Dimensional Measurement & Inspection Probes

Dimensional Measurement & Inspection Probes

Xspect Solutions Introduces New Extended Warranty Program for Wenzel CMMs

XtraCare(TM) extended warranty program covers the total CMM measuring system and extends the standard one-year comprehensive warranty to a full three years. Because Wenzel CMMs are manufactured to such exacting precision and continue to use metrologically stable granite as the base structure, we are now able to offer a comprehensive extended warranty program that includes a full three years,"...

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Metronor Presents News naviSCAN System at IMTS 2008
Dimensional Measurement & Inspection Probes

Metronor Presents News naviSCAN System at IMTS 2008

Seattle, WA, June 2, 2008 - At IMTS 2008, Metronor will be featuring the new naviSCAN: a portable system for scanning and probing directly in the object coordinate system without the use of targets or post-process patch stitching. naviSCAN is designed for inspection and reverse engineering of large components on the shop floor, even under harsh conditions. naviSCAN is a combination of a Metronor...

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Portable LED Probe illuminates hard-to-reach areas.
Dimensional Measurement & Inspection Probes

Portable LED Probe illuminates hard-to-reach areas.

Portable LED Fiberoptic Probe is comprised of illuminator handle and snap-in-place probe extension that slips over light source. Constructed of stainless steel, illuminator handle has pushbutton on/off switch and 1.25 W LED with focusing lens. Extensions come in 180°, 90°, and 45° angles, each in diameters of 0.120, 0.058, and 0.030 in., to reach and illuminate areas with...

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CMM System provides scanning and probing functionality.
Dimensional Measurement & Inspection Probes

CMM System provides scanning and probing functionality.

Combining Metronor DUO portable CMM and Breuckmann stereoSCAN white-light-scanning system, naviSCAN System can scan areas up to one square meter per shot. Benefits include hidden points that are not accessible through scanner to be measured with touch probe, monitors vibrations, and checks accuracy between scans in real-time. Available with heavy-duty transport cases, portable system is designed...

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Dimensional Measurement & Inspection Probes

Flying Leads Probe aids embedded PCIe 2.0 design/validation.

Compatible with E2960B Series PCI Express® (PCIe®) 2.0 analyzers, N4241F flying leads probe for PCIe 2.0 is designed for debugging embedded designs. It allows access to PCIe 2.0 links with no designed-in connectors at 2.5 and 5.0 Giga Transfer per second (GT/s) rates, exposing hard-to-reach signals and providing visibility to debug designs without influencing monitored signals....

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Dimensional Measurement & Inspection Probes

TeZet and Metronor Present the Smart Way to Measure Tubes

Oslo - April 14, 2008 - Solutions for documenting or verifying large and complex tubes - such as those found in the oil and chemical industries but also in aircraft or heavy vehicles - traditionally involve expensive large-volume laser scanners capturing millions of points and advanced software to sort, interpret and extract the required information. TeZet and Metronor now presents a fast,...

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Dimensional Measurement & Inspection Probes

RF Production Probe Card utilizes membrane probe technology.

Designed to aid in high-volume wafer testing of RF filters and switches for mobile handsets, 20 GHz P30 Pyramid Probe card has scalable architecture and is sized to enable multi-site testing. Solution's lithographic probes alleviate uncontrolled impedance and Microscrub(TM) creates small scrub mark that minimizes material displacement. Applications include multi-die testing for RF wireless,...

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Touch Probe allows part checking on 5-axis machining.
Dimensional Measurement & Inspection Probes

Touch Probe allows part checking on 5-axis machining.

Model RMP600 combines strain-gage sensing technology with with frequency-hopping spread-spectrum radio transmission, which enables multiple machining centers with probe system to coexist in noisy industrial environments. RENGAGE(TM) technology allows sub-micron 3D probe performance on contoured surfaces, even with long styli. Compatible with machine controllers, probe delivers uni-directional...

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Touch Probing System gauge mill-turned components.
Dimensional Measurement & Inspection Probes

Touch Probing System gauge mill-turned components.

Based on type 41.00 probe, hard-wired, real-time Touch Probing System allows sliding-head CNC lathe users to measure turned and milled features on every component after machining, while it is still in counter spindle and before ejection. Gauging arrangement, which employs fixed probe mounted on headstock, is also suitable for use on fixed-head, bar-fed, twin-spindle turning machines. Tolerances...

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Dimensional Measurement & Inspection Probes

Vision System offers multi-sensor metrology solution.

Providing vision, touch probe, and laser scanning, Galileo AV1824 Video Measurement System delivers zoom magnification of 12:1 with programmable magnification range from 15-550x using auxiliary lenses. Dual output LED illuminator, ring light, and co-axial illumination provide optimal lighting. Offering measurement volume of 24 x 18 x 6 in., AV1824 includes Metronics Quadra-Chek® QC-5000 3-D...

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