Instruments

Rudolph's MetaPULSE System Selected for Advanced Packaging R&D

Dynamic growth in advanced packaging arena drives need for critical process characterization technologies Flanders, New Jersey - Rudolph Technologies, Inc. (NASDAQ: RTEC), a leading provider of inspection, metrology and process control software for semiconductor manufacturing, announced today that a premier global industry research center in Asia has purchased Rudolph's MetaPULSEÂ-® G...

Overlay Metrology System supports multi-patterning techniques.

Designed to address complex overlay challenges associated with single- and multi-patterning lithography techniques at advanced sub-28 nm design nodes, Archer(TM) 500 accurately measures and characterizes overlay error. Measurement speed and precision enable thorough overlay characterization on wafers after patterning to help verify that pattern features have been correctly aligned to...

Overlay Metrology System supports multi-patterning techniques.

Designed to address complex overlay challenges associated with single- and multi-patterning lithography techniques at advanced sub-28 nm design nodes, Archer(TM) 500 accurately measures and characterizes overlay error. Measurement speed and precision enable thorough overlay characterization on wafers after patterning to help verify that pattern features have been correctly aligned to...

Thin Films Analysis Systems cover deep UV to NIR measurement.

Utilizing spectroscopic reflectometry, NanoCalc systems determine optical thin film thicknesses for semiconductor/medical/industrial applications. Systems are available for range of wavelength, sampling method, and optical layer thickness requirements, from 1.0 nm to 250 -µm. There are 4 standard models from 200-1,700 nm which may be combined with software, reflection probes, optical fibers, and...

Common Misconceptions About Custom Automation Systems

This guide will help you understand the capabilities of automation systems.

Thin Films Analysis Systems cover deep UV to NIR measurement.

Utilizing spectroscopic reflectometry, NanoCalc systems determine optical thin film thicknesses for semiconductor/medical/industrial applications. Systems are available for range of wavelength, sampling method, and optical layer thickness requirements, from 1.0 nm to 250 Â-µm. There are 4 standard models from 200-1,700 nm which may be combined with software, reflection probes, optical fibers,...

DRONFIELD, ENGLAND - The new NIR Borescope (NIR-b) from Land Instruments (www.landinst.com) is a specially designed, short wavelength radiometric infrared imaging camera with the ability to capture high-definition (656 x 494 pixel) thermal images along with accurate temperature measurement by viewing directly inside the furnace, using borescope technology. The rugged thermal camera can measure...

DRONFIELD, ENGLAND - The new NIR Borescope (NIR-b) from Land Instruments (www.landinst.com) is a specially designed, short wavelength radiometric infrared imaging camera with the ability to capture high-definition (656 x 494 pixel) thermal images along with accurate temperature measurement by viewing directly inside the furnace, using borescope technology. The rugged thermal camera can measure...

University of Arkansas Employs Talysurf Profiler to Develop Next Generation of Photovoltaic Cells

Talysurf CCI LIte Optical Profiler Brings Industry-Leading Performance To Non-Contact 3D Measurement of High-Efficiency Solar Cells FAYETEVILLE, AR- Researchers at the University of Arkansas at Fayetteville are utilizing the Talysurf CCI Lite optical 3D profiler from AMETEK Taylor Hobson to measure next-generation photovoltaic cells made from lower-cost materials that offer substantially improved...

University of Arkansas Employs Talysurf Profiler to Develop Next Generation of Photovoltaic Cells

Talysurf CCI LIte Optical Profiler Brings Industry-Leading Performance To Non-Contact 3D Measurement of High-Efficiency Solar Cells FAYETEVILLE, AR- Researchers at the University of Arkansas at Fayetteville are utilizing the Talysurf CCI Lite optical 3D profiler from AMETEK Taylor Hobson to measure next-generation photovoltaic cells made from lower-cost materials that offer substantially improved...

Vaisala Signs a Contract for Weather Radars and Airport Weather Observation Systems

Vaisala and the local system integrator have signed a contract to deliver weather radars and airport weather observation systems to Saudi Arabia. The value of the deal is EUR 6.9 million. The award renews Vaisala's role as a provider of weather observation systems to the Saudi Arabian meteorological service. According to the contract, Vaisala will deliver dual-polarized C-band weather radars, low...

Fresh Air Intake Designed to Meet ASHRAE 62.2 standards

Alan Manufacturing has a long history of developing innovative solutions for HVAC applications. With over 1,000 product designs under our belt, we have gained a reputation as the go-to source for HVAC dampers, hardware, duct supports, zone control systems, and much more. Adding to this extensive list of achievements we now announce the release of our new line of Fresh Air Intake products. Designed to meet ASHRAE 62.2 standards, they are the most robust and high-performance product of their kind. See our video to learn more.