Nov 27, 2007
Woodbury, NY - November 27, 2007 - Veeco Instruments Inc. (Nasdaq: VECO), a leading supplier of instrumentation to the nanoscience community, today announced the shipment of the 150th Dektak® 150 surface profiler. Introduced on November 30, 2006, the Dektak 150 has been widely accepted as a superior solution for measuring thin film thickness, stress and surface roughness and form in industries ranging from semiconductor research to solar cell production.
"We selected the Dektak 150 to enhance the capabilities of both our analytical sciences and new product development labs in Core R&D," said Dr. Gregory Meyers, scanned probe microscopy leader, Analytical Sciences, The Dow Chemical Company. "The Dektak 150 surface profiler provides the right combination of measurement precision, performance, and versatility that we needed to address a wide range of research applications. In addition, the advanced 3D surface analysis capabilities of Veeco's exclusive Vision® software enable extensive characterization of surface roughness and texture as well as routine step height measurements."
"We are very pleased with the overwhelming response to the Dektak 150 from a broad spectrum of industrial customers, universities and research labs," said John Wissinger, Ph.D., Vice President, Business Unit Manager, Veeco Optical Industrial Metrology. "Veeco's Dektak 150 has achieved this important milestone in less than one year by delivering increased capabilities, application flexibility and ease of use with excellent measurement repeatability."
About the Dektak 150
The popularity of the Dektak 150 is due in part to its unique modular design, which enables it to be configured to meet a wide range of application and budgetary requirements. With a variety of configurations, the Dektak 150 offers application packages for everything from simple step height measurements to advanced automation with programmable X-Y positioning of wafers up to 150mm. The compact system accommodates samples up to 90 millimeters thick, performs long scans of 55 millimeters, and provides a larger X-Y translation than competing systems. The half-millimeter vertical range is the best standard Z performance in the industry, and a 1-millimeter option extends the vertical capabilities even further. With sub-nanometer step-height repeatability, the Dektak 150 accurately measures step-heights for thin films below 10 nanometers thick, as well as thick films and curved surfaces up to nearly one-millimeter.
Veeco Instruments Inc. provides solutions for nanoscale applications in the worldwide data storage, HB-LED/wireless and scientific research markets. Our Metrology products are used to measure at the nanoscale and our Process Equipment tools help create nanoscale devices. Veeco's manufacturing and engineering facilities are located in New York, New Jersey, California, Colorado, Arizona and Minnesota. Global sales and service offices are located throughout the United States, Europe, Japan and Asia Pacific. Additional information on Veeco can be found at http://www.veeco.com/