Characterization Instruments

Characterization Instruments

MTS Wins 2006 R&D Magazine 100 Award for In-Situ Nano Testing System

EDEN PRAIRIE, Minn., Nov. 21 / - MTS Systems Corporation (NASDAQ:MTSC) today announced it has received an R&D 100 Award from R&D Magazine for a new generation of Nano testing systems. The InSEM(TM) T250 nano tensile testing system enables characterization of materials and components at the micro/nano length scale within a scanning electron microscope. Researchers depend on MTS to help them...

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Malvern Shows Chemical Imaging Solutions for First Time at AAPS
Imaging Equipment

Malvern Shows Chemical Imaging Solutions for First Time at AAPS

Booth # 1272 Malvern Instruments' recent acquisition of Spectral Dimensions Inc. has added powerful NIR (near infrared) chemical imaging systems to the Malvern portfolio. The NIR-CI 2450 from this range will be on show at the 2006 AAPS Annual Meeting and Exposition (29 Oct - 2 Nov 06; San Antonio, TX, USA). The NIR-CI 2450, which incorporates the latest technology for chemical imaging, will be...

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Thermo Showcases its New Materials Characterization Instrument at AVS International Symposium 2006
Gas / Chemical Analyzers

Thermo Showcases its New Materials Characterization Instrument at AVS International Symposium 2006

SAN FRANCISCO, CA (October 5, 2006) - Thermo Electron Corporation, world leader in analytical instrumentation, will be exhibiting its new K-Alpha Materials Characterization instrument on booth #1529 at the 53rd International Symposium and Exhibition of the American Vacuum Society (AVS) at the Moscone West Convention Center, San Francisco, CA, 12 -17 November 2006. Using X-ray Photoelectron...

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Miscellaneous Software

Edax and Carl Zeiss SMT Showcase New OIM(TM) 3d EBSD at Microscopy and Microanalysis 2006

Booth # 416, July 31 - August 3, 2006 MAHWAH, NJ - EDAX Inc., a leader in X-ray microanalysis and electron backscatter diffraction (EBSD) instrumentation, in partnership with Carl Zeiss SMT, showcased OIM 3D, the new three-dimensional Orientation Imaging Microscopy (OIM) EBSD product, at the Microscopy and Microanalysis 2006 Conference, July 31 through August 3, 2006, at the Navy Pier Convention...

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Characterization Instruments

Catalyst Screening Unit offers plug-and-play analysis.

Designed for continuous operation, self-contained Catalyst Screening Unit comprises feed module, reactor, post-reactor conditioning and analysis, and PLC-based control and data-logging system. On-line analysis is delivered via fast gas chromatograph, and complete feed and product analysis can be completed within 10 min. Applications include hydrocarbon alkylation, hydrogenation, hydrotreatment,...

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GPC System performs polymer characterization and analysis.
Characterization Instruments

GPC System performs polymer characterization and analysis.

Integrated PL-GPC 50 platform enables fully integrated triple detection with refractive index, viscometer, and light scattering detectors. Additional detector options for UV and ELSD are available, and combinations are supported with integrated software control and processing. Features provide network control for connection of proprietary instrumentation to obtain instant access for remote...

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Characterization Instruments

Microanalysis System provides material characterization.

PEGASUS determines relationships between physical properties, morphology, chemistry, and crystallography. System simultaneously collects EDS (chemistry) and EBSD (crystallography) data and establishes direct correlation between elemental content and microstructural aspects of studied material. ChI-Scan chemical indexing process uses EDS data to enhance actual phase differentiation and indexing of...

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