Uniformity Measurement Tool works with solar simulators.

Press Release Summary:

Designed to measure uniformity of irradiance at sample plane of solar simulators, Uniformity Measurement Tool has single metal test platen, compatible with English/Metric table mounts and all IEC, ASTM, and JIS standards. System places test detector head in 17 predetermined positions as defined by JIS standard C8912, or in 64 equally spaced positions, defined by IEC method 60904-9. Providing 2D/3D surface plots, MUMS software analyzes XYZ positioning of lamp to attain optimal irradiance uniformity.

Original Press Release:

Oriel® Introduces a PV Uniformity Measurement Tool for Solar Simulation

Stratford, CT - Oriel®, a Newport Corporation Brand, announces a new Uniformity Measurement Tool for measuring the uniformity of irradiance at the sample plane of Solar Simulators. The new PV tool is equipped with a single metal test platen, compatible with English/metric table mounts and with all 3 test standards, IEC, ASTM and JIS. A detector head is provided with appropriate masking to the area defined by either the IEC or the JIS method, depending on the model. The system is designed to correctly place the test detector head in 17 predetermined positions as defined by JIS standard C8912, or in 64 equally-spaced positions, defined by IEC method 60904-9.

Oriel's Uniformity Measurement Tool assists in alignment to provide the best uniformity of irradiance after a lamp installation and/or replacement. Unique models are available for a variety of Oriel Solar Simulators, including the 2x2, 4x4, 6x6, and 8x8 products. Affordably priced and easy to set up, the uniformity measurement tool employs a user-friendly interface and manual test and a built-in procedure guide.

The intuitive MUMS software package provides 2D and 3D surface plots to analyze XYZ positioning of the lamp to quickly attain optimal irradiance uniformity. It also prompts the user to place the detector in the appropriate position and provides a real-time readout of percentage non-uniformity of irradiance, updated as each data point is measured. It provides 5- and 9-point survey tests for quick alignment and 17- and 64-point test modes to validate compliance to JIS or IEC standards, respectively. For added convenience, the simple USB 2.0 data acquisition board and system interfaces with a PC, eliminating the need for an external power supply.

For more information, please visit http://www.newport.com/UMT.

About Newport Corporation

Newport Corporation is a leading global supplier of advanced-technology products and systems to customers in the scientific research, microelectronics manufacturing, aerospace and defense/security, life and health sciences and precision industrial manufacturing markets. Newport's innovative solutions leverage its expertise in high-power semiconductor, solid-state and ultrafast lasers, photonics instrumentation, sub-micron positioning systems, vibration isolation, optical subsystems and precision automation to enhance the capabilities and productivity of its customers' manufacturing, engineering and research applications. Newport is part of the Standard & Poor's SmallCap 600 Index and the Russell 2000 Index.

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