X-ray Microanalysis System utilizes various sensor types.
Press Release Summary:
GENESIS XMS employs LN Free Si(Li) Detector, Silicon Drift Detector, and 2 versions of WDS spectrometer, which compliment system's proprietary LN Cooled Si(Li) Detector. All detectors are compatible with Pegasus EDS-EBSD systems for microanalytical materials characterization. GENESIS XMS is capable of accepting input count rates in excess of 500,000 counts per second.
Original Press Release:
EDAX Launches Genesis XMS X-Ray Microanalysis Systems
Mahwah, NJ - EDAX Inc., a leader in X-ray microanalysis, X-ray fluorescence and electron diffraction instrumentation, has introduced the next generation of X-ray Microanalysis Systems-GENESIS XMS.
"We are pleased to introduce the GENESIS XMS Series of products. Their launch completes a process that began with our GENESIS X-ray Microanalysis Software, which has long been regarded as the industry's leading software application program, both in terms of user friendliness and functionality," explains Del Redfern, Microanalysis Product Manager for EDAX.
"The development of the next generation of electronics enabling more functionality in parameters such as process times allows EDAX to maintain its position as the acknowledged leader in X-ray microanalysis technology," notes Redfern.
"The scientific demand for complete materials characterization has increased the demand on detector technology. In response, EDAX has added new detector types to the GENESIS XMS Series, including a new LN Free Si(Li) Detector, a Silicon Drift Detector, and two new versions of a WDS spectrometer to compliment its LN Cooled Si(Li) Detector. All of the detectors can be fully integrated into the GENESIS XMS and are compatible with Pegasus EDS-EBSD systems, offering a complete package for microanalytical materials chacterization," adds Redfern.
"New detector technology also requires higher count rate capability. To meet that demand, the GENESIS XMS is capable of accepting input count rates in excess of 500,000 counts per second," comments Redfern.
EDAX, the acknowledged leader in Energy Dispersive Microanalysis, X-ray Fluorescence and Electron BackScatter Diffraction instrumentation, designs, manufactures, installs and services high-quality products and systems for leading companies in semiconductors, metals, geological, biological, material and ceramics market. Since it's founding in 1962, EDAX has used its knowledge and experience to develop ultra sensitive silicon radiation sensors, digital electronics and specialized application software that facilitate solutions to research, development and industrial analytical problems.
EDAX is a unit of AMETEK Process & Analytical Instruments. AMETEK, Inc., is a leading global manufacturer of electronic instruments and electric motors with annual sales of more than $1 billion.
For further information about EDAX, contact us at:
EDAX Inc.
91 McKee Drive, Mahwah, NJ 07430
Tel: (201) 529-4880 o Fax: (201) 529-3156
E-mail: edax.info-americas@ametek.com o edax.info-international@ametek.com
Website: www.edax.com
