is now twice as accurate as previous -- and competitive -- models....

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Optical Shaft Measuring System offers micron level measurements.

Optical Shaft Measuring System offers micron level measurements.

Designed for dimensional testing of turned parts, fully automatic MarShaft™ Scope Plus features MarWin®-based controller and touchscreen with intelligent multi-touch gestures built in. Error limit for measuring length is 2+L/125 -µm, and for diameter, error limit is 1+L/125 -µm. With Basic EasyShaft software, multi-feature measurement routines can be constructed without programming...

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Metrology CT System offers magnification up to 200x.

Metrology CT System offers magnification up to 200x.

Based on actively cooled, 225 kV micro-focus X-ray source, MCT225 HA supports- range of sample sizes and material densities with 3.8+ L/50 -µm MPEl accuracy in accordance with VDI/VDE 2630 guideline. System features manipulator guideways equipped with high-resolution optical encoders. Guideways are error corrected using laser interferometer mapping techniques. To minimize thermal effects,...

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Thin Film Metrology System targets 28 nm node and below.

Thin Film Metrology System targets 28 nm node and below.

Available for transparent films in advanced semiconductor fabrication applications, S3000SX™ System uses focused beam ellipsometry and small site measurement optics to measure thickness of single- and multi-layer films on product wafers, including device area at site sizes as small as 30 x 30 -µm. Available metrology options include deep UV (190 nm) reflectometry, wafer stress and bow...

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Gleason Metrology Systems to Demonstrate Improved Measurement Capabilities at Control Show May 14-17

Gleason Metrology Systems to Demonstrate Improved Measurement Capabilities at Control Show May 14-17

Ludwigsburg – Gleason Metrology Systems will demonstrate their latest advances in gear measurement technology at Control 2013, May 14-17 in Stuttgart, Germany.-  Among the new technologies exhibited in our booth will be: Surface roughness measurement.-  Users of the Gleason GMS® series of Analytical Gear Inspection systems now have a fast, easy and effective way to perform a wide range of...

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Brunson Instrument Company Highlights Motorized Vertical Tooling Bar at Control Show in Germany

Brunson Instrument Company Highlights Motorized Vertical Tooling Bar at Control Show in Germany

Metrology Users Can View MVTB and Target Holder Kits at Brunson Stand/Booth 5306 in Hall 5 Kansas City, MO – Brunson Instrument Company, a leading provider of metrology stands and accessories, today announced they will feature a large-scale motorized vertical tooling bar (MVTB) with a new small footprint design at the Control Show, an international trade fair for quality assurance, from May 14...

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