Instruments

Electromagnetic Field (EMF) Sensors / Detectors / Transducer

Vaisala Offers Most Precise Lightning Location Data in North America

Vaisala has added its latest patented Total Lightning Processor(TM) (TLP(TM)) location algorithm to the North American Lightning Detection Network (NALDN)Â-®, which includes the National Lightning Detection Network (NLDN)® and the Canadian Lightning Detection Network (CLDN). The NALDN® will now be able to identify the site of a lightning strike within a range of 200 meters. This...

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Spectrometers

Ametek SPECTRO Partners with SII Nanotechnology to Market ICP-OES and ICP-MS Instruments in Japan

Strategic Alliance Joins Two Leaders in ICP-OES and ICP-MS Instruments KLEVE, GERMANY - SPECTRO Analytical Instruments GmbH has formed a strategic marketing alliance with SII NanoTechnology, Inc. to market SPECTRO's inductively coupled plasma optical emission (ICP-OES) and mass spectrometers (ICP-MS) in Japan. We are very excited about our alliance with SII NanoTechnology," notes Manfred Bergsch,...

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Spectrometers

Ametek SPECTRO Partners with SII Nanotechnology to Market ICP-OES and ICP-MS Instruments in Japan

Strategic Alliance Joins Two Leaders in ICP-OES and ICP-MS Instruments KLEVE, GERMANY - SPECTRO Analytical Instruments GmbH has formed a strategic marketing alliance with SII NanoTechnology, Inc. to market SPECTRO's inductively coupled plasma optical emission (ICP-OES) and mass spectrometers (ICP-MS) in Japan. We are very excited about our alliance with SII NanoTechnology," notes Manfred Bergsch,...

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Mahr Federal to Feature MarForm MMQ 200 Surface Roughness Measurement Option at Design & Manufacturing South
Height Gages

Mahr Federal to Feature MarForm MMQ 200 Surface Roughness Measurement Option at Design & Manufacturing South

PROVIDENCE, RI -- Mahr Federal will be featuring the new option package for their well-known MarForm MMQ 200 Formtester at Design & Manufacturing South, March 16-17, 2011, at the Orange County Convention Center, Orlando, FL. Mahr Federal will occupy booth #1021. The new option package for the MarForm MMQ 200 Formtester provides the measurement of surface finish parameters according to accepted...

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A Guide to Quality Control of the SMT Process
Sponsored

A Guide to Quality Control of the SMT Process

The printed circuit board (PCB) manufacturing process begins with cutting-edge equipment capable of accurately picking and placing up to 40,000 components per hour. This innovative equipment keeps error rates extremely low, and those defects that do occur are quickly caught by sensitive laser and optical inspection equipment.

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Mahr Federal to Feature MarForm MMQ 200 Surface Roughness Measurement Option at Design & Manufacturing South
Height Gages

Mahr Federal to Feature MarForm MMQ 200 Surface Roughness Measurement Option at Design & Manufacturing South

PROVIDENCE, RI -- Mahr Federal will be featuring the new option package for their well-known MarForm MMQ 200 Formtester at Design & Manufacturing South, March 16-17, 2011, at the Orange County Convention Center, Orlando, FL. Mahr Federal will occupy booth #1021. The new option package for the MarForm MMQ 200 Formtester provides the measurement of surface finish parameters according to accepted...

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Metrology Equipment

Metrology Tool handles patterned wafers down to 30 x 30 µm.

Targeted for front-end process control of 22 nm technology nodes and beyond, Model EX-300 utilizes LEXES Low-energy Electron induced X-ray Emission Spectrometry for addressing challenges in elemental composition, thickness determination, and dopant dosimetry. Instrument handles challenging High K Metal Gate, epitaxial layers such as Boron in Silicon Germanium and shallow implants, fulfilling...

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Metrology Equipment

Metrology Tool handles patterned wafers down to 30 x 30 -µm.

Targeted for front-end process control of 22 nm technology nodes and beyond, Model EX-300 utilizes LEXES Low-energy Electron induced X-ray Emission Spectrometry for addressing challenges in elemental composition, thickness determination, and dopant dosimetry. Instrument handles challenging High K Metal Gate, epitaxial layers such as Boron in Silicon Germanium and shallow implants, fulfilling...

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Handheld Analytical Meter incorporates data analysis software.
Miscellaneous Meters

Handheld Analytical Meter incorporates data analysis software.

Able to collect data from range of sensor types, LabNavigator(TM) lets users input methods or instructions for reference, analyze data, review protocols, and record notes in voice or typed format. It supports concurrent use of up to 6 sensors, and included NavPilot-© II data analysis software enables direct-to-PC file transfer via USB cable to facilitate LIMS integration. Files residing on...

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Handheld Analytical Meter incorporates data analysis software.
Miscellaneous Meters

Handheld Analytical Meter incorporates data analysis software.

Able to collect data from range of sensor types, LabNavigator(TM) lets users input methods or instructions for reference, analyze data, review protocols, and record notes in voice or typed format. It supports concurrent use of up to 6 sensors, and included NavPilotÂ-© II data analysis software enables direct-to-PC file transfer via USB cable to facilitate LIMS integration. Files residing...

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Miscellaneous Analyzers

Multi-Function High Performance PCM Channel Analyzer

Toronto, Canada - GAO Instruments (www.GAOInstruments.com) is offering a compact PCM channel analyzer designed to measure PCM devices, digital switches, carrier wave communication devices and VoIP devices as well as PCM voice encoding/decoding performance characteristics. The analyzer also measures return loss, longitudinal conversion loss and longitudinal conversion transfer loss. As it...

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