Electrical / Electronic Probes

Eddy Current Probe operates in temperatures to 240°C.
Electrical / Electronic Probes

Eddy Current Probe operates in temperatures to 240°C.

Used to monitor rotating shaft alignment and axial position, PRS05 Senturion Proximity Probe is constructed with bobbin expansion chamber and wire strain relief techniques for high-temperature operation. Construction also includes glass-filled PPS bobbin case, rated to 300°C, resistant to oil and chemicals. Offering 0-5 mm non-contact measurement range in 12 mm tip (M18 body) configuration,...

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Electrical / Electronic Probes

eASIC and IAR Systems Deliver e926 Development Kit for Designing Low-Cost, Customized ARM926EJ(TM) Embedded Systems

SANTA CLARA, Calif., May 22 // -- eASIC Corporation, a provider of Structured ASIC devices, and IAR Systems, a provider of embedded development tools, today announced the immediate availability of the e926 Development Kit for designing affordable ARM926EJ-based embedded systems. The e926 Development Kit provides embedded system designers with a comprehensive application development environment....

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Electrical / Electronic Probes

Current Probes measure AC/DC currents up to 500 Arms.

Utilizing hybrid technology that combines Hall effect sensor and AC current transformer, N2780A Series accurately capture transient or steady-state currents in power electronics applications. Units can measure currents without breaking into circuit. In conjunction with optional Agilent N2779A power supply, current probes operate with any oscilloscope featuring high-impedance BNC output.

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Electrical / Electronic Probes

Seica Unveils the Very Latest and Best in Its World-Class Range of Flying Probe Test Solutions on Booth 4F11

Designed to meet industry demands for high fault coverage, speed, ease of use, flexibility and cost-effectiveness, Seica's AERIAL Flying Probe test system can be operated by specialist and non-specialist test personnel alike as part of a highly cost-effective test strategy. Based on Seica's proprietary VIVA Integrated Platform (VIP(TM)) core hardware and software, AERIAL reduces the investment...

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PCB Test Arm Probe connects test instruments to SMDs.
Electrical / Electronic Probes

PCB Test Arm Probe connects test instruments to SMDs.

PCB Test Arm Probe provides probing of surface mount devices (SMDs), and connects test instruments to variety of SMDs including PLCC, SOIC, QFP, and VIAS or test point holes. With length of 8.33 in., height of 2.92 in., and base length of 2.53 in., it includes spring loaded tip, rotatable head, and fine vertical adjustment knob, and is available in 3 and 10 A models. Connection post supports...

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Electrical / Electronic Probes

Seica to Showcase its Line of Flying Probe Test Solutions at Nepcon Shanghai, Booth 4F11

Strambino,Italy, February 2007 - SEICA Spa will present a new addition to its line of Flying Probe test systems, AERIAL, to address the growing demand to provide cost-effective test solutions that will further enhance ease of programming, high fault coverage and fast throughput for PCB test. AERIAL is based on the core hardware and software of the VIVA Integrated Platform (VIP) and uses four...

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Electrical / Electronic Probes

Active Differential Probes offer application versatility.

Models P7513 (13 GHz) and P7516 (16 GHz) connect to and acquire multiple complex signals simultaneously. With these speeds, users can debug and validate 3rd harmonic of 10 Gbps signals and perform compliance testing to 5th harmonic on signals up to 6.4 Gbps. TriMode(TM) probing enables engineers to switch between differential, single-ended, and common mode measurements without moving probe...

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Electrical / Electronic Probes

Sypris Test and Measurement Adds Additional Capabilities

ORLANDO, FL (December 13, 2006) - Sypris Test & Measurement, Inc., a subsidiary of Sypris Solutions, Inc., today announced the addition of Antenna, Isotropic/Electromagnetic Field Probe, Line Impedance Stabilization Network calibrations and RF Screen Room/Anechoic Chamber Certification to its suite of calibration service offerings. The addition of these capabilities enhances our service offerings...

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Electrical / Electronic Probes

Probe System tests wafers up to 300 mm.

Designed for high-temperature, multi-site testing, Model PM300WLR features large programmable microscope movement and cable handling solutions that facilitate use. Contact stability is guaranteed at temperatures up to 400°C and test times are minimized using multi-site probe cards. Design of probe system minimizes gas consumption, which is important for devices that must be tested in inert...

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