Metrology Equipment

Convection Reflow Emulation is offered for warpage metrology.

Available as optional module to Akrometrix AXP shadow moirÃ-© system, Convection Reflow Emulation Module (CRE6) lets user mirror thermal environment ofÂ- reflow oven while conducting warpage metrology.Â- Users of CRE6 are able to measure warpage on substrates up to 70 mm dia with sub-micron z-resolution inÂ- convection reflow environment. Heating rates up to 5Â-

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3D Laser Scanner targets shop floor applications.

Efficient on black, multicolored, and shiny surfaces, MetraSCAN 3D helps manufacturers address potential quality control issues at any stage of production cycle, regardless of part complexity and material. System provides 480,000 measurements/second and volumetric accuracy of 0.0025 in. Thanks to TRUaccuracy, MetraSCAN 3D’s optical-based data acquisition process delivers measurement accuracy...

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Evaluation Electronics export data into Excel.

Evaluation Electronics export data into Excel.

Using QUADRA-CHEK Wedge v2.9, users can export data into Excel format from QUADRA-CHEK Evaluation Electronics. Program provides full Windows compatibility, macro-enabled worksheets, and support for Excel 2010 and 2013. Ability to save Excel files to network folders or any other specified folder with QCWedge streamlines process of data acquisition by allowing customers to connect QUADRA-CHEK...

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Exact Metrology Installs New CT Scanner

Will enable measurement to 2 microns, even on denser parts Exact Metrology, based in Cincinnati, Ohio, has acquired a new Metrology Grade GE Phoenix v|tome|x m, a CT scanner system with dual tube technology, nanofocus to 180Kv and microfocus to 240Kv, significantly expanding the company's capability in 3DÂ- scanning to 2 microns with sufficient power to measure denser parts.Â-  Exact...

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5 Questions to Ask When Choosing a Custom Glass Manufacturer
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5 Questions to Ask When Choosing a Custom Glass Manufacturer

Due to the inherent complexity of glass fabrication, many professionals seeking glass services know exactly what kind of part is needed, but are unclear on the intricacies of the actual manufacturing process. PEG's exclusive guide is designed to help professionals navigate the custom glass manufacturing process with valuable information.

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Wafer X-Ray Metrology System offers high-throughput automation.

Wafer X-Ray Metrology System offers high-throughput automation.

Able to be used as integral part of fabrication and packaging of integrated circuits or as part of QC and product acceptance, XM8000 provides automated, high-throughput X-ray metrology and defect review system for both optically hidden and visible features of TSVs, 2.5D and 3D IC packages, MEMS, and wafer bumps. Non-destructive, in-line wafer measurement covers voiding and fill levels, overlay,...

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Measurement System utilizes blue light technology.

Measurement System utilizes blue light technology.

Designed to capture 3D measurements of components on shop floor, WLS qFLASH creates reports and digitizes acquired data for analysis or direct CAD comparison. Non-contact, stereo vision system is enclosed in solid carbon fiber optical housing, and employs blue LED high power illumination. Using 3 cameras for triangulation, 3D point cloud is reconstructed. Combined with 2D image analysis and...

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3D White Light Measurement Systems come in manual and automated models.

3D White Light Measurement Systems come in manual and automated models.

Cognitens WLS400 3D white light measurement systems are offered as model WLS400M portable, manual system or as Cognitens WLS400A automated system that can be operated with all common industrial robots. Both products use digital stereo vision technology to generate accurate 3D surface data, which is captured in less than 10 msec. Suited for use in vibration-prone shop floor environments, units...

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KLA-Tencor(TM) and TEL Announce New SpectraShape(TM) Dimensional Metrology Systems With AcuShape(TM)2 Next-Generation Modeling Capability

For Characterization and Production Monitoring of Geometrically Complex Structures of High-Performance Integrated Circuits MILPITAS, Calif. - Today KLA-Tencor Corporation(TM) (Nasdaq: KLAC) announced the SpectraShape(TM) 8660 and 8810 dimensional metrology systems, featuring AcuShape(TM)2 modeling software developed jointly with Tokyo Electron Limited (TEL). The new SpectraShape tools are able to...

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Reflectivity Measurement System aids lens manufacturing.

Designed for use with lenses, prisms, flat glass, plastics, and electronic components, Model USPM-RU III provides repeatable reflectivity measurements for wavelengths ranging from 380-780 nm. Spectral reflectivity measurement system optimizes quality control by providing accurate measurements without need for backside coating. Object color can be measured based on spectrophotometric colorimetry...

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