Wafer Probe Station targets process nodes 45 nm and below.
Based on 300 mm large-area microscope system with video and software navigation, Elite 300 includes PureLine II noise-reduction technology, and architectural design that ensures flatness and planarity, preventing probe needle shifting. It offers standard temperature range of -60 to 300°C, with 400°C thermal chuck option. For precise internal-node, sub-micron probing over temperature,...
Read More »The Road to Innovation: A Modular Future for Test, Munich November 13th to 16th, November 2007 Booth A1. 338
High fault coverage, speed, ease of use, flexibility, cost-effectiveness: these are just some of the demands made of today's leading electronics test systems. It's a tall order, but Test Expert Seica continues to lead the industry along the road to innovation" with its modular "one platform, many solutions" strategy, which not only meets these needs, but does a whole lot more besides. Electronics...
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First Time for Condor II at Nepcon East Boston, Booth 1119
Center stage at booth 1119 at this year's Nepcon East exhibition will be a comprehensive range of innovative software and hardware test technologies. All the latest developments in Flying Probe will be on show, once again underscoring Digitaltest's leadership in the supply of advanced test solutions. Flying Probe Tester Condor II With unique drive technology, linear motors, and closed-loop...
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Eddy Current Probe operates in temperatures to 240°C.
Used to monitor rotating shaft alignment and axial position, PRS05 Senturion Proximity Probe is constructed with bobbin expansion chamber and wire strain relief techniques for high-temperature operation. Construction also includes glass-filled PPS bobbin case, rated to 300°C, resistant to oil and chemicals. Offering 0-5 mm non-contact measurement range in 12 mm tip (M18 body) configuration,...
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A Nutraceutical Pathway to Innovative Hemp and CBD Products
We released this white paper to help CEOs and CSOs understand the key elements of nutraceutical development, going from Concept to Consumer. In our experience at least some of the steps in the process are not well understood, resulting in important scientific and regulatory gaps in the Concept to Consumer process.
Read More »eASIC and IAR Systems Deliver e926 Development Kit for Designing Low-Cost, Customized ARM926EJ(TM) Embedded Systems
SANTA CLARA, Calif., May 22 // -- eASIC Corporation, a provider of Structured ASIC devices, and IAR Systems, a provider of embedded development tools, today announced the immediate availability of the e926 Development Kit for designing affordable ARM926EJ-based embedded systems. The e926 Development Kit provides embedded system designers with a comprehensive application development environment....
Read More »Current Probes measure AC/DC currents up to 500 Arms.
Utilizing hybrid technology that combines Hall effect sensor and AC current transformer, N2780A Series accurately capture transient or steady-state currents in power electronics applications. Units can measure currents without breaking into circuit. In conjunction with optional Agilent N2779A power supply, current probes operate with any oscilloscope featuring high-impedance BNC output.
Read More »Seica Unveils the Very Latest and Best in Its World-Class Range of Flying Probe Test Solutions on Booth 4F11
Designed to meet industry demands for high fault coverage, speed, ease of use, flexibility and cost-effectiveness, Seica's AERIAL Flying Probe test system can be operated by specialist and non-specialist test personnel alike as part of a highly cost-effective test strategy. Based on Seica's proprietary VIVA Integrated Platform (VIP(TM)) core hardware and software, AERIAL reduces the investment...
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PCB Test Arm Probe connects test instruments to SMDs.
PCB Test Arm Probe provides probing of surface mount devices (SMDs), and connects test instruments to variety of SMDs including PLCC, SOIC, QFP, and VIAS or test point holes. With length of 8.33 in., height of 2.92 in., and base length of 2.53 in., it includes spring loaded tip, rotatable head, and fine vertical adjustment knob, and is available in 3 and 10 A models. Connection post supports...
Read More »Seica to Showcase its Line of Flying Probe Test Solutions at Nepcon Shanghai, Booth 4F11
Strambino,Italy, February 2007 - SEICA Spa will present a new addition to its line of Flying Probe test systems, AERIAL, to address the growing demand to provide cost-effective test solutions that will further enhance ease of programming, high fault coverage and fast throughput for PCB test. AERIAL is based on the core hardware and software of the VIVA Integrated Platform (VIP) and uses four...
Read More »Active Differential Probes offer application versatility.
Models P7513 (13 GHz) and P7516 (16 GHz) connect to and acquire multiple complex signals simultaneously. With these speeds, users can debug and validate 3rd harmonic of 10 Gbps signals and perform compliance testing to 5th harmonic on signals up to 6.4 Gbps. TriMode(TM) probing enables engineers to switch between differential, single-ended, and common mode measurements without moving probe...
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Micro Air's Dust, Fume, Mist Collection Equipment Facilitate a Safe Work Environment
Dust, fume, and mist collectors from Micro Air promote a safer, more productive work environment. Our wide array of products are available to the industrial manufacturing sector for processes such as welding, cutting, grinding, blasting, and more. Check out our video to learn more.
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