Test System measures NVG-compatible lighting and displays.

Press Release Summary:




Utilizing concave, aberration-corrected grating spectrograph, OL 770-NVS Night Vision Display Test and Measurement System allows for NVIS compatible testing of Tungsten backlit devices without need for additional filters and system calibrations. Laboratory-grade TE-cooled, back thinned detector enables fast measurements of spectral radiance, luminance, chromaticity, NVISa and NVISb, while exceeding all MIL-L-86762A Appendix B / MIL-STD-3009 requirements.



Original Press Release:



The New and Improved OL 770-NVS



Based on our expertise gained through serving our customers for over 40 years, G&H Instruments is pleased to introduce the new and improved OL 770-NVS Night Vision Display Test and Measurement System, a complete solution for measurement of NVG-compatible lighting and displays. With all of the features of the original system, the new 770-NVS allows for NVIS compatible testing of Tungsten backlit devices without the need for additional filters and system calibrations. This is achieved by utilizing a concave, aberration-corrected grating spectrograph specifically designed to target the NVIS wavelength range as defined in MIL-L-86762A Appendix B / MIL-STD-3009. Not only does this simplify the measurement process, but with the new limited range comes better throughput and wavelength accuracy. And because we use the same laboratory-grade TE-cooled, back thinned detector, you can still expect ultra-fast measurements of spectral radiance, luminance, chromaticity, NVISa and NVISb, while exceeding all MIL-L-86762A Appendix B / MIL-STD-3009 requirements. The new OL 770-NVS is your total aerospace lighting solution!



Optronic Laboratories LLC

DBA Gooch & Housego

4632 36th Street

Orlando, FL 32811

T: 407-422-3171

F: 407-648-5412

E: orlandosales@goochandhousego.com

W: www.GHinstruments.com


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