Data Collection Systems

Situation Management System streamlines incident response.

Able to anticipate, manage, and mitigate safety, security, and operational risks, NICE Situator enables capture, analysis, and correlation of data from multiple sensors and systems to provide framework for fusing data into one holistic operational view. Open situation management platform enhances preparedness, real-time awareness, and incident response. Agencies can work off of Common Operating...

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Situation Management System streamlines incident response.

Able to anticipate, manage, and mitigate safety, security, and operational risks, NICE Situator enables capture, analysis, and correlation of data from multiple sensors and systems to provide framework for fusing data into one holistic operational view. Open situation management platform enhances preparedness, real-time awareness, and incident response. Agencies can work off of Common Operating...

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Miscellaneous Analyzers

ASI DATAMYTE Receives Patent for Its LightStar(TM) Residual Torque Measurement System

Plymouth, MN, USA - ASI DATAMYTE announced today that on May 3, 2011 the U.S. Patent Office issued patent number 7,934,428 for the residual torque analysis technology used in the company's LightStar(TM) line of torque and angle wrenches and measurement system. This validates ASI DATAMYTE's claim that its residual torque measurement solution, comprised of its Model 600 Data Collector and...

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Miscellaneous Analyzers

ASI DATAMYTE Receives Patent for Its LightStar(TM) Residual Torque Measurement System

Plymouth, MN, USA - ASI DATAMYTE announced today that on May 3, 2011 the U.S. Patent Office issued patent number 7,934,428 for the residual torque analysis technology used in the company's LightStar(TM) line of torque and angle wrenches and measurement system. This validates ASI DATAMYTE's claim that its residual torque measurement solution, comprised of its Model 600 Data Collector and...

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Image Scanners

Fujitsu ScanSnap Receives 2011 CPA Practice Advisor Innovation Award

ScanSnap S1100 is Recognized by CPA Practice Advisor for Benefitting Accounting and Tax Professionals with Advanced Technology SUNNYVALE, Calif., June 8, 2011 - Fujitsu, the market leader in document imaging scanners, today announced that it has been recognized by CPA Practice Advisor and awarded the 2011 CPA Practice Advisor Innovation Award for serving tax and accounting professionals with its...

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Image Scanners

Fujitsu ScanSnap Receives 2011 CPA Practice Advisor Innovation Award

ScanSnap S1100 is Recognized by CPA Practice Advisor for Benefitting Accounting and Tax Professionals with Advanced Technology SUNNYVALE, Calif., June 8, 2011 - Fujitsu, the market leader in document imaging scanners, today announced that it has been recognized by CPA Practice Advisor and awarded the 2011 CPA Practice Advisor Innovation Award for serving tax and accounting professionals with its...

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Mobile Forensics Kit offers data extraction, RF protection.
Data Collection Systems

Mobile Forensics Kit offers data extraction, RF protection.

Designed to aid mobile electronic device forensic examinations, SFP1215W Forensic Pouch provides on-site data extraction capability for portable wireless devices such as smartphones and tablets utilizing capacitive sensing touchscreen. Portable, RF-tight containment device gives law enforcement community means to secure and manipulate wireless devices. Included on I/O plate, USB 2.0 connection...

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Mobile Forensics Kit offers data extraction, RF protection.
Data Collection Systems

Mobile Forensics Kit offers data extraction, RF protection.

Designed to aid mobile electronic device forensic examinations, SFP1215W Forensic Pouch provides on-site data extraction capability for portable wireless devices such as smartphones and tablets utilizing capacitive sensing touchscreen. Portable, RF-tight containment device gives law enforcement community means to secure and manipulate wireless devices. Included on I/O plate, USB 2.0 connection...

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Flaw Sensors / Detectors

Defect Analysis System is suited for PV cell manufacturers.

FabVision(TM) Solar utilizes ICOS-® PVI-6 data through range of analysis and monitoring features, captures wafer/cell images and data from PVI-6, and allows navigation that simplifies image review. Users can review in-line data at any point, and reports are generated automatically with optical inspection measurement results from multiple inspection modules across multiple manufacturing lines....

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Flaw Sensors / Detectors

Defect Analysis System is suited for PV cell manufacturers.

FabVision(TM) Solar utilizes ICOSÂ-® PVI-6 data through range of analysis and monitoring features, captures wafer/cell images and data from PVI-6, and allows navigation that simplifies image review. Users can review in-line data at any point, and reports are generated automatically with optical inspection measurement results from multiple inspection modules across multiple manufacturing...

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