Flaw Sensors / Detectors

Yestech-Europe at Productronica: New Technology, Expanded Support and Fresh Opportunities
Flaw Sensors / Detectors

Yestech-Europe at Productronica: New Technology, Expanded Support and Fresh Opportunities

Productronica was particularly eventful and successful for Yestech-Europe this year. Having recently strengthened their presence in Germany with full local sales and support, they used the show to unveil significant new products for both AXI and AOI inspection. This clearly visible demonstration of new technology and enhanced support was rewarded throughout Productronica by a greatly increased...

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Corrosion Monitoring Tool targets downhole environments.
Flaw Sensors / Detectors

Corrosion Monitoring Tool targets downhole environments.

Constructed of corrosion-resistant 17-4 PH SS, DCMS(TM) uses Corrosometer® electrical resistance corrosion probe element to determine rate of metal loss within downhole tubing. Tubular electronic instrument automatically reads and records corrosion probe at regular user-defined intervals. Upon retrieval of Downhole tool, corrosion rate history is downloaded to PC via Corrdata® II...

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Flaw Sensors / Detectors

Rudolph Receives First Orders for 450 mm Defect Inspection and Thin Film Metrology Systems

Multiple systems will be used to provide performance feedback and qualification data for development of new processes Flanders, New Jersey - Rudolph Technologies, Inc. (NASDAQ: RTEC), a leading provider of process characterization equipment and software for the semiconductor, solar and LED industries, announced today it has received the first orders for its leading-edge defect inspection and...

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Flaw Sensors / Detectors

Surface Defect Detection System targets steel plate industry.

Model MSC90000 addresses technical requirements of steel plate industry related to coil center lines, including slitter and shear lines. Line sensor cameras repeatedly shoot different rows in accordance with movement of line using pulse generator signals to create images. In addition to automatic illuminance tuning, system offers automatic mask setting function, which determines area to be...

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Flaw Sensors / Detectors

JPSA to Collaborate with University of Delaware, and MIT for SunShot Initiative

Manchester, New Hampshire, USA - J. P. Sercel Associates (JPSA) announces they are partnering with SunShot Initiative F-PACE awardee University of Delaware (UD), along with Massachusetts Institute of Technology (MIT). The F-PACE award is sponsored by the Department of Energy's (DOE) SunShot Initiative program, with a goal of lowering the cost of crystalline silicon solar cells to $0.50/Wp module...

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Flaw Sensors / Detectors

Wafer Defect Review System is designed for 20 nm node.

Suitable for chip manufacturing at 20 nm device nodes and below, eDR(TM)-7000 electron-beam (e-beam) wafer defect review system addresses defect imaging and classification challenges at leading edge or located at bottom of deep trench/hole. System can drive directly to site of defect at high resolution, enabling review of multiple defects per second. Features include stage and vibration-isolation...

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Wafer Inspection System incorporates deep UV illumination.
Flaw Sensors / Detectors

Wafer Inspection System incorporates deep UV illumination.

Leveraging DUV wavelength, special apertures, and multiple illumination and collection channels, Surfscan SP3 addresses stringent 28 nm node requirements for defect detection and classification on blanket films at production speeds. System helps manufacture substrates for 28 nm devices and below that are nearly atomically smooth and free from polish marks, crystalline pits, terracing, voids, or...

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NVision Now Offering Product Defect Analysis
Flaw Sensors / Detectors

NVision Now Offering Product Defect Analysis

NVision, Inc.'s Engineering Service Division is now offering product defect analysis, which can potentially be introduced in product liability litigation to prove a manufacturer innocent of producing a defective or harmful product. The company has partnered with Materials Analysis, a Dallas-based engineering firm specializing in litigation support, to provide this service. Each year, thousands of...

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Automated Macro Defect Inspection System suits TSV processes.
Flaw Sensors / Detectors

Automated Macro Defect Inspection System suits TSV processes.

Designed for packaging processes that use through silicon vias (TSV) to connect multiple die in one package, NSX® 320 provides inspection capabilities for edge trimming metrology, wafer alignment during bonding processes, sawn wafers on film frames, and other processes. Incorporated XSoft(TM) system software capabilities include high-speed staging and on-the-fly image capture as well as...

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Flaw Sensors / Detectors

Defect Analysis System is suited for PV cell manufacturers.

FabVision(TM) Solar utilizes ICOS® PVI-6 data through range of analysis and monitoring features, captures wafer/cell images and data from PVI-6, and allows navigation that simplifies image review. Users can review in-line data at any point, and reports are generated automatically with optical inspection measurement results from multiple inspection modules across multiple manufacturing...

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