Metrology Equipment

Phasics Presents New Laser Characterization Tools at Photonics West in January (Z199)

PHASICS manufactures high-resolution wavefront sensors and associated devices and software for laser characterization and optical metrology. The company will present KaleoMatic, a new solution for automated and precise optics characterization at Photonics West 2010 in San Francisco, from Jan. 26 to 28, on the French Pavilion at booth 1823. Within a few seconds, most of the optics parameters...

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Robotic Metrology Cell promotes measurement productivity.

Robotic Metrology Cell promotes measurement productivity.

Suited for CMMs as well as for CNC-driven metrology instruments, robotic tending solution delivers automated loading and unloading, with repeatability of ± 20 -µm, to streamline end-to-end manufacturing. Sensitive collision detection enables dexterous picking of delicate parts and precise fitting to instrument fixturing, while force-sensitive grippers enable precise, intelligent parts...

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LED Wafer Inspector optimizes throughput and accuracy.

Featuring automated optical inspection capabilities, ICOS® WI-2250 fosters transition to larger LED and MEMS wafer sizes for manufacturers. It allows for defect inspection of whole and diced wafers up to 200 mm, with macro inspection sensitivity in pre- and post-dice inspection of high-brightness LEDs and MEMS wafers. Rule-based binning lends to real-time defect classification, advanced...

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Portable Optical Multimeter also provides laser source.

Designed to carry out absolute and relative power tests as well as optical loss tests, Model 801 is suited for use in optical telecommunication, CATV, and labs. Unit supports multi-wavelength precision measurement and automatic bi-directional tests. It includes backlit display, low voltage warning, automatic power off, and memory capacity of 50 data items. Laser source operates at dual...

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Metrology Tool provides composition and thickness measurement.

Consisting of atmospheric in-line x-ray fluorescence metrology tool platform, System SMX-ILH provides composition and thickness measurements for thin film solar PV metal film stacks on flexible roll to roll substrates such as stainless steel, aluminum, and polyimide or rigid substrates such as float glass. Remote SMX-ILH models are designed to measure in one static location or across gradient....

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Machine offers automatic form and roughness measurement.

Machine offers automatic form and roughness measurement.

Featuring dual-tip scanning system and ±1,500 -µm measuring stroke, Hommel-Etamic Roundscan permits automatic measurement of form and roughness in one pass. System can handle parts up to 540 mm dia, 900 mm in height, and up to 100 kg. Positioning probe tip anywhere on workpiece, CNC-controlled rotation and tilt module guarantees measurements can be made automatically at any measurement...

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Metrology System improves fab productivity.

Metrology System improves fab productivity.

Built on Vanguard-II automation platform, S3000S(TM) is suited for in-line process control of advanced diffusion and fab-wide thin film applications. Optical design enables simultaneous measurement with multi-wavelength, multi-angle Focus Beam Ellipsometry and deep ultraviolet reflectometry, minimizing measurement time and optimizing throughput. Optional MAControl(TM) module enables one-step,...

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Metrology System is suited for inspection of washed panels.

Employing dark field optics that detect defects smaller than an optical pixel, NxtGen(TM)-Wash performs all functions 100% on-line and in real-time. It detects float glass defects, edge chips/cracks, and broken corners/flairs as well as TCO coating defects and washer residue. System also measures panel width, length, and squareness as well as thickness and warp. Supporting range of optical...

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Dimensional Metrology System has telecentric optical design.

Dimensional Metrology System has telecentric optical design.

Based on scanning white-light interferometry capable of 20 Nm resolution over vertical depth of up to 70 mm, TMS-100 can measure surfaces as large as 37 x 28 mm in single shot with lateral details as small as 36 -µm. It has protective housing with slight positive pressure against dust penetration, and includes actively regulated environmental vibration isolation table. Software and stages for...

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