Inspection Equipment

Bosch Presents Enhanced Inspection Portfolio
Flaw Sensors / Detectors

Bosch Presents Enhanced Inspection Portfolio

Making efficient use of existing synergies Eisai Machinery: visual inspection from manual to fully automated New computer-linked inspection device ETAC Easy View Bosch KLD 1043: gentle and user-friendly high-voltage inspection at up to 36,000 items per hour At Achema 2012 in Frankfurt/Main, Germany, Bosch Packaging Technology underlines the substantial expansion of its inspection technology...

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Measuring Equipment

EBTEC Achieves General Electric Air Flow Approval

One of Only Three Vendors Approved by General Electric for Airflow Testing per Specification E50TF217 Agawam, Ma - EBTEC Corporation has announced it has been recently approved by General Electric for Airflow Testing per Specification E50TF217. EBTEC joins only three other high energy beam service providers with this successful approval to the GE Airflow Specification - E50TF217. Manufacturing...

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Inspection Equipment

Visit Pharmapack North America, May 22-23, 2012

Non-Destructive Inspection Technologies for Blister Packaging and CCIT in PTI's Booth F729 Attend Conference Session on Six Sigma Deployment for Complete Package Quality Control Tuckahoe, New York (May 4, 2012) - Oliver Stauffer of PTI Inspection Systems will give a presentation on Six Sigma Deployment for Complete Package Quality Control" during the upcoming Pharmapack North American Conference...

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CyberOptics to Discuss Tool Qualification Capabilities of WaferSense® Airborne Particle Sensor at Semicon West 2012
Counters

CyberOptics to Discuss Tool Qualification Capabilities of WaferSense® Airborne Particle Sensor at Semicon West 2012

CyberOptics Semiconductor (www.CyberOpticsSemi.com) will discuss the tool qualification features of its WaferSense® Airborne Particle Sensor (APS) as it is used to measure the presence and density of airborne particles inside fab tools during Semicon West 2012 in Booth No. 2406. CyberOptics will also display its complete WaferSense family of wireless metrology devices including the Auto...

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New X-Plane(TM) Technology from Nordson DAGE Earns a 2012 Innovation Award During NEPCON China
Inspection Equipment

New X-Plane(TM) Technology from Nordson DAGE Earns a 2012 Innovation Award During NEPCON China

Aylesbury, Buckinghamshire, UK - Nordson DAGE, a division of Nordson Corporation (NASDAQ: NDSN), announces that it has been awarded a 2012 EM Asia Innovation Award in the category of Test & Measurement/Inspection Systems -AXI for its new X-Plane(TM) Analysis -Sub Micron X-Ray Inspection System Option. The award was presented to the company during an April 26, 2012 ceremony in Shanghai during...

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Mirtec Receives Prestigious EM Asia Innovation Award for Its Technologicaly Advanced MV-9 3D AOI Series
Inspection Equipment

Mirtec Receives Prestigious EM Asia Innovation Award for Its Technologicaly Advanced MV-9 3D AOI Series

OXFORD, CT - MIRTEC, The Global Leader in Inspection Technology", announces that it has been awarded the 2012 EM Asia Innovation Award in the category of Test & Measurement / Inspection Systems - AOI for its revolutionary MV-9 3D AOI Series. The award was presented to the company during an April 26, 2012 ceremony in Shanghai during NEPCON China 2012. Established in 2006, the EM Asia Innovation...

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SEHO Receives a 2012 Innovation Award for Its New AOI Feature for Selective Soldering During NEPCON China
Inspection Equipment

SEHO Receives a 2012 Innovation Award for Its New AOI Feature for Selective Soldering During NEPCON China

KREUZWERTHEIM, GERMANY - SEHO Systems GmbH, a worldwide leading manufacturer of automated soldering systems and customer-specific solutions, announces that it has been awarded a 2012 EM Asia Innovation Award in the category of Soldering Systems -Auxiliary for the new AOI function for its best-selling selective soldering system - the SEHO PowerSelective. The award was presented to the company...

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Juki's High-Speed Sentry Hits Triple Crown with EM Asia Innovation Award
Inspection Equipment

Juki's High-Speed Sentry Hits Triple Crown with EM Asia Innovation Award

MORRISVILLE, NC - Juki Automation Systems, a world-leading provider of automated assembly products and systems and part of Juki Corporation, announces that it has been awarded a 2012 EM Asia Innovation Award in the category of Pick-and-Place Systems - High-Speed for its Sentry System. The award was presented to the company during an April 26, 2012 ceremony in Shanghai during NEPCON China....

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Flying Probe Test System features double-sided design.
Inspection Equipment

Flying Probe Test System features double-sided design.

With 4 probes on top and 4 additional probes on bottom, Model A7Cf performs up to 140 measurements/sec or up to 8,400 measurements/min, depending on product under test and test method. Universal shuttle system offers clamp and tension mode for testing flexible and rigid boards. Featuring 20 x 24 in. test area, platform can inspect pad sizes down to 2 mil and pitches down to 4 mil. Equipped with...

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Next-Generation Rework Capabilities - OK International's Scorpion Honored by the EM Asia Innovation Awards
Inspection Equipment

Next-Generation Rework Capabilities - OK International's Scorpion Honored by the EM Asia Innovation Awards

GARDEN GROVE, CA - OK International today announced that it has been awarded a 2012 EM Asia Innovation Award in the category of Repair/Rework Equipment for its Scorpion Rework System. The award was presented to the company during an April 26, 2012 ceremony in Shanghai during NEPCON China. OK International's new modular Metcal Scorpion Rework System allows for simultaneous viewing of Printed...

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