Inspection Equipment

Christopher Associates to Exhibit the MAGNUS HD TREND at the Del Mar Show
Inspection Equipment

Christopher Associates to Exhibit the MAGNUS HD TREND at the Del Mar Show

SANTA ANA, CA - Christopher Associates Inc. today announced that it will highlight the Tagarno MAGNUS HD TREND in Booth #346 at the upcoming Del Mar Electronics & Design Show (DMEDS), scheduled to take place May 2-3, 2012 at the Del Mar Fairgrounds in San Diego, CA. With magnification from 4-322X, HD imaging and superior ergonomics, the MAGNUS HD TREND can be used in numerous operations and...

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ViTrox Technologies to Showcase Its Leading AOI & AXI Solutions at NEPCON China 2012
Miscellaneous Software

ViTrox Technologies to Showcase Its Leading AOI & AXI Solutions at NEPCON China 2012

PENANG, MALAYSIA - ViTrox Technologies, a world leading provider of innovative, advanced and cost-effective automated vision inspection system and equipment for the semiconductor and electronics packaging industries, announces that it will showcase its leading AOI and AXI solutions in booth 1G88 at the upcoming NEPCON China 2012. The event is scheduled to take place April 25-27, 2012 at the...

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ViTrox Technologies to Showcase Its Leading AOI & AXI Solutions at NEPCON China 2012
Miscellaneous Software

ViTrox Technologies to Showcase Its Leading AOI & AXI Solutions at NEPCON China 2012

PENANG, MALAYSIA - ViTrox Technologies, a world leading provider of innovative, advanced and cost-effective automated vision inspection system and equipment for the semiconductor and electronics packaging industries, announces that it will showcase its leading AOI and AXI solutions in booth 1G88 at the upcoming NEPCON China 2012. The event is scheduled to take place April 25-27, 2012 at the...

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Inspection Equipment

Nondestructive Inspection System uses microwave technology.

Combining microwave imagery with computerized data processing, Dentro LRX reveals physical parameters and defects in materials in real-time. Contact-free linear camera allows for both internal and external product analysis. Technology is completely safe for environment and eliminates any health risk to operators. Resistant to water, dust, vibration, and variations in temperature, Dentro LRX can...

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Inspection Equipment

Nondestructive Inspection System uses microwave technology.

Combining microwave imagery with computerized data processing, Dentro LRX reveals physical parameters and defects in materials in real-time. Contact-free linear camera allows for both internal and external product analysis. Technology is completely safe for environment and eliminates any health risk to operators. Resistant to water, dust, vibration, and variations in temperature, Dentro LRX can...

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Inspection Grade 3D Scanning System is accurate to within 25 microns.
3D Scanners

Inspection Grade 3D Scanning System is accurate to within 25 microns.

SURVEYOR Auto Gage 3D scanning system provides 3D inspection-grade system with accuracy to 25 microns. It uses structured light projection technology from one scanner head to capture viewable surfaces of small- to medium-sized objects. With work envelope of 6 x 6 x 4 in. or 10 x 10 x 5 in., system is designed for inspection and reverse engineering applications and factory-floor verification uses....

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Inspection Grade 3D Scanning System is accurate to within 25 microns.
3D Scanners

Inspection Grade 3D Scanning System is accurate to within 25 microns.

SURVEYOR Auto Gage 3D scanning system provides 3D inspection-grade system with accuracy to 25 microns. It uses structured light projection technology from one scanner head to capture viewable surfaces of small- to medium-sized objects. With work envelope of 6 x 6 x 4 in. or 10 x 10 x 5 in., system is designed for inspection and reverse engineering applications and factory-floor verification uses....

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Fascinating Images Reveal Climbing Abilities of Geckos and Spiders
Inspection Equipment

Fascinating Images Reveal Climbing Abilities of Geckos and Spiders

Helium ion technology allows imaging of objects in their natural state Thornwood, N.Y.: Scientists from Lewis and Clark College, working collaboratively with the Joint School of Nanoscience and Nanoengineering (JSNN) in the USA have examined the fascinating climbing skills of geckos and spiders using the ORION helium ion microscope from Carl Zeiss. High resolution images displaying unique...

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3-D Solder Paste Inspection with Process Uplink Function: More Than Just Defect Detection
Inspection Equipment

3-D Solder Paste Inspection with Process Uplink Function: More Than Just Defect Detection

Hanover - SMT 2012, Hall/Stand 7-211 - In SMT electronic assembly production, 3-D SPI has established itself as the additional inspection gate to complement optical or X-ray inspection. The key task is detecting impermissible printed pads in terms of volume, form, smearing and offset. In addition to providing defect detection, the Viscom 3-D SPI can accomplish much more. The SPI-AOI-Uplink...

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Fascinating Images Reveal Climbing Abilities of Geckos and Spiders
Inspection Equipment

Fascinating Images Reveal Climbing Abilities of Geckos and Spiders

Helium ion technology allows imaging of objects in their natural state Thornwood, N.Y.: Scientists from Lewis and Clark College, working collaboratively with the Joint School of Nanoscience and Nanoengineering (JSNN) in the USA have examined the fascinating climbing skills of geckos and spiders using the ORION helium ion microscope from Carl Zeiss. High resolution images displaying unique...

Read More »

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