Electrical / Electronic Probes

Seika Goes to the SMTA Carolinas Expo & Tech Forum
Electrical / Electronic Probes

Seika Goes to the SMTA Carolinas Expo & Tech Forum

TORRANCE, CAÂ- — Seika Machinery, Inc., a leading provider of advanced machinery, materials and engineering services, announces that it will attend the SMTA Carolinas Expo Tech Forum, scheduled to take place Thursday, January 23, 2014 at the Double Tree Raleigh Brownstone - University in Raleigh, NC. Seika will highlight the new HIOKI 1240 Flying Probe Tester and proven McDry...

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Handheld Current Probes operate up to 1.5 MHz.
Electrical / Electronic Probes

Handheld Current Probes operate up to 1.5 MHz.

Comprising 4 models, ELDITEST CP6000 SeriesÂ- offers current capabilities of 100, 50, 70, and 40 A with operating bandwidth of 300 kHz, 500 kHz, 1 MHz, and 1.5 MHz, respectively. AC/DC oscilloscope clamp-on probes feature dual range selectivity, over-range indicator, and power adapter or battery power for portable use. Power adapter is available with North American or European Union...

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25 Percent Cost of Test Improvement - Mercury Contactor Outperforms Competition
Electrical / Electronic Probes

25 Percent Cost of Test Improvement - Mercury Contactor Outperforms Competition

Rosenheim, Germany – Multitest, a designer and manufacturer of final test handlers, contactors and load boards used by integrated device manufacturers (IDMs) and final test subcontractors worldwide, announces that its Mercury 040 Spring Probe Contactor has successfully passed more than five months of evaluation for a strip test application at a SEA high-volume production site. The substantial...

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Electrical / Electronic Probes

Raman Probe supports food and polymer process analysis.

When fitted to extruders employing industry standard Â-½–20 UNF fittings, Model RFP-435 enables Raman analysis of materials such as polymers and food products during extrusion. Probe features sapphire window, stainless steel construction, and proprietary welded window seal design. Employing interchangeable objective and filter assemblies, probe can be adapted to variety of sample types and...

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Spring-Extend AC-LVDT Pencil Probes offer submicron resolution.
Electrical / Electronic Probes

Spring-Extend AC-LVDT Pencil Probes offer submicron resolution.

DGP dimensional gauging probes (pencil probes), manufactured with the precision ground bearings, come standard with 8 mm dia plain outer body; optional sleeve, either plain or partly threaded, increases OD to 0.375 in. Offered in ±0.5 mm, ±1.0 mm, and ±2.5 mm ranges, products feature 2 m long axial shielded cable that is strain relieved and can be converted toÂ- radial...

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Gauging Probe combines long life and narrow 6 mm body.
Electrical / Electronic Probes

Gauging Probe combines long life and narrow 6 mm body.

Offering 2, 5, and 12 mm measuring ranges and resolution programmable to 0.01 Â-µm, D6J Pencil Probe Series is compatible with Orbit®3 Network and can interconnect with other sensors, instruments, and outputs. Designed facilitates installation, while construction includes long-life, precision bearings that ensure probe's accuracy is maintained throughout millions of cycles....

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Electrical / Electronic Probes

Oscilloscopes offer power analysis options and wideband probe.

With R&S RTO-K31 and R&S RTM K31 power analysis options, oscilloscopes can automatically test quality of all segments of switching power supplies, including mains voltage quality of input range, safe operating area of switching transistor, as well as magnitude and spectrum of output ripple. For power supplies with high clock frequencies, R&S RT ZD10 active differential wideband probe combines...

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Electrical / Electronic Probes

Agilent Technologies to Demonstrate Leading-Edge Test Solutions for Memory, NVM Express, PCI Express, and SuperSpeed USB Applications at Intel Developer Forum

SANTA CLARA, Calif. – Agilent Technologies Inc. (NYSE: A) today announced that it will demonstrate its latest test solutions that meet the challenges of current and next-generation digital designs in memory, NVM Express, PCI Express, and SuperSpeed USB technology at the Intel Developer Forum, Sept. 10-12, at the Moscone Convention Center in San Francisco. Memory Debug and Validation Agilent...

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Electrical / Electronic Probes

Oscilloscope Probes suit extreme-temperature applications.

Used for testing ICs and devices in environmental chambers, N2797A high-input-impedance, single-ended active probe with rugged tips can be operated, without damage, over -40 to +85°C range. For extended testing, N5450B InfiniiMax extreme-temperature extension cable is offered with InfiniiMax Series differential probing system and enables -55 to +150°C range. Also available, 2-channel...

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New Compliant Connector Solutions from ECT at ITC 2013
Electrical / Electronic Probes

New Compliant Connector Solutions from ECT at ITC 2013

Pomona, Calif. – Everett Charles Technologies' (ECT) today announced that it will exhibit in booth #219 at the upcoming International Test Conference (ITC), scheduled to take place September 10-12, 2013 at the Disneyland Hotel in Anaheim, CA. Company representatives will discuss innovative solutions including: Tilt Universal Grid Prober – The tilt technology is the world's most advanced...

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