Electrical / Electronic Probes

Electrical / Electronic Probes

Miniature Passive Probes have bandwidths from DC to 1.5 GHz.

Suited for probing densely populated IC components or surface-mount devices used in high-speed digital applications, N2870A series is available with attenuation ratios of 1:1, 10:1, 20:1, and 100:1 and bandwidths of DC to 35, 200, 350, 500 MHz and 1.5 GHz. Spring loaded sharp probe tip helps keep probe from slipping off device under test, while insulating IC caps keep probe tip centered on IC...

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Interchangeable Probes facilitate water analysis testing.
Electrical / Electronic Probes

Interchangeable Probes facilitate water analysis testing.

Designed for HQd line of meters, IntelliCAL(TM) Probes provide portable measurement of ORP, sodium, and pH for low-ionic strength samples for analysis in lab or field. When switching between parameters, operator plugs IntelliCAL probe into HQd meter. System automatically recognizes testing parameter from probe and recalls calibration history. It uses intuitive menu structure along with guided...

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Electrical / Electronic Probes

SUSS MicroTec Introduces New |Z| Probe® Technology for Wafer-Level RF Testing

The 1MX(TM) technology significantly improves the RF and microwave performance of the |Z| Probe® Family of RF wafer probes The |Z| Probe family, with its unsurpassed lifetime and excellent contact quality, reliability and repeatability providing lowest cost of ownership, is now expanded with the new 1MX Technology" - Dr. Stojan Kanev, Director of Marketing and Product Management at SUSS...

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Electrical / Electronic Probes

PCIe Analyzers utilize half size mid-bus probing solution.

Designed for E2960B Series PCI Express Analyzers, N5328A half-size mid-bus probe 2.0 supports both 2.5 GT/s and 5.0 GT/s PCIe data rates and will allow designers to monitor PCIe protocol. Soft touch, micro-spring technology provides reliable contact to signal pads, while top-side retention module eliminates need to access back of board. Suited for space-constrained systems, flying leads probe...

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Electrical / Electronic Probes

LPDDR BGA Probe works with oscilloscopes, logic analyzers.

Low-power double data rate (LPDDR) BGA probes provide signal access points for LPDDR and mobile-DDR synchronous dynamic random access memory (SDRAM) in electrical, timing, and protocol characterization applications. Respectively supporting x16 and x32 SDRAM packages, W2637A and W2638A BGA probes feature embedded resistors that provide signal isolation. Both serve as probing solutions at LPDDR and...

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Electrical / Electronic Probes

Tohoku University Institute for Metals Research Upgrades Imago Leap Atom-Probe Capabilities

Jan. 6, 2009 Yokohama, Japan and Madison, WI, United States - Noah Corporation and Imago Scientific Instruments jointly announced today that Tohoku University has installed a Laser Pulse Module(TM) and Large Angle Reflectron(TM) in their Imago atom probe located at the university's Institute for Materials Research, Ibaraki Japan. The atomic-scale, three-dimensional imaging and analysis provided...

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Electrical / Electronic Probes

Network Quality Test Probe features automated operation.

Diversity Unattended probe incorporates features that are specifically designed to improve automated operation. It includes both phone and a data card for testing, along with wireless router and separate data card to provide dedicated remote link over cellular or WiFi networks, enabling simultaneous recording of both voice and data services information. Data can be transferred for real time...

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High-Frequency Test Probes offer rise time of 0.9 ns.
Electrical / Electronic Probes

High-Frequency Test Probes offer rise time of 0.9 ns.

Compatible with all oscilloscopes, Isoprobe® III high-frequency (250-500 MHz) test probes have coaxial connecting cable with low capacitance. Flexible PVC insulated coaxial leads terminate in BNC plug with integrated compensation unit. Most models have 10:1 dividing ratios, and 100:1 probe is available for measurements on sensitive circuits. Along with input capacitance as low as 12 pF,...

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Electrical / Electronic Probes

Flying Leads Probe aids embedded PCIe 2.0 design/validation.

Compatible with E2960B Series PCI Express® (PCIe®) 2.0 analyzers, N4241F flying leads probe for PCIe 2.0 is designed for debugging embedded designs. It allows access to PCIe 2.0 links with no designed-in connectors at 2.5 and 5.0 Giga Transfer per second (GT/s) rates, exposing hard-to-reach signals and providing visibility to debug designs without influencing monitored signals....

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