Dimensional Measurement & Inspection Probes

Metris Releases the XC50-LS Cross Scanner Featuring Long Stand-Off for Ore Flexible Feature Inspection
Dimensional Measurement & Inspection Probes

Metris Releases the XC50-LS Cross Scanner Featuring Long Stand-Off for Ore Flexible Feature Inspection

Leuven, May 9th, 2006 - Metris launches its new XC50-LS cross scanner with long stand-off distance for CMM-based feature inspection and reverse engineering applications. The patented cross scanner technology combines three laser stripes into a single sensor, enabling efficient scanning of features such as holes and slots without having to re-orientate the sensor. With its 180 mm stand-off...

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Probe Head provides performance upgrade path for CMMs.
Dimensional Measurement & Inspection Probes

Probe Head provides performance upgrade path for CMMs.

With future-proof design, 2-axis GYRO(TM) offers 3 levels of functionality: touch-trigger, 3-axis scanning, and 5-axis scanning. Adaptability makes this infinitely positioning dynamic measuring head suitable for small and large DCC coordinate measuring machines (CMMs). It allows use of laser-tip sense technology, where laser light system is used to measure exact position of probe tip, and has...

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Dimensional Measurement & Inspection Probes

IRIDEX Expands Disposable Laser Probe Product Portfolio

Continues to Execute Disposable Probe Sales Growth Strategy With New Product Introduction and Patent Application MOUNTAIN VIEW, Calif., June 28 / -- IRIDEX Corporation (NASDAQ:IRIX) today announced the introduction of a family of disposable laser probes called the OtoProbe(TM) for use in otology (ENT) surgery. In addition, the Company announced the acquisition of a patent application from...

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Dimensional Measurement & Inspection Probes

Arm-Mounted Laser Probe minimizes scanning time.

Designed for use with portable CMM articulating arms, SLP-330 scans parts up to 12 ft long without moving base of arm or any size if arm is moved. It employs 2 detectors that view laser line from as many different angles, reducing number of scanning passes required to capture steep sidewalls and deep geometries. Able to capture up to 50,000 points/sec, product can also interface with Surveyor 3D...

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Dimensional Measurement & Inspection Probes

Hand-held Scanner is suited for industrial measurement.

Designed for use with LTD800/700 laser tracking systems, T-Scan high-speed handheld scanner provides non-contact digitization of large objects at rate of 7,000 points/sec with accuracy of up to 50 microns. Device is insensitive to all types of surfaces, eliminating need for surface preparation. Local positioning product is suited for 3D data capture and object inspection of aerospace and...

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Measuring Probe aids EDM and milling machine setup.
Dimensional Measurement & Inspection Probes

Measuring Probe aids EDM and milling machine setup.

Available in digital and mechanical versions, MarTest® 802 EW can determine zero position of workpiece and center of bore; correct position of workpiece; provide measurement of lengths and depths; and provide information for angular calculations. Unit measures in 3 dimensions simultaneously, providing operator with clear positioning data. Rated IP65 for water resistance, probe offers 0.236...

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IR 3D Touch Probe has compact dimensions.
Dimensional Measurement & Inspection Probes

IR 3D Touch Probe has compact dimensions.

Offered in sizes as small as 0.49 x 63 mm, TS 440 features 360° transmission and can be used on iTNC 530 control and higher. It is suited for machines with limited working space that carry out repeated setup and inspection procedures. Transceiver for IR touch probes, SE 540, is designed for installation in headstock in order to move along with touch probe. This ensures reliable transmission...

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CMM Probe offers high-speed pointcloud processing.
Dimensional Measurement & Inspection Probes

CMM Probe offers high-speed pointcloud processing.

Metris LC50/100(TM) digitizing, non-contact probe aids in 3D part scanning, inspection, and reverse engineering. Its PH-10M/PH-10Q interface enables non-contact scanning to 19,200 points/sec, while adjustable camera and laser intensity settings ensure quality of data acquisition from different surfaces/environments. Bundled with COSMOS CMM and CADCompare(TM) software, product handles large...

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Dimensional Measurement & Inspection Probes

Hand-held Probe inspects surface-mount devices.

SolView allows evaluation of PCB without removing it from line. SolView-90 is placed beside components, allowing inspection under surface mount devices to determine solder bond integrity. Portable eyepiece has entrance pupil height of 0.3 mm, wide field of view optical inspection system, and high intensity LED illumination. SolView-00 direct viewing instrument facilitates general component...

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Touch Trigger Probes offer indexable operation.
Dimensional Measurement & Inspection Probes

Touch Trigger Probes offer indexable operation.

Available in 2 versions, TESASTAR® Touch Trigger Probes feature adjustable measuring force to prevent inadvertent triggering when long stylus is used. TESASTAR-I® Indexable Touch Trigger Probe is adjustable to 168 positions in 15Â-º increments. TESASTAR probes can be rotated through infinite number of positions for flexibility in measuring complex components. Clockwise rotation...

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