Semiconductor Analysis System supports solar cell testing.
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Press Release Summary:
Model 4200-SCS Semiconductor Characterization System is available with Keithley Test Environment Interactive (KTEI) v7.2, which provides 9 solar cell test libraries that expand capabilities for I-V, C-V, and resistivity testing applications. Software also supports Drive-Level Capacitance Profiling (DLCP) solar cell testing technique. In addition to 1 kHz to 10 MHz frequency range, parametric analyzer with KTEI includes support for 9-slot instrument chassis.
Original Press Release:
Keithley Upgrades Model 4200-SCS for Solar Cell Testing, Expanded C-V Frequency Range, and Nine-Slot Chassis Support
Cleveland, Ohio-March 23, 2009-Keithley Instruments, Inc. (NYSE: KEI), a world leader in advanced electrical test instruments and systems, has introduced a variety of hardware, firmware, and software enhancements to its award-winning Model 4200-SCS Semiconductor Characterization System. The Keithley Test Environment Interactive (KTEI) V7.2 upgrade includes nine new solar cell test libraries, an expanded frequency range for the system's Capacitance-Voltage (C-V) measurement capability, and support for the company's new nine-slot Model 4200-SCS instrument chassis.
The new test libraries included in KTEI V7.2 expand the Model 4200-SCS's capabilities for solar cell I-V, C-V, and resistivity testing applications, which are increasingly important, given the growing interest in and governmental support for alternative energy technologies. The software upgrade also supports Drive-Level Capacitance Profiling (DLCP), a new solar cell testing technique that was difficult to perform accurately using earlier test solutions. DLCP provides defect density information on thin film solar cells. Existing Model 4200-CVU Capacitance-Voltage Unit cards, which were introduced in November 2007, can be readily modified to support this testing technique.
The Model 4200-CVU's frequency range has been expanded to 1kHz-10MHz from 10kHz-10Mz to support DLCP testing. This extended frequency range also expands the system's applications, providing support for testing flat panel LCDs and organic semiconductors such as organic light-emitting diodes (OLEDs).
The continuing growth in I-V, pulse, and C-V characterization applications has meant that Model 4200-SCS users who need exceptional testing flexibility and capabilities have been finding their mainframes somewhat crowded. To address this need, the V7.2 upgrade provides support for a nine-slot instrument chassis. Previously, the Model 4200-SCS had just eight slots to hold a growing array of source-measure units (SMUs), pulse generation and scope cards, and capacitance-voltage cards. Existing Model 4200-SCS systems can be upgraded to support nine slots; all new mainframes will have nine slots.
In support of the V7.2 upgrade, Keithley has also introduced a new high performance triaxial cable kit for connecting the Model 4200-SCS to a prober, designed to simplify the process of switching between DC I-V, C-V, and pulse testing configurations. This new cable kit eliminates the need for recabling, as well as eliminating the measurement errors that often result from cabling errors. Two versions of the cable kit are available-one for Cascade Microtech probers and the other for use with SUSS MicroTec probers.
Ongoing System Enhancements Ensure Continuing Productivity
Keithley's Model 4200-SCS replaces a variety of electrical test tools with a single, tightly integrated characterization solution and is ideal for a wide variety of applications including semiconductor technology development, process development, and materials research in reliability labs, materials and device research labs and consortia, as well as any lab needing a benchtop DC or pulse instrument. Keithley has continually enhanced the Model 4200-SCS's hardware and software ever since its introduction. This commitment to ongoing system innovation assures a cost-effective upgrade path, so users don't have to buy a new parametric analyzer because their old one is obsolete. Systems can be upgraded cost-effectively to keep up with the industry's evolving test needs, so capital investments in the Model 4200-SCS stretch much further than with competitive test solutions.
Keithley Instruments, Inc., a leader in semiconductor device characterization and parametric test, offers customers around the world a variety of flexible solutions for current-voltage (I‑V), capacitance-voltage (C-V), and pulsed I-V measurements and analysis. Products range from benchtop instruments to turn-key systems and are used in applications as diverse as materials analysis, device characterization, wafer level reliability, and process control monitoring. Keithley works closely with semiconductor customers worldwide through its network of field service centers and application engineers with specific expertise in the area of semiconductor technology.
Price and Availability
Version 7.2 of KTEI is available at no cost to existing Model 4200-SCS users. However, there is a charge to calibrate the upgraded 4210-CVU and to upgrade existing Model 4200-SCS systems to support nine instruments. The new, high performance cable sets, Model 4210-MMPC-S (for SUSS MicroTec probers) and Model 4210-MMPC-C (for Cascade Microtech probers), are $995 per manipulator.
For More Information
For more information on KTEI V7.2 or any of Keithley's other semiconductor test solutions, visit www.keithley.com/products/semiconductor/?mn=4200-SCS or contact the company at:
Telephone: 800-688-9951
440-248-0400
FAX: 440-248-6168
E-mail: publisher@keithley.com
Internet: www.keithley.com
Address: Keithley Instruments, Inc.
28775 Aurora Road
Cleveland, OH 44139-1891
About Keithley Instruments, Inc.
With more than 60 years of measurement expertise, Keithley Instruments has become a world leader in advanced electrical test instruments and systems from DC to RF (radio frequency). Our customers are scientists and engineers in the worldwide electronics industry involved with advanced materials research, semiconductor device development and fabrication, and the production of end products such as portable wireless devices. The value we provide them is a combination of products for their critical measurement needs and a rich understanding of their applications to improve the quality of their products and reduce their cost of test.
Products and company names listed are trademarks or trade names of their respective companies.
