Software Interface connects NI and JTAG testing tools.
Press Release Summary:
TestStand test management software and PXI hardware from National Instruments now runs with JTAG Technologies' boundary-scan IEEE 1149.1 tools. This lets engineers build test system to examine functional aspects, inspect circuit connections, and perform in-system-programming of flash memory and PLDs. Boundary scan provides access to digital assemblies through scan paths rather than probes, for testing boards in advanced stages of manufacturing.
Original Press Release:
NI Integrates with Boundary-Scan Technology to Lower Cost of Test
AUSTIN, Texas -- Feb. 19, 2002 -- National Instruments today announced seamless integration between NI's software platform for manufacturing test and JTAG Technologies' leading boundary-scan (IEEE 1149.1) tools. This integration builds on the industry-standard PXI modular instrumentation platform and extends NI's extensive functional test and optical inspection capabilities to include boundary-scan -- providing a single, low-cost platform for test.
A new software interface from JTAG Technologies coupled with PXI boundary-scan hardware allows the company's boundary-scan tools to integrate into NI's functional test framework, centered on TestStand test management software and PXI hardware. With this integration, engineers can quickly build a unified test system to examine functional aspects of a product, inspect electrical circuit connections, and perform in-system-programming of flash memory and PLDs in the same testing phase. This unified test platform offers a low-cost alternative to traditional in-circuit testing.
"Engineers now have a cost-effective solution that covers all facets of manufacturing test in a single, compact system," said Ray Almgren, NI Vice President of Product Strategy. "By using a unified, modular system for functional test, optical inspection, and boundary scan, engineers can perform far more comprehensive tests on their products while reducing test time, cost of deployment, and cost of ownership."
With an integrated test system, engineers gain many advantages over implementing the components separately. For instance, a single, compact test system has a smaller footprint, saving precious floor space. The modular PXI-based system also is easy to modify or expand to meet changing system needs -- from reconfiguring the system to test new products to implementing new instrumentation to meet increased testing demands.
"With this unified platform, engineers can easily add boundary-scan to inspect circuit boards at any testing stage," said Ray Dellecker, JTAG Technologies U.S. Marketing Manager. "Boundary scan delivers full access to even the most complex digital assemblies through scan paths rather than physical probes, allowing engineers to test the circuit boards in advanced stages of manufacturing when product casing may cover the boards."
NI leverages commercial technologies, such as industry-standard computers and the Internet, to deliver customer- defined measurement and automation solutions. Headquartered in Austin, Texas, NI has more than 2,800 employees and direct sales offices in more than 35 countries. NI increases the productivity of engineers and scientists worldwide by delivering easy-to-integrate software and modular hardware. For the past three consecutive years, FORTUNE magazine has named NI one of the 100 best companies to work for in America.