Electrical / Electronic Probes

Mixed Domain Oscilloscope combines up to 6 Instruments in 1.

Providing- synchronized view of analog and digital waveforms along with RF spectrum traces, MDO4000C Series expands core oscilloscope functionality with spectrum analyzer, arbitrary/function generator, logic analyzer, and protocol analyzer options. Complementary digital voltmeter is offered with product registration. Suited as debug tool for IoT and other embedded engineering applications,...

Mixed Domain Oscilloscope combines up to 6 Instruments in 1.

ProvidingÂ- synchronized view of analog and digital waveforms along with RF spectrum traces, MDO4000C Series expands core oscilloscope functionality with spectrum analyzer, arbitrary/function generator, logic analyzer, and protocol analyzer options. Complementary digital voltmeter is offered with product registration. Suited as debug tool for IoT and other embedded engineering...

Products Help Engineers Test Electronic Devices Under Extreme Hot and Cold Conditions Highlights: · Extreme-temperature probing solutions offer bandwidths up to 400 MHz · Probes can withstand temperatures ranging from -40 degrees to +85 degrees Celsius SANTA ROSA, Calif. – Keysight Technologies, Inc. (NYSE: KEYS) today introduced two extreme-temperature probing solutions, the N7007A...

Products Help Engineers Test Electronic Devices Under Extreme Hot and Cold Conditions Highlights: -· Extreme-temperature probing solutions offer bandwidths up to 400 MHz · Probes can withstand temperatures ranging from -40 degrees to +85 degrees Celsius SANTA ROSA, Calif. – Keysight Technologies, Inc. (NYSE: KEYS) today introduced two extreme-temperature probing solutions, the N7007A...

Advantages of Thermoset Plastics vs. Engineered Thermoplastics and Metal Parts

Thermosets and engineered thermoplastics are sometimes better suited to differing situations, but they do have some overlap in relevant use cases.

High Voltage Oscilloscope Probes support inputs up to 39 kV.

Elditest high voltage divider probes are designed for use with both digital and analog oscilloscopes. Respectively, models CT4024, CT2982B, CT4025, CT4026, and CT4028 feature max input voltage ratings of 8, 10, 10, 18, and 39- kV and 40, 40, 120, 150, and 220 MHz bandwidth.

High Voltage Oscilloscope Probes support inputs up to 39 kV.

Elditest high voltage divider probes are designed for use with both digital and analog oscilloscopes. Respectively, models CT4024, CT2982B, CT4025, CT4026, and CT4028 feature max input voltage ratings of 8, 10, 10, 18, and 39Â- kV and 40, 40, 120, 150, and 220 MHz bandwidth.

Oscilloscopes and Probes offer low-noise M-PHY test solution.

When used with DPO70000SX or MSO/DPO70000DX oscilloscopes and P7600 Series TriMode™ probes, Option M-PHY TX Automated offers low-noise test solution for MIPI-® M-PHY® 3.1 specification and Conformance Test Suite 3.1. Solution supports M-PHY High Speed Gears 1, 2, and 3 as well as PWM Mode and SYS Mode. Option is capable of testing transmitters running in high-speed mode with sensitivity of...

Oscilloscopes and Probes offer low-noise M-PHY test solution.

When used with DPO70000SX or MSO/DPO70000DX oscilloscopes and P7600 Series TriMode™ probes, Option M-PHY TX Automated offers low-noise test solution for MIPIÂ-® M-PHY® 3.1 specification and Conformance Test Suite 3.1. Solution supports M-PHY High Speed Gears 1, 2, and 3 as well as PWM Mode and SYS Mode. Option is capable of testing transmitters running in high-speed mode with...

Semiconductor Test Probe meets HED device testing challenges.

With 5.0 mm test height that provides- total compression window of 0.8 mm and insertion loss of 18 GHz @ -1 dB (GSG), ZIP™ semiconductor test probe model Z-080YHJ targets high-lead count BGAs and LGAs and meets challenges associated with testing High End Digital (HED) devices. DUT side plunger, which is made from HyperCore™ homogenous alloy, features sharp, dual tip geometry for...

Semiconductor Test Probe meets HED device testing challenges.

With 5.0 mm test height that providesÂ- total compression window of 0.8 mm and insertion loss of 18 GHz @ -1 dB (GSG), ZIP™ semiconductor test probe model Z-080YHJ targets high-lead count BGAs and LGAs and meets challenges associated with testing High End Digital (HED) devices. DUT side plunger, which is made from HyperCore™ homogenous alloy, features sharp, dual tip...

ISO-Certified Precision Machining and Contract Manufacturing Services from DFF

DFF is an industry leading contract manufacturer specializing in medium to high production precision machined components and electromechanical assemblies. Our 100 CNC machining centers and design-assist capabilities ensure our customers' needs are always met. Check out our video to learn more.