Surface Metrology System offers 0.1 nm vertical resolution.

Press Release Summary:




Utilizing MarSurf XT 20 topographical evaluation software, MarSurf(TM) WS 1 Optical Surface Metrology System can be configured to work in lab and on shop floor. It includes white light optical sensor for recording of surface topography on various materials. Test surface area and reference surface built into objective lens are imaged simultaneously by CCD camera. System can be used in precision inspection rooms and production environments, on reflective and rough workpieces.



Original Press Release:



Mahr Federal Introduces Marsurf(TM) WS 1 Optical Surface Metrology System



- Compact design provides fast, high-precision, non-contact measurement of surface texture using white-light interferometry

PROVIDENCE, RI - Mahr Federal has expanded its offerings in the world of optical surface metrology with the introduction of the MarSurf(TM) WS 1. Utilizing white light interferometry in a compact design, the MarSurf WS 1 offers vertical resolution of 0.1 nm (.004 µin) and provides three-dimensional measurement in only a few seconds. Utilizing MarSurf XT 20 topographical evaluation software, the space-saving MarSurf WS 1 can be configured to work both in the lab and on the shop floor.

"With the new processes and materials available these days, traditional stylus measurement is often not adequate to characterize the functional behavior of surfaces," said Pat Nugent, Vice President of Metrology Systems for Mahr Federal. "The MarSurf WS 1 can provide the three-dimensional recording and evaluation needed, as well as the non-contact measurement required by soft and sensitive materials. In addition, new processes are achieving ever higher levels of surface quality, greatly increasing the need for greater resolution and measuring accuracy."

The white light optical sensor in the MarSurf WS 1 enables the rapid, high-precision recording of surface topography on a wide range of materials. Using white light and a CCD camera, the system is able to collect height information through the field of view of the camera. Both the test surface area and a high-precision reference surface built into the objective lens are imaged simultaneously by the camera. During measurement, the Mirau objective is moved in small steps in the Z direction, using a piezo positioner. The resultant interferograms are recorded as image stacks and converted into height data.

The MarSurf WS 1 can be used in both precision inspection rooms and production environments, and on both reflective and rough workpieces. High vertical resolution allows the surface roughness measurements on optical components such as lenses or mirrors with sub-µm accuracy. Texture can also be measured on micromechanical components on virtually any material, including glass, paper, metal, plastic, and various coated surfaces.

MarSurf XT 20 topography software is a powerful evaluation tool which offers a wide range of functions including many proposed 3D parameters. In addition, because the MarSurf XT 20 software is fully integrated with the MarWin platform, users are also able to access Mahr's well-known MarSurf XC 20 contour software or XR 20 surface roughness software to perform micro-contour and all standard surface finish parameters.

Mahr Federal Inc., a member of the Mahr Group, is known worldwide for its expertise in providing dimensional measurement solutions. The ISO 9001:2000-certified company manufactures and markets a wide variety of dimensional metrology products, and is headquartered in Providence, RI.

For additional information, contact:
Marketing
Mahr Federal Inc.
1144 Eddy Street
Providence RI 02905 USA
Tel: (800) 333-4243 or (401) 784-3100
Fax: (401) 784-3246
Email: information@mahr.com
Web site: www.mahr.com

Mahr Federal has expanded its offerings in the world of optical surface metrology with the introduction of the MarSurf(TM) WS 1. Utilizing white light interferometry in a compact design, the MarSurf WS 1 offers vertical resolution of 0.1 nm (.004 µin) and provides three-dimensional measurement in only a few seconds.

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