Surface Analyzer offers static control.

Press Release Summary:




CAM-Wafer performs QC, research, cleanliness, and analytical functions on various of substrates, including silicone wafers with up to 12 in. dia. Using analysis software, product can save images of drops, do statistical analysis on data, and export data to spreadsheet. Unit enables exact positioning of substrate, has open design, and uses CCD Camera and software to measure contact angle. Machine comes with one 4 in dia stage and one 6, 8, or 12 in. dia stage.



Original Press Release:



Cam-Wafer II Surface Measuring, Surface Testing & Static Control



The CAM-Wafer II is a rugged, easy-to-use, highly repeatable instrument, capable of performing QC, research, cleanliness, and analytical functions on a wide variety of substrates, including silicone wafers up to 12" in diameter. Using the Analysis software, the CAM-Wafer II can save images of drops, do statistical analysis on your data, and export this data to a spreadsheet. The unit also enables the exact positioning of your substrate.

The open design allows easy loading and unloading of samples. The light source allows for measurement in a variety of lighting situations, along with the iris on the camera lens. The Analysis software removes potential human error with automatic measurement capabilities.

The CAM-Wafer II uses a CCD Camera and software to measure the contact angle. The machine comes with two sample stages, one 4" diameter, and the other any one of the other stage sizes (6", 8", or 12"). The unit can either be connected to the customer's computer (requires one open PCI slot, Windows 98 or NT 4.0, 11 MB of free disc space, and Microsoft Excel).

If you would like more information please call: 1-800-762-2478

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