Thermal Analyzer characterizes high-speed semiconductors.
Press Release Summary:
Part of Thermoreflectance Nanotherm Series, Model NT410A provides time resolution of 800 ps, sub-micron spatial, 1°C temperature resolution, and megapixel full field thermal images. Thermal analyzer supports top-side and through-the-substrate thermal imaging, giving device designers time-dependent thermal performance data to ensure long-term reliability of ultra-fast logic devices, fast pulsed radar components, and other high-speed semiconductor devices.
Original Press Release:
Thermal Imaging and Analysis for High Speed Semiconductor Devices
Best-In-Class Imaging With Picosecond Time Resolution
SANTA CLARA, Calif. -- Microsanj announces the availability of a new high performance thermal analyzer in the Thermoreflectance Nanotherm Series. The NT410A represents another step forward in the development of thermal analyzers capable of meeting the stringent requirements necessary to meet the challenges of today's complex high performance microelectronics devices. With a time resolution of 800 picoseconds, sub-micron spatial, 1 degree C temperature resolution, and mega pixel full field thermal images, the NT410A can provide device designers with important time-dependent thermal performance data that was, up to now, not easily attainable. This information helps to ensure long-term device reliability and enables more optimal designs of ultra-fast logic devices, fast pulsed radar components, and other high speed semiconductor devices.Â
"This latest addition to the Microsanj thermal imaging product line is the most advanced system available for thermal imaging", said Dr. Mo Shakouri, CEO of Microsanj, "The NT410A has the capability for top-side and through-the-substrate thermal imaging with the accuracy and resolution necessary to fully characterize and analyze the thermal behavior of today's advanced high performance semiconductor devices."
A paper to be presented at the IEEE Compound Semiconductor IC Symposium (CSICS) in La Jolla, California on October 20, 2014, describes how the sub-nanosecond time resolution of the NT410A can be applied to ultrafast thermal imaging of high power gallium-nitride transistors.
Pricing and Availability:
For detailed specifications, pricing, and availability of the NT410A and other products in the Nanotherm Product Series, contact Microsanj at info@microsanj.com
About Microsanj:
Microsanj, LLC is a leading supplier of high resolution, Thermoreflectance Imaging Analysis (TIA) systems, tools, and consulting services. The TIA systems are based on the optical thermoreflectance principle coupled with digital signal processing and advanced software algorithms to support microelectronic component thermal characterization for thermal design validation, defect analysis, and reliability analysis. Microsanj currently offers the highest resolution thermal imaging systems on the market. For more information visit: www.microsanj.com
CONTACT:
Doug Gray
(408) 595 2962
dgray.tcs@gmail.com
