Flaw Sensors / Detectors

Phased Array Flaw Detector features 10.4 in. touchscreen.
Flaw Sensors / Detectors

Phased Array Flaw Detector features 10.4 in. touchscreen.

With optimized data storage capacity and transfer rate, OmniScan MX2 provides inspection capabilities for manual and automated phased array applications. Integral 10.4 in. LCD touchscreen facilitates navigation, text input, and parameter setup, while SD card and USB interfaces provide connectivity. Fully compatible with phased array modules already in field, modular instrument comes with all...

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Renishaw Wins Fourteenth Queen's Award for Laser-based Tool Recognition System
Flaw Sensors / Detectors

Renishaw Wins Fourteenth Queen's Award for Laser-based Tool Recognition System

Renishaw plc, a global engineering technologies company, is pleased to announce that it has received a Queen's Award for Enterprise 2011 in the Innovations category, the company's fourteenth Queen's Award since its formation in 1973, and its fifth in just eight years. This Award has been granted for the development of the highly innovative TRS2 laser-based non-contact broken tool detection system...

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Flaw Sensors / Detectors

Avago Technologies Selects Automated Inspection and Metrology Solution from Rudolph for Advanced Optoelectronic Devices

NSX inspection systems play key role in Avago's efforts to enhance process yields Flanders, New Jersey -Rudolph Technologies, Inc. (NASDAQ: RTEC), a leading provider of process characterization equipment and software for wafer fabs and advanced packaging facilities, announces orders for its NSX® Series from Avago Technologies Manufacturing (Singapore) Pte. Ltd. Avago will use the NSX System...

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Flaw Sensors / Detectors

Rudolph Technologies Expands into LED Market

Leading HB-LED manufacturers worldwide add inspection systems and software to improve process yields and reduce manufacturing costs FLANDERS, NJ - Rudolph Technologies, Inc. (NASDAQ: RTEC), a leading provider of process characterization equipment and software that is designed to improve yield for the microelectronics and solar manufacturing industries, announced today that it has expanded into...

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Flaw Sensors / Detectors

Altatech Semiconductor Receives Order for AltaSight® 300-mm Wafer Inspection System from Soitec's SOI Substrate Facility in Singapore

AltaSight to Perform 360-Degree Wafer Inspection in High-Volume Production MONTBONNOT, France -- Altatech Semiconductor S.A. has received an order for its AltaSight® 300 full-wafer inspection system from Soitec (Euronext Paris), the world's leading supplier of silicon-on-insulator (SOI) and advanced solutions for the electronics and energy industries. Capable of detecting and classifying...

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Konya Seker Maximizes Potato Strip Quality and Yield with ADR®First Solution
Flaw Sensors / Detectors

Konya Seker Maximizes Potato Strip Quality and Yield with ADR®First Solution

Konya Seker, the innovative Turkish processor, decided to try something different on their potato strip production line. Unlike other potato processors that use optical sorters to remove defects on their primary lines, Konya Seker relies on an ADR®5 Automatic Defect Removal System from Key Technology. This new application, called the ADR®First solution, maximizes product quality and...

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Flaw Sensors / Detectors

McBain to Show New Near-Infrared Inspection Systems and Wafer Handling Systems at Semicon West

SIMI VALLEY, Calif., -- McBain Systems of Simi Valley announced that it will be exhibiting at the Semicon West show in San Francisco later this month. McBain will show its recently introduced near-infrared (NIR) defect detection and review (DDR) stations as well as its automated wafer handling systems. McBain's DDR300 NIR system, http://www.mcbainsystems.com/McBainNearInfraredDefect.php, which is...

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Inspection System provides semi-automated corrosion mapping.
Flaw Sensors / Detectors

Inspection System provides semi-automated corrosion mapping.

Comprised of OmniScan MX PA flaw detector, OmniScan MXU software with corrosion mapping, and HydroFORM Phased Array Probe Carrier with Mini-Wheel encoder, HydroFORM System provides non-destructive testing of metal plates, pipes, and welded components for detection of internal corrosion, mid-wall anomalies, and environmentally damage mechanisms. Phased array probes cover area up to 2.36 in. wide...

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Flaw Sensors / Detectors

Defect Detection System targets flexible thin film PV cells.

Intended for QC use by manufacturers of flexible thin film photovoltaic (PV) cells, TFI-FLEX detects defects in surface quality and chemical deposition at multiple points along production line. Visual checks on activated side of flexible thin film cell look for defects specific to quality issues arising from handling and manufacture. Operating in color/monochrome mode, inspection system detects...

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